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Automated Test Systems

All necessary elements brought together to test a UUT.


Showing recent results 211 - 225 of 299 products found.

  • IC-CAP Wafer Professional Measurement Bundle

    W8511BP - Keysight Technologies

    The IC-CAP Wafer Professional (WaferPro) Measurement Bundle includes all the products needed to run automated DC/CV and RF measurements with WaferPro and the IC-CAP Platform. The bundle includes the IC-CAPW8501EP Software Environment, the LCRZ, DC and AC Measurement drivers and the W8510EP Wafer Professional Software Add-on license. The environment license enables access to the IC-CAP Platform basic features, such as the Programming Extraction Language (PEL), GPIB communications for switch matrix, probers and thermal chucks drivers and graphics. DC driversprovide access to all the DC Analyzers and Keysight Parametric Systems built-in drivers (e.g. E5270B, B1500A, 4156C, 407x and 408x Systems, etc.). LCRZ drivers provide support for different types of CV meters and Impedance Analyzers. Finally, the bundle also includes the W8510EP IC-CAP Wafer professional which enables users to organize and run automated on-wafer test plan.

  • RF Life Test

    TestEdge, Inc.

    We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components that can be tested include:FET's GaAs Devices Monolithic Microwave IC's Hybrid Microwave IC's Microwave Module Assemblies

  • C-Size VXI Mainframe, 13-Slot

    E8404A - Keysight Technologies

    The Keysight E8404A C-size, 13-slot VXI mainframe is the high-performance mainframe in Keysight's VXI mainframe family. It delivers innovative cooling technology, improved backplane design, high reliability, easy maintenance, and versatile accessories. The power supply in the E8404A VXI mainframe provides 1000 watts of usable power, sufficient for the most demanding automated test applications. The innovative air distribution system in this mainframe provides extremely quiet and efficient cooling.

  • Functional Testing for Developers

    TestLeft - SmartBear Software

    TestLeft is a powerful yet lean functional testing tool for dev-testers working in Agile teams. It fully embeds into standard development IDEs. A built-in access to object and method library is also available with TestLeft. Dev-testers can thereby easily and quickly create robust functional automated tests without leaving their favorite IDEs such as Visual Studio. It also works well with other tools in dev eco-systems such as source control or continuous integration systems.

  • Bare Fiber Aligner

    1120 - Photon Kinetics

    The Photon Kinetics 1120 Bare Fiber Aligner makes it possible to reduce test setup time to seconds, thereby reducing overall testing cost. Just strip the fiber, scribe and break it (or use a more precise fiber cleaver, if desired) and then insert the prepared end into the 1120. In an instant, the fiber is coupled to your OTDR or chromatic dispersion test system with low optical loss and low reflectance. The 1120's compact, ergonomic industrial design is well-suited for low to moderate volume fiber and cable testing applications where automated fiber alignment systems are less economical. It is particularly useful as part of an in-process or finished cable test station employing either the 8000i or 8000 OTDR, and the OASYS.net OTDR Automation Software.

  • Semiconductor Memory Tester

    T5851 - Advantest Corp.

    Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.

  • C-Size VXI Mainframe, 13-Slot

    E8401A - Keysight Technologies

    The Keysight E8401A C-size, 13-slot VXI mainframe is the lowest-cost mainframe in Keysight Technologies VXI mainframe family. It delivers innovative cooling technology, improved backplane design, high reliability, easy maintenance, and versatile accessories. The power supply in the E8401A VXI mainframe provides 500 watts of usable power, sufficient for most automated test applications. The innovative air distribution system provides extremely quiet and efficient cooling. Basic mainframe monitoring of the E8401A indicates normal operating conditions at a glance. A front panel diagnostics connector allows continuous local or remote system monitoring. This mainframe also complies with the VXI Specification by providing injector surface rails used by the Keysight QUIC easy module insertion and extraction system. Superior cooling, reliable design and system monitoring make the E8401A an excellent choice for most VXI test system applications.

  • C-Size VXI Mainframe, 13-Slot

    E8403A - Keysight Technologies

    The Keysight E8403A C-size, 13-slot VXI mainframe provides a balance of high-power and reasonable cost. It delivers innovative cooling technology, improved backplane design, high reliability, easy maintenance, and versatile accessories. The power supply in the E8403A mainframe provides 1000 watts of usable power, sufficient for the most demanding automated test applications. The innovative air distribution system provides extremely quiet and efficient cooling. Basic mainframe monitoring of the E8403A indicates normal operating conditions at a glance. A front panel diagnostics connector allows continuous local or remote system monitoring. This mainframe also complies with the VXI Specification by providing injector surface rails used by the Keysight QUIC easy module and extraction system. Superior cooling, reliable design, and system monitoring make the E8403A an excellent choice for all VXI test system applications.

  • Tunable Laser Source, High Power and Lowest SSE, Top-Line

    81606A - Keysight Technologies

    The 81606A tunable laser source is the top line module for the 8164B lightwave measurement system. It has been designed to reach a new accuracy level and to increase test efficiency by enabling faster swept-wavelength tests with lower cost of ownership.This accelerates the automated adjustment of wavelength-selective devices with sub-picometer repeatability, best-in-class accuracy and the new two-way sweep mode at up to 200 nm/s speed.The 81606A Tunable Laser Source helps optical component developers, designers and manufacturers test more devices per hour and improves test margins with significantly enhanced functionality over the current 81600B laser, the industry standard for more than a decade. It offers:

  • Synthesizers

    8300 family - Pronghorn Solutions

    The 8300M Systems Module Synthesizer is part of Pronghorn’s 8300 family of microwave synthesizers which cover the frequency range of 10 MHz to 18 GHz. The 8300M is the world’s smallest and lightest instrument grade 18 GHz synthesizer. In addition to the Systems Module solution, the family includes a Bench Top model (8300B) and a Handheld model (8300H). Any programs written to control the Hand Held or Bench Top models are 100% compatible with the System Module which has been designed to be used in automated manufacturing test systems or in embedded systems that need a computer controlled broad band synthesizer. The 8300 series can be ordered with an upper frequency of 6 GHz, 9 GHz, or 18 GHz.

  • Compact PowerSync Analyzer

    PSA-3402 - Sifos Technologies, Inc.

    Sifos Technologies offers the PowerSync® Analyzer Compact PSA-3402 supporting the world’s most comprehensive and automated PSE Conformance Test Suites covering PSE’s that power up to 30W on 2-pairs and up to 90W on 4-pairs. Compact and transportable configuration supporting PSE Conformance Test Suite and LLDP Emulation and Analysis options. Key Features:• Continuous 2-Pair Loading > 47 Watts Per PSE Port• Continuous 4-Pair Loading > 99 Watts Per PSE Port• Industry Leading IEEE 802.3 PSE Conformance Tests• Unique, Fully Automated Multi-Port PSE System Analysis for 802.3at• Flexible 802.3at & 802.3bt Powered Device Emulation​• One-Click 2-Pair and 4-Pair PSE Waveform Analysis• Flexible PoE LLDP Emulation and LLDP Protocol Analysis• Flexible and Accurate Measurements of Voltage and Current• Noise Immune Triggering and Flexible Load Transients• Ethernet 10/100 Control Interface• Smart Fan Control – Runs Cool and Quiet​• Comprehensive Safety and RF Certifications​

  • PowerSync Analyzer

    PSA-3000 - Sifos Technologies, Inc.

    Sifos Technologies offers the PowerSync® Analyzer PSA-3000 multi-slot chassis support the world’s most comprehensive and automated PSE Conformance Test Suites covering PSE’s that power up to 30W on 2-pairs and up to 90W on 4-pairs. Connects up to 24x PSE ports and provides access to the PSE Conformance Test Suite, the Multi-Port Suite, and LLDP Emulation and Analysis.Key Features• Continuous 2-Pair Loading > 47 Watts Per PSE Port• Continuous 4-Pair Loading > 99 Watts Per PSE Port• Industry Leading IEEE 802.3 PSE Conformance Tests• Unique, Fully Automated Multi-Port PSE System Analysis for 802.3at• Flexible 802.3at & 802.3bt Powered Device Emulation​• One-Click 2-Pair and 4-Pair PSE Waveform Analysis• Flexible PoE LLDP Emulation and LLDP Protocol Analysis• Flexible and Accurate Measurements of Voltage and Current• Noise Immune Triggering and Flexible Load Transients• Ethernet 10/100 Control Interface• Smart Fan Control – Runs Cool and Quiet​• Comprehensive Safety and RF Certifications​

  • Caibration Equipment For Lab Use

    Ponovo Power Co., Ltd.

    In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.

  • Ruggedized Test System

    PUMA - ADVINT, LLC

    PXI/PXIe & cDAQ/cRIO Based Test System with Digital, Analog, Pneumatics, and RF. Open Architecture and Modular - Customizable to meet unique needs. Rugged, Portable, and Field Deployable with - MIL-STD-810G Transit Cases; Shock & vibe protection, Lightweight & amp; stackable and Watertight shipping container. Has an Accessory Case for ITAs, Cables, Fixtures, etc. MacPanel SCOUT Direct Access Kit (DAK) Interface. Industry Leading Software. International Power Operation (optional). Fully Automated System Self-Test & Field Calibration (optional)

  • Automatic Metallic Pendulum Impact Testing Machine

    Jinan Testing Equipment IE Corporation

    JB-450/750A automatic type pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and is capable of doing a large number of impact tests continuously. The automatic type pendulum impact tester can display the impact power, impact toughness, and the pendulum's rotation angle. All the testing reports can be printed out. JB-450/750A can be equipped with fully automated sample feeding system, which greatly improves the test efficiency, and reduce labor intensity. The crygenic cooling device is available for impact tests under the lowest temperature down to -196 C. The automatic type pendulum impact testing system is the essential quality control equipment for metal material manufacturers and QC departments, as well as the necessary instrument of research institutes for new material research.