Showing results: 1 - 15 of 439 items found.
-
-
Thorlabs, Inc.
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
-
Teledyne OEM Solutions
The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
-
SemiProbe
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
-
Accel-RF Corporation
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
-
System 7700 -
Pulse Instruments
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
-
Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
-
N19308B -
Keysight Technologies
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
-
Dynamic Test Solutions
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
-
3Flex -
Micromeritis
Micromeritics 3Flex Surface Characterization Analyzer is a fully automated, three-station instrument capable of high-performance physisorption, mesopore, micropore, and chemisorption analyses with superior accuracy, resolution, and data reduction. Each analysis station is upgradeable from mesopore to micropore with the option of designating one station for chemisorption analyses
-
Thermal Engineering Associates, Inc.
Combining Thermal Test Vehicles (TTVs) with Thermal Test Boards (TTBs) results in a set of tools that perform the basis for TIM thermal characterization under application-oriented measurement conditions. Availability of these tools creates a de facto standard that enable both TIM manufacturers and TIM users to compare measurement results under the same conditions.
-
FCM-100 -
Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
-
mks Ophir
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
-
Paios -
FLUXiM
Paios performs a large variety of experiments in no time with one click. Get consistent and precise measurement data, directly compare your results in the measurement software and speed up your research.Increase your research speedCompare your devices directly in the softwareGet highly consistent dataThink about physics - Let Paios handle the rest
-
