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Product
Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Product
PCB Test And Design-For-Test Services Group
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ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Product
Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Product
Communications Test System for Frontline Diagnostics
CTS-2750
Test System
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Product
Multifunction Substation Test Set
STS 5000
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STS 5000 is a multifunction substation maintenance & commissioning test system for current, voltage and power transformers designed to perform primary tests requested in substations commissioning. It allows to perform accurate tests on CTs, VTs, PTs and ground grid.
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Product
Bus Analyzer
Goebelyzer
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Our Goebelyzer analyzer systems offer unparalleled insight into bus data and are used in flight test, system simulation, LRU design, verification and manufacturing test. Supported Interfaces Arinc 664, ASCB-D, Honeywell Flight Controls P2P, Arinc 429, CAN2.0b, Mil Std 1553, RS 422 SDLC/Async, ADC
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Product
64-CH Isolated Digital I/O PCI Cards
PCI-7432/7433/7434
Digital I/O Module
ADLINK's cPCI/PCI-743X series cards are 64-CH high-density digital input and/or output cards that provide a robust 2,500 V isolation protection and are suitable for most industrial applications. The wide input range of the cPCI/PCI-7432 and cPCI/PCI-7433 makes it easy to sense the status of external devices. There are several options for PCI-743X series, such as normal version with input range from 0 to 24 V, as well as HIR version with high input range from 0 to 50 V. The PCI- 7433ALC is specifically designed for AC power test system.
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Product
PXI Programmable Resistor Card 2-Channel 3 Ohm to 16.3k Ohm
40-294-031
Programmable Resistor Module
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Product
RF/Microwave PCB
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With unique expertise and decades of experience in complex RF PCB and Microwave Printed Circuit Boards, Teledyne Labtech offers a “one-stop” solution for the design, manufacture and test of the most demanding RF/Microwave PCB designs.
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Product
PXI Multiplexer, Very High Power DC, 4-Channel, 40A, 14V
40-664A-001
Multiplexer Module
The multiplexer is suitable for switching heavy loads or for slave switching large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of DC voltage at high current.
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Product
Night Vision Test Sets
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HGH Infrared Systems NV-2500 is the new standard for digital night vision goggle testing. Designed for testing night vision monocular or binocular systems, the NV-2500 system provides automated testing of all standard NVD tests with unparalleled accuracy and operator ease of use.
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Product
Qualified Hermetic EGT Thermocouple Upgrade
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FIT-IT & FORGET-IT Eliminate Exhaust Gas Temperature (EGT) thermocouple concerns with AMETEK's new EGT thermocouple product offering for Frame turbine applications. AMETEK has worked closely with the turbine OEM to design and engine test this thermocouple as a direct replacement and upgrade for all new and existing EGT thermocouples. The new EGT thermocouples are qualified and meet all design specifications.
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Product
Advanced Power System: Dynamic DC Power Supply, 120 V, 16.7 A, 2000 W
N7976A
DC Power Supply
The N7976A is designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Product
Emissions Test System
PC-114
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Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
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Product
Complete IP Module
Scan Ring Linker SRL
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The Scan Ring Linker SRLTM - is a complete IP module that can be easily embedded into a CPLD, FPGA or ASIC on a PCB to reduce the complexities and costs of designing 1149.1 (JTAG) test infrastructure for designs that use multiple scan rings. The SRL IP module links any number of scan rings (secondary scan paths) into a single high-speed test bus, which permits devices on secondary scan chains to be independently tested and configured through a single 1149.1 external interface.
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Product
[5kV AC] Hipot Tester, Rise/Fall-Time Control Function Equipped
TOS5200
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TOS5200 is designed for AC Hipot Test with 500 VA capacity and 200 mA short circuit current output capability. Equipped with the PWM amplifier, the TOS5200 can provide a stable & reliable output without being affected by ACpower line. Therefore, it is a perfect solution for electronic equipment or devices complied to IEC, EN, UL, VDE andJIS etc. requirement.As TOS5200 covers most of features of our upper class model for AC Hipot Test, it achieves thesuperb cost / performance ratio for those who need 200 VA or 500 VA capacity, or both. Also, as it equips the Interlockfunction together with other safety features, operator can carry out the test with higher current value in safe.
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Product
Basic 3U Rackmount Appliance for PCI Express® Gen5
R300-G5
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Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols.
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Product
Digital Megohmmeter
800
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The ACL 800 Digital Megohmmeter is a dependable and easy-to-use audit kit that is designed to test static dissipative surfaces for electrical resistivity and resistance according to industry standards such as ANSI/ESD test methods S4.1, S7.1, and ASTM D257. Tests are easy to perform with or without the 5lb probes. Use optional concentric ring probe for conformance to STM11.11.
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Product
PXI-6254, 32 AI (16-Bit, 1 MS/s), 48 DIO, PXI Multifunction I/O Module
779118-01
Multifunction I/O
The PXI-6254 offers analog input, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
PXI-6221, 16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module
779629-01
Multifunction I/O
The PXI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Transformer Turns Ratio Meter
TTRM 301
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SCOPE introduces state of the art precision three phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. Along with turns ratio, this light weight and reliable instrument measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single as well as three phase transformers in charged switchyard condition. The instrument has facility to automatically detect vector group of all majority configurations available. The differant AC voltage selection offers high accuracy in measurement.
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Product
HPA General Purpose Probes
General Purpose Probe
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Product
PCI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.8 MS/s), 24 DIO PCI Multifunction I/O Device
779109-01
Multifunction I/O
The PCI‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
FMC 5-Channel Digital I/O Module
FMC DIO
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Sundance Multiprocessor Technology Ltd.
The fmc-dio-5chttla 5-channel digital I/O module is a simple board for digital I/O on LEMO connectors. It has been designed for testing White Rabbit functionality as part of the SPEC Demonstration Package for White Rabbit, and it can be used for other general purpose applications too.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Video Signal Generator
MSPG-2000
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MSPG-2000 Video Signal Generator, was designed to test standard Panel and Multimedia Video Signal. Separated four(4) boards generate selected own(1) Time & Pattern and output to the each section with two(2) ports.
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Product
150 Amps, 10 MHz BW Current Probe - AC/DC , 500 Amp Peak Pulse
CP150
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Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Product
IP Fax/ Modem Testing
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To successfully deploy fax services requires extensive network design, test and traffic engineering. Test equipment can prove valuable in this process, if it can: Generate and receive fax signals in bulk over wired and wireless networks, monitor and distinguish fax signals in real time for traffic engineering and network design purposes, and analyze fax signals after capture for troubleshooting failed or poorly handled calls.
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Product
Textile Tensile Testing Machine
TF002
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TESTEX Testing Equipment Systems Ltd.
Textile Tensile Testing Machine, to determine the physical and mechanical performance of tension, tearing, compression, bursting, rapture, flexibility, shear and peel and seam slippage. Especially designed to test a wide range of yarn, fabric, leather, with a huge assortment of specimen grips and software available, it can also be used for strength test of rubber, plastic, metal, wire, paper, packaging, and other materials
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Product
Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
