Showing results: 106 - 120 of 194 items found.
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CCI
*High Dynamic Range GPS to Fiberoptic Transmitter and Fiberoptic to GPS Receiver*Compact NEMA rated outdoor Fiber Transmitter provides +5VDC Bias for GPS Antenna LNA*Rack mounted Fiber Receiver provides 8 RF outputs and integrated monitoring and alarming*Cost effective solutions for distribution of GPS signal over long distance
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ET/QuadTech 1910/1920 -
IET Labs
The 1920 1 MHz LCR Meter is the most popular and designed to perform capacitance and impedance measurements on a variety of electronic components and materials over a frequency range from 20 Hz to 1 MHz. The1920 features programmable bias voltage from 1 mV to 2 V for biasing capacitors and other semiconductor devices during measurements.
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FECPLS500 -
Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Carl E. Holmes Company
Two Diode Assembly, P/N 6030CEach diode is rated for 400 Amps, 1200 PIVTwo diodes are installed on one heatsinkDimensions: 8”H x 8”W x 10”DEstimated weight: 20 lbs.When A is greater than B, Battery 2 is reversed BiasWhen B is greater than A, Battery 1 is reversed Bias
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National Technical Systems
Temperature and humidity testing determines how components, subsystems and complete systems behave in severe environments that involve elevated temperatures and high or fluctuating relative humidity. The tests can be static with constant temperature and humidity, they can involve the cycling of both, they can be temperature-humidity bias tests (where the moisture is used to induce a failure in an electrical device) or some combination of all of these.
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FECPLS510 -
Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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87405C -
Keysight Technologies
Exceptional gain (25 dB) and flatness (1.5 dB) combined with a probe-power bias connection which eliminates the need for an additional DC power supply, makes these preamplifiers the ideal choice for spectrum analyzer or stand alone applications.
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TIA-4000 -
Scitec Instruments Ltd
The TIA-4000 is comprised of a fibre coupled InGaAs APD detector combined with a variable reverse bias voltage network and fast transimpedance amplifier. The output of the unit is brought out to a type K female SMA connector. Light falling on the detector generates a positive-going proportional current. This current, multiplied by the transimpedance produces a voltage that is proportional to the light incident on the detector surface.
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Magnicon GmbH
The SQUID series arrays are ideal for readout of TES sensors or as amplifier stage for discrete two-stage applications. Integrated bias resistors for TES or two-stage applications reduce wiring complexity. Various arrays with input inductances of 3 to 6 nH, input sensitivities of 17 to 23 µA/Phi0, and a current noise between 5 and 10 pA/sqrt(Hz) @ 4 K are available.
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IA1021 -
MINPU TECHNOLOGY CO., LTD.
Feature Specifications: Dual test mode: Analyzer(frequency sweep) and LCR(single frequency).Measurement frequency: 20Hz to 10MHz, 6 digitsFrequency resolution: 0.001% in all frequency rangeFrequency accuracy: 0.01%.DC bias(program): -10V ~ +10V, 0.005V resolution, accuracy 0.5%.Measurement basic accuracy: Impedance +-0.2%, phase: +-0.1°.Display Range: Z: 0.0000Ω-99.999MΩ.
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HAST -
ESPEC North America, INC.
Our HAST systems have a modern design that's easier to use: Automatic humidity filling; Automatic door lock; A more square workspace; allowing more product to be loaded;Convenient, hermetic power-pin system for bias testing. We are now able to offer a hermetic port system to allow special signal lines like coax or fiberoptics to be run into the chamber.
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6632 -
MICROTEST CORP
Frequency range: DC, 10Hz to 1/3/5/10/20/30MHz/50MHz. Basic accuracy up to ±0.08%. Automatic Level Control (ALC). Output impedance 25Ω/100Ω, switchable. Equivalent Circuit Analysis . Built-in DC Bias voltage ±12V. Ultra-high measuring speed < 3ms. Built-in the Dielectric constant-εr. Built-in the Permeability-μr. Support PC Link Software.
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E4991B -
Keysight Technologies
The E4991B Impedance Analyzer has a frequency range of 1 MHz to 3 GHz. The E4991B provides 0.65% basic accuracy over a wide impedance range with a 40 V built-in DC bias source (Option 001). The equivalent circuit analysis function supports seven different multi-parameter models and helps you to simulate your own equivalent parameter values of components.
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11022/11025 -
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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Edmund Optics Inc.
These avalanche photodiodes (APDs) are silicon photodiodes with an internal gain mechanism. As with a conventional photodiode, absorption of incident photons creates electron-hole pairs. A high reverse bias voltage creates a strong internal electric field, which accelerates the electrons through the silicon crystal lattice and produces secondary electrons by impact ionization. The resulting electron avalanche can produce gain factors up to several hundred.