Beam
a shaft of directed energy.
See Also: Shaft, Beam Analyzers, Beam Load Cells, Beam Profilers, Beam Sensors, Beam Splitters, Electron Beam, E-Beam, Laser Beam, Focused Ion Beam, Laser Beam Analyzers, Laser Beam Profilers
- Virginia Panel Corporation
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QuadraPaddle Signal Modules
The versatility of VPC's QuadraPaddle twin female contacts provide four beams per end to ensure signal integrity from instrumentation to the Unit Under Test (UUT).Twin male contacts interconnect to ribbon cable, headers, and other standard connectors.Makes system configuration a simple “plug & play” operation and delivers high density, high performance interconnectivity at a lower cost per point.
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Mechanical Yarn Package Density Tester
Y016A
To measure the hardness of yarn cones or beams of yarn or fabric
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Near-Infrared VCSEL Illuminator
SABER-NIR
The SABER-NIR illuminator provides high-power, near-infrared illumination for use with night vision and I2 imagers. With up to 499mW of adjustable NIR illumination, the SABER-NIR provides unsurpassed beam uniformity for the ultimate capability in feature resolution and target discrimination. Small and lightweight, the battery operated SABER-NIR can be rifle-mounted or handheld. With variable beam divergence and variable intensity from 10mW to 499mW, it can be used for both close quarter, long-range, and precision applications. The SABER-NIR provides a key tool for operators day or night.
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Ion Beam Milling Systems
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Interferometers
An instrument in which the interference of two beams of light is employed to make precise measurements.
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Gloss Meter
Shenzhen Graigar Technology Co.,Ltd.
A glossmeter is an instrument which is used to measure specular reflection gloss of a surface. Gloss is determined by projecting a beam of light at a fixed intensity and angle onto a surface and measuring the amount of reflected light at an equal but opposite angle.
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5G 256-Element Active Antenna Innovator’s Kit
AWA-0134
The AWA-0134 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +60dBmi (1000 W) of EIRP. The electronic 2D beam steering is achieved using analog RF ...show more -
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Scanning XPS/HAXPES Microprobe
PHI Quantes
The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Multi-Spectral UV/Laser Range Stimulator
Phantom™
The Phantom is a long-range laser and ultraviolet (UV) stimulator capable of testing aircraft electro-optical sensor suites up to 5 km. Phantom can operate as an independent laser and/or UV stimulator or can be integrated with our other electro-optical and radio frequency range systems (see GTESS and PRTS). The Phantom provides both a laser threat and a synchronized temporal missile plume signature to stimulate both the aircraft’s laser and missile warning systems. Training aircrew to counter maneuver a Laser Beam Riders (LBR) threat is considered essential to survival and in-air training. The Phantom can be deployed either on a shoulder or tripod mount.
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Laser Systems
Fast physical optics provides a cogent model of laser sources, while also considering diffraction, interference, polarization and nonlinear effects, as well as granting access to any beam parameter of concern.
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Large Area Solar Simulators
The LASI Beam Turner assembly allows the output of the LASI to be projected horizontally. It attaches to to the standard LASI downward facing stand that is included in the base LASI system.
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Camera BasedBeam Profilers
Our Camera beam diagnostic Line-up offers measuring capabilities starting from sub-micron laser beams to sensors of 1/1.2" with built-in automatic filters wheels. The camera based beam diagnostic offers the intensity measuring profile and the detailed beam power distribution within the profile.
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Coordinate Measuring Machines
VideoCheck® V-HA
The most accurate multisensor coordinate measuring machine for tool measurement available in the world todayUsing 10 nm scalesAll axes are based on high precision low vibration air bearingsIntegration of additional sensor units to a multisensor system guarantees higher flexibility and measuring speedScan high precision gear profilesUse of high precision telecentric lenses in a second optical beam pathModular structure guarantees customized solutions for individual applicationsIntegrated high precision air bearing rotary
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Boron Enhanced Diamond-like Carbon Hybrid Foils
can be increased by sandwiching a thin layer of boron between two layers of diamond-like carbon. MICROMATTER DLC-B hybrid foils contain between 5% and 10% boron.DLC-B foils have remarkable flexibility, higher tensile strength and hardness. In most applications, their lifetime in particle beams is significantly greater than regular DLC foils. DLC-B foils are recommended for applications that require highest mechanical robustness and improved durability under beam conditions.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Trace VOC Analyzer
PTR-TOF 6000 X2
The new PTR-TOF 6000 X2 is our premium PTR-TOF trace VOC analyzer. We conceived a unique system comprising of a novel high-resolution TOF and IONICON’s PTR technology with the new “X2” features, for the ultimate PTR-TOFMS experience. X2 combines the latest generation of performance enhancing tools incl. the ION-BOOSTER funnel as well as the hexapole ION-GUIDE. The ion funnel focuses the ions into the hexapole ion guide which results in nearly lossless transmission of an extremely focused ion bea...show more -
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Load Cell Transducer
Unitech Scales And Measurements Pvt. Ltd
Force can be measured by different methods, one of the most effective and accurate method is by using strain gauge based load cells. Four Transducer class strain gauges are bonded on the specimen and are connected in the form of Whetstone Bridge. The specimens are of different types depending on the requirement such as S, column, beam, ring, shear beam, binocular etc. UNITEH’S Load Cells are used for wide applications rite from commercial weighing scale to industrial process controlling, R &...show more -
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Automated Front & Backside Mask Aligner System
Model 6000
With over 4 decades of manufacturing in the semiconductor industry, OAI meets the growing challenge of a dynamic market with an elite class of production photolithography equipment. Built on the proven OAI modular platform, the Model 6000 has front and backside alignment that is fully automated with a submicron printing capability as well as submicron top to bottom front side alignment accuracy which delivers performance that is unmatched at any price. Choose either topside or optional backsi...show more -
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Conical Laser Power Probes
Conical Head Power Probes are used to measure high power density CO2 laser beams which may damage the standard flat surfaced Power Probes. The conical absorbing cavity exhibits a high heat dissipation.
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Wafer Mapping Sensor
M-DW1
Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Beam Pattern Measurement System
BP100
The BP100 is purpose-made for luminous intensity measurement of lamps, using a diffusely transmitting screen to provide a flat image that can be measured by an imaging photometer. This is a low cost, versatile solution in comparison to the traditional method of measuring lamp properties as a function of angle of emission, using Goniometers that are often costly and dedicated for one specific measurement.
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Ion Beam Sources
Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
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Wideband Power Amplifiers
Krohn-Hite Wideband Power Amplifiers are designed to meet today's industrial needs where wideband, precision performance is required. Applications include: meter calibration, piezo transducer driving, bridging applications requiring high input and low output impedance, low distortion ac power source, ion beam deflection, vacuum tube driver, ink jet testing and design and many more.
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InGaAs Optical Power Head
81624C
The new 81624C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81624C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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Gloss & Reflectance
Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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Intex Beam Gauge & Standard Contacts
Developed to measure both internal and external diameters and lengths, the Intex gauge's aluminium extrusion beam gives it a rigid yet lightweight quality, making it ideal for shop-floor environments. The simple release of a locking thumbscrew enables the gauge's measuring direction to be changed quickly and easily.
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Standard Gain Horn Pyramidal Horn Antenna
Elva’s SGPH series of standard gain horn antennas cover the frequency range of 18 to 220 GHz in ten waveguide bands. They can be issued with rectangular or circular waveguide. Lens technology significantly allows decreasing mechanical sizes of horns and correcting beam for the best performance. These horns are ideal solution for measurement gain of other antennas, short range radars and radiometers.
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Tunable Edge Filters
Tunable edge filter is a customized product. It usually belongs to 2-port optical tunable filter product platform. Instead of using narrow bandpass filter in the 2-port tunable optical filter, the tunable edge filter utilizes a low-pass or long-pass interference filter. By changing the incident angle of the light beam, the cut-off wavelength will be tuned. Standard Tunable edge filters support C-band or L-band wavelength range.
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Laser Levels
Use a laser, an amplified, focused beam of light emitted from a solid-state device called a diode.
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SF000/B Laser Rangefinder – 50 M
28056
The Lightware SF000/B is an ultra-small and light open-frame LIDAR laser rangefinder designed for size and weight constraint applications. Using a time-of-flight system to make very fast, accurate distance and speed measurements. Accuracy is not affected by the color or texture of the surface, nor the angle of incidence of the laser beam. The SF000 is virtually immune to background light, wind and noise, making it an ideal sensor to detect unexpected obstacles.
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Laser Attitude Measuring Devices
For analyzing laser beam collimation its direction in space and its profile distribution proprietary instruments were developed. A collimated laser beam with a relatively large beam can be tested with the laser analyzing Autcollimator having an input apreture 100 mm, this device acompanied by AngleMeter U3 and the AngleMeter LA will provide a full product line for analyzing collimated or near collimation laser beams.
