Showing recent results 196 - 210 of 299 products found.
-
E6567E - Keysight Technologies
Keysight's newest wireless test manager for cdma2000/1xEV-DO/LTE technology is E6567E. E6567E provides fast switching between wireless technologies to expedite testing and support 8960 test applications and E6621A for automated test. In addition, E6567E retains virtually all of the features and measurements of cdma2000 and 1xEV-DO wireless test managers. E6567E uses the Microsoft Visual Studio .NET development environment for custom test development. This standalone automatic test system software provides LTE, cdma2000, IS-95, AMPS, and 1xEV-DO-specific tests and complete menu-driven test plans, plus test exec functionality. For manufacturing and R&D test engineers, the E6567E is a powerful, flexible, standard platform, with user-friendly features that make it easy to define final tests and calibrate tests for wireless device production lines.
-
ORION - A&D Technology, Inc.
ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
-
Taylor Dynamometer, Inc.
The Taylor Dynamometer Electric Motor Test Stand is designed to provide maximum reliability, excellent durability and flawless performance. Using our extensive line of Water Brake engine dynamometers, Taylor Dynamometer has systems available for testing electric motors from 5 to 13,000 hp (3.7 to 9,694 kW). Include an instrumentation package to achieve your testing requirements. From simple speed, torque and power display systems with manual control to completely automated testing solutions, Taylor Dynamometer has a system to meet your testing requirements.
-
E6567F - Keysight Technologies
Keysight's newest wireless test manager for cdma2000/1xEV-DO/LTE/LTE-A technology is E6567F. E6567F provides fast switching between wireless technologies to expedite testing and support 8960 and E7515A for automated test. In addition, E6567F retains virtually all of the features and measurements of cdma2000 and 1xEV-DO wireless test managers. E6567F uses the Microsoft Visual Studio .NET development environment for custom test development. This standalone automatic test system software provides LTE/LTE-A, cdma2000, IS-95, AMPS, and 1xEV-DO-specific tests and complete menu-driven test plans, plus test exec functionality. For manufacturing and R&D test engineers, the E6567F is a powerful, flexible, standard platform, with user-friendly features that make it easy to define final tests and calibrate tests for wireless device production lines.
-
M3102A - Keysight Technologies
The M3102A PXIe digitizer is ideal for general purpose digitizer automated test requirements. It offers high channel density with an advanced data acquisition systems (DAQ). The optional real-time sequencing, inter-module synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including angle of arrival (AoA), baseband electronics designs, wireless device manufacturing and multi-channel coherent signal acquisition.
-
M3100A - Keysight Technologies
The M3100A PXIe digitizer is ideal for general purpose digitizer automated test requirements. It offers high channel density with an advanced data acquisition systems (DAQ). The optional real-time sequencing, inter-module synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including angle of arrival (AoA), baseband electronics designs, wireless device manufacturing and multi-channel coherent signal acquisition.
-
ATE - Frontier Electronic Systems Corp.
The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.
-
2440 - Photon Kinetics
The 2440 Launch Analyzer is the first fully automated test system for characterizing the optical power distribution of the light produced by VCSEL laser sources, multimode fiber test equipment and launch cords utilized in multimode fiber links. Built on over 20 years of experience testing the transmission and geometric properties of muitimode fibers, the 2440 is the ideal solution for ensuring that source launches comply with applicable international component specifications and measurement standards. The 2440 can be configured for measurements in either or both the 850 and 1300 nm windows.
-
DMC, Inc.
Automated test systems may be as simple as a laptop with a DAQ module or a stand-alone controller, but they typically require a mix of off-the-shelf and custom hardware. All that hardware is integrated and wired into a test stand. Portable or mobile test stands are ideal for in-the-field research and development and servicing of multiple laboratories or manufacturing lines. Test stand access to the front panels of hardware and subcomponents allows manual configuration of non-automated settings. Quick disconnects, cable harnesses, and easy access to probes provides efficient setup and tear-down. Expandable or modular rack mount and card base systems facilitate future needs. Ergonomic considerations include keyboard and display placement, along with number of monintors. Safety is always crucial with proper E-stop placement and keeping dangerous elements away from users.
-
Pilot 4D L4 - SEICA SpA
The Pilot 4D L4 represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system. Thanks to its integrated SMEMA conveyor, the Pilot 4D L4 can be combined with automatic load/unload magazines or lines, executing in-circuit, functional and visual tests of electronic boards in a completely automated mode. This is the ideal solution for medium and even high volume production test needs. The large test area can accommodate 21” x 24” boards (540 x 610 mm) board with split test. The ATE rack can be expanded with up to 1032 analog channels, connectable to an optional external bed of nails test fixture (TPM).
-
Photo Emission Tech., Inc.
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
-
Sciencescope International
Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.
-
CNG-EbNo - Noisecom
The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
-
PXI-2594 / 778572-94 - NI
2.5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module—The PXI‑2594 is ideal for applications that require the routing of high-frequency signals inside automated test equipment (ATE) systems because it can switch signals with very low insertion loss. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
-
PXI-2595 / 778572-95 - NI
5 GHz, 50 Ω, 4x1 PXI RF Multiplexer Switch Module—The PXI‑2595 is ideal for applications that require the routing of high-frequency signals inside automated test equipment (ATE) systems because it can switch signals with very low insertion loss. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
