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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more -
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Interference & Compatibility Evaluation System
ICEy
Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
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Hybrid Placement & Insertion System
MAI Series
- A hybrid machine which uses SMT Mounter tech- nology to the through hole type components- Assured quality by SMT level accuracy and dual inspection sources (Vision & Laser)
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Satellite Terminal Geolocation System
Satellite Terminal Geolocation System is designed to identify and locate sources of satellite transmission such as satellite gateway, VSAT Hub and VSAT terminals etc. The system is useful to the intelligence and defense agencies to identify the sources of satellite transmission of their adversaries and locate the terminals on digital map.
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High-Speed Transformer Test System
DU-7211
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Vision System
GEVA 400
The GEVA 400 system offers excellent cost savings for multi-camera vision applications, such as final inspection of large assemblies. The four Power-over-Ethernet (PoE) compliant Gigabit camera ports are compatible with a wide range of Genie Nano GigE cameras. Adding cameras is easy with commercially available network technologies, allowing for large configurations at much lower system costs. The GEVA 400 features the latest Intel® quad-core ATOM™ architecture, and offers low power consumption and solid performance for a wide range of machine vision applications
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Inertial Navigation Systems (INS and IMU)
Inertial Navigation Systems (INS and IMU)High accuracy 100Hz GPS and GNSS receivers and Inertial Navigation Systems (IMU - inertial measurement units) with Real-time Kinematics (RTK) correction for the most precise position-based test and measurement applications.
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DLC-X Diamond-Like Carbon System
Deposit dense, uniform, and repeatable thin, diamond-like carbon (DLC) films for longer-lasting TFMH slider overcoats and landing pads with Veeco's NEXUS DLC-X System. The Nexus DLC-X features the industry's first production-worthy Pulsed Filtered Cathode Arc Source to enable sub-20A overcoat thickness, and supports improved step coverage for better process yield compared to previous generations.
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Battlefield Operations Support System
TCG BOSS
Curtiss-Wright Defense Solutions
TCG BOSS is the industry’s most complete, reliable, easy-to-use, and cost-effective TDL testing and platform integration solution on the market that provides support for multiple terminals and interfaces and adheres to industry data link standards.
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Manual Semiconductor Metrology System
Front USB port enables easy storage of measurements and other data to flash drivesMTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and DependabilityNon-contact measurements76-300 mm diameter wafer rangeOptional wafer measurement ringsWafer stops for exact centeringEthernet interfaceFull remote control software (Windows compatible)Optional calibration wafers
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Direct Reading Attenuator with Remote Control
DA2XE
DA2XE Millimeter-Wave Direct Reading Attenuator is a measurement instrument for signal level setting or loss measurements in waveguide networks. It also can be used for calibration of other attenuation measurement instruments. Direct Reading Attenuators have rotary-vane design. The value of attenuation is determined by rotation angle of resistive film with respect to the waveguide channel. Attenuation value does not depend on frequency. The attenuator has electronic control. The attenuator can be used in local or remote (via USB 1.1 or higher) operation modes.The Attenuators are provided in waveguide bands between 18 GHz and 225 GHz.
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Compact Baking System
LSC series
HORIBA's best-selling baking system has been developed to meet the requirements of today’s high technology industries. Without the need of a carrier gas, the system can provide stable vaporization of materials such as TEOS (at a rate of 600 SCCM) and H2O (at a rate of 2 SLM). For ease of access all device maintenance can be performed from the front of the unit.
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Scatterometers / Thin Film Metrology Systems
OptiPrime Series
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Reflex Reflector Measurement Systems
Photometric Solutions International Pty Ltd
The measurement setup involves using a projector to illuminate the test item, and then measuring the luminous intensity of the light reflected from the test item. The ratio of the luminous intensity emitted by the reflector (in candelas) to the illuminance on the reflector (in lux) is the coefficient of luminous intensity or CIL (cd/lx).
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Energy Saving System
ECO-Vibe neo
ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to b...show more -
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Integrated Provisioning System
Promptlink Communications, Inc.
Integrated Provisioning System (IPS) is a robust operational tool for use in active, dynamic provisioning of DOCSIS cable modems and PacketCable™ devices. Promptlink’s IPS application software supports common provisioning functions, such as dynamic IP address assignment using DHCP, domain name server configurations, and the generation and management of CM configuration files, plus Service and Subscriber Management.
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Blackbody System
IR-2106/301
Infrared Systems Development Corp.
Infrared Systems Development introduces a NEW Low-Cost 6” x 6” Thermo-Electrically cooled / Heated blackbody source with a temperature range of 5ºC to 150ºC. The solid Copper Emitter plate provides superior uniformity and energy emission. Our Proprietary High Emissivity Black Coating provides >0.95 uniform Emissivity from 0.8 to 30 um.
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Haptic Testing System
The Air Ventilator Haptic Test System performs automatic functional tests on air ventilation components to measure the force necessary for the execution of movements in the different components of the part. The movements are performed by a 6-axis robot that forces the components of the part to follow the desired routes while storing data on the force expended. This particular machine tests movable fins and knurled wheels by performing four test motions on each fin and two on each wheel.
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Digital Acquisition Benchtop System
Reliable and repeatable switching is critical for your measurement accuracy whether you use switching to route signals for design verification applications or for complex automated functional test systems. Keysight's switch measure mainframe and modules help ensure confidence in your measurement results.
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Portable XRD System
TERRA
The TERRA Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portable XRD, provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-field analysis.
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GPIB-RS232, Serial, RS232 GPIB Instrument Control Device - Universal Euro 240VAC
779732-04
The GPIB‑RS232 is an IEEE 488 controller device for computers with an RS232 port. You can use this device to integrate an instrument into your system using GPIB. This device transforms a computer with an RS232 serial port into a talker, listener, or controller on the GPIB bus. It can also interface RS232 instruments and peripherals to the GPIB bus. It can implement the physical and electrical specifications of the IEEE 488 and RS232 standards, as well as interpret and execute high-level commands...show more -
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Linear Power Supplies Precision, Analog or Local Control, Ultra Low Ripple/Noise
Series ATE
Series ATE linear power supplies are precision analog-controlled power supplies. They feature high gain and zeroable offsets to follow voltage signals or variable resistance controls precisely. An optional fast mode provides fast programming response into the mid audio range, providing active down programming and active up programming. The voltage and current channels are equally controllable with automatic crossover between modes. These power supplies offer ultra low noise and ultra low ripple at the output and are MIL-STD-461 compliant.
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XMC Display Control Card
XM26001
LinkedHope Intelligent Technologies Co.,Ltd.
XM26001 is a graphics, image processing and computing single-board computer independently developed by Linghao Intelligent®. It uses the AMD G series APU GX-210HA by default, integrating the CPU, GPU, south bridge and north bridge on one silicon chip.
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Variable Frequescy Resonant System
Yangzhou Power Electric Co., Ltd
Variable frequency resonant system for testing of long HV cables and GIL, for testing of short HV cables and GIS/GIL and for testing of long MV cables are designed for the generation of alternating current (AC) high voltage (HV) by resonant circuits with variable frequency, available of outdoor design.
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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Dimensional Metrology System
SUMMIT
The VIEW Summit systems are designed for components requiring a large work envelope and high accuracy. Based on the same core technologies of optics, high speed linear motors, and high resolution scales used in the VIEW Pinnacle, the Summit features a fixed bridge design. Separate X and Y axis motion systems ensure that neither influences the mechanical integrity of the other, while also enabling easy loading and unloading of large parts.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
