- Grund Technical Solutions, Inc.
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Manual Test Solution
Titan
Grund Technical Solutions, Inc.
Titan is an easy to use, low cost Human Body Model (HBM) or Machine Model (MM) manual test solution. It can be used for design, engineering, and characterization of your devices. Ranging from 50 V to 16,000 V the Titan will have the largest voltage range of any HBM tester.
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Nucleic Acid Analysis And Protein Characterization
Utilizing automated microfluidic capillary electrophoresis (micro-CE) technology, our instruments enable the user to simplify the process of traditional gel separations, resulting in even more accurate and reproducible data in a fraction of the time. Separate, identify and analyze genomic and protein samples in seconds and visualize your data as an electropherogram, virtual gel, or tabular report.
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*Pulse Characterization Sensors
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Di...show more -
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Slide Screw Tuners
Slide screw tuners are particularly suited to establishing impedances for device characterization, or for any other application requiring a precisely repeatable mismatch condition. This is due to the precision with which a specific matching condition can be repeated if the tuner has calibrated position indicators.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Bit Error Ratio Testers
M8000 Series
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An addi...show more -
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ThermalAir Series Temperature Forcing System
ThermalAir TA-1000B Rack Mount Test System
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Double Monochromator
Gemini 180
The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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Amplified Spontaneous Emissions (ASE) Sources
The AP505xA series, high power ASE sources provide stable output power up to + 23dBm and broad flat spectrum over C+L band or T band. They enable effective and efficient measurements for component characterization or optical sensing. Finally, these products are proposed in friendly-user stand alone benchtop instrument with touch sensitive screen, GPIB, ethernet, RS-232 or USB controls.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Manual Tuners
Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
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IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and a...show more -
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Edge and Backside Inspection
LIGHTnPS
• Best in class throughput• High surface sentivity• Full haze characterization• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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Impedance Analyzers.
The MTZ-35 is a high-frequency impedance analyzer which is the key element of several fully integrated solutions for the electrical characterization of materials . These solutions comprise a MTZ-35 impedance analyzer, a Temperature Control Unit, a sample holder and MT-Lab software.The MTZ-35 is also offered as a standalone instrument for use with other systems/accessories.
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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In-Process Test OTDR
8000i
The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. Th...show more -
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RCS Software
CEMExpert
CEMExpert is a software dedicated to the prediction of radar cross-section of aerial and naval targets. The software uses both the high-frequency asymptotic method (PO-PTD) as well as the full-wave equation solver (FVTD). A quick calculation is made possible by automated meshing, scripts for azimuthal scan and parallel processing. The software has been used for improving stealth performance of UAVs, for shape optimization of naval ships and RCS characterization of target missiles.
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Signal Integrity Measurement Systems
GigaTest Labs is a Keysight Technologies Solutions Partner, offering fully configured signal integrity measurement systems for high bandwidth signal integrity characterization. Our wealth of experience with Keysight's Vector Network Analyzer and Time Domain Resonance Oscilloscope tools will help you navigate and understand different instrument capabilities & configuration options that will benefit your engineering team.
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Process Particles Suspensions
Process Particles™ Suspensions are used as particle material standards. They represent real-world contaminant particles encountered in semiconductor device fabrication processing. Deposition of these particles on wafers and reticles enables characterization of the material-dependent response of a surface inspection system when accurate particle size or particle sphericity are of secondary importance. They consist of broad size distributions of irregularly shaped solid particles suspended in ultra-pure water (UPW). Each bottle contains a suspension volume of 100 mL.
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Combination Measurement Workstation
WS500
The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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GPC/SEC Data Systems for Enhanced Control and Performance
Agilent GPC/SEC data systems enable powerful control, data acquisition, calculations, and result reporting. For accurate molecular weight analysis and complete polymer and protein characterization, GPC/SEC software provides the functionality required for conventional and advanced GPC/SEC in a simple, powerful, fully integrated package.GPC/SEC software for OpenLAB CDS adds application-specific calibration, data processing, and reporting to your OpenLAB CDS. Cirrus GPC Multi Detector software, an ...show more -
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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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TIM Characterization Tools
Thermal Engineering Associates, Inc.
Combining Thermal Test Vehicles (TTVs) with Thermal Test Boards (TTBs) results in a set of tools that perform the basis for TIM thermal characterization under application-oriented measurement conditions. Availability of these tools creates a de facto standard that enable both TIM manufacturers and TIM users to compare measurement results under the same conditions.
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Metrology
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Electronic Autocollimators
The concept of autocollimation as an optical instrument was conceived about a century ago for accurate, non-contact measurements of angles. Recent novel photonics upgrades have created a new breed of Autocollimators, offering intricate measurement capabilities for optics, laser profiling, AR/VR/XR goggles alignment, cameras for auto-driving, VCSEL characterization and many more applications with a single instrument packed with multi-tech technologies.
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PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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High Voltage Optically Isolated Probe, 1 GHz Bandwidth. Includes soft-carrying case.
DL10-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Handheld Optical Light Source
JW3109
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
JW3109 optical light source can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the JW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital mo...show more
