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Miniature Dual-Stage Isolators
780nm And 852nm
AOSense offers dual-stage, free-space optical isolators at 780 nm and 852 nm for enhanced isolation. The innovative, small package size enables integration into compact laser sources and amplifiers without sacrificing transmission efficiency. The low external magnetic field enables the isolator to tightly integrate into systems with high magnetic-field sensitivity such as atomic spectrometers, magnetometers, clocks, and cold-atom devices.
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Space Payloads
With our expertise in both space and quantum technology we are exploring space based quantum instruments. CASPA is Teledyne e2v’s satellite platform for developing and demonstrating quantum scientific sensors and precision atomic timing in space.
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Nano Tribometer
NT-30
NT-30 enables user to study interactions at atomic level. Easy to interchange modules with advanced high precision mechanical design allows it to unfold new hidden mysteries in nanotechnology.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illuminat...show more -
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Atomic Spectroscopy
Agilent’s comprehensive atomic spectroscopy software portfolio leads the industry in the simple setup and productivity tools required by routine analytical laboratories, while also providing the flexibility needed for advanced method development in research and academia. Our advanced ICP-MS software, including the powerful ChemStation and MassHunter systems, are used in all of our mass-spec platforms, so you can benefit from a single solution and reduce staff training requirements. Our cutting edge ICP software also enables intuitive control in ICP-MS processes.
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In-Situ Spectroscopic Ellipsometer for Real-Time Thin Film Monitoring
UVISEL Plus In-Situ
The UVISEL Plus in-situ spectroscopic ellipsometer can be easily mounted on process chambers (PECVD, MOCVD, sputter, evaporation, ALD, MBE) for the real-time control of thin film deposition or etch processes.The UVISEL Plus in-situ provides the unique combinations of very high speed, sensitivity, dynamic range and accuracy making the instrument able to control deposition / etch at the atomic layer thickness level, even for rapid processes.
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Multitype ICP Emission Spectrometers
ICPE-9800 Series
Due to their high detection sensitivity down to ppb levels, ability to analyze a broad 5 to 6-digit range of concentrations, and ability to measure multiple elements simultaneously, ICP emission spectrometers are used in a broad range of fields, such as environmental testing, pharmaceuticals, foods, chemicals, and metals. ICPE-9800 Series of simultaneous ICP atomic emission spectrometers are next-generation systems that offer the superior accuracy necessary to simultaneously and quickly analyze ...show more -
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Ultra-Low Frequency Workstation
MK52 Series
Providing Ultra-Low Frequency levels, the MK52 Series offers the ultimate low natural frequency performance for a wide range of high resolution instruments, such as analytical balances, cell injection, confocal microscopes, patch clamping, optical microscopes, wafer probing, sensor calibration, atomic force microscopes and other sensitive equipment requiring high isolation efficiency.
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Erbium Fiber Frequency Comb
Detailed description of item: The AOSense frequency comb is a low noise, polarization maintaining (PM) device. Key features include a PM fiber architecture centered at 1550nm with turnkey modelocking; a free-running linewidth of the carrier-envelope offset frequency of <200 kHz; a temperature-insensitive all-fiber f-2f interferometer exhibiting fceo beatnotes with SNR > 45dB (300kHz RBW); and dual fast/slow cavity length actuators with a bandwidth of >300 kHz. The repetition rate of the...show more -
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Surface Analysis
Dimension FastScan Bio
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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GPS Clocks
The Excelitas Rubidium Atomic Frequency Standard ( RAFS) is an exceptionally high-performance and high-reliability space-qualified rubidium clock developed for global navigation satellite systems.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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4210A Rubidium Frequency Standard
Precise Time and Frequency, Inc.
The ptf 4210A Rubidium Frequency Standard is a unique solution for providing a highly stable, low phase noise, frequency reference for applications requiring atomic reference stability performance.The instrument contains a high performance rubidium module, with an extended life design, and very low aging rate, with high quality OCXO o/p for low phase noise.
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Glow Discharge Atomic Emission Spectrometer
GDS900
LECO's Glow Discharge Spectrometer (GDS) offers you state-of-the-art technology designed specifically for routine elemental determination in most conductive ferrous and nonferrous materials. The GDS900 features improved performance, stability, accuracy, and precision in steel, iron (including as-cast), aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium materials, while featuring our user-friendly Cornerstone® brand software to help streamline your analysis.
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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High-resolution Spectrometer
HR4000
Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
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AFM for Large Samples
NaniteAFM
The unparalleled small footprint of the NaniteAFM scan head and its highprecision/quick lock mounting system make it the ideal atomic force microscopefor integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures.
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High-Speed AFM
Is a type of atomic force microscopy (AFM) that, unlike conventional AFM, can take an image very quickly and with relatively low imaging force, therefore allowing for visualizing the dynamic behavior of biomolecules.
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Rubidium Oscillator
IQRB-2
The IQRB-2 low noise rubidium oscillator is a sub-miniature atomic oscillator combined with 'active noise filter' technology. This rubidium oscillator has 100 times less drift than OCXOs and with short term stability of 0.002ppb/s at 100s this rubidium oscillator provides significant improvements in performance over other rubidium components.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Atomic Absorption Spectrometer
Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Atomic Spectroscopy Software
The range of Agilent atomic spectroscopy software, available with and without compliance solutions, includes SpectrAA, MP Expert, ICP Expert and ICP-MS MassHunter software.
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Electronics & Power
Excelitas Technologies offers a wide range of high-performance electronics, power and energetics technologies to drive your most demanding photonic systems. Our Electronics & Power offering includes Capacitor Chargers, Spark Gaps and Transformers, High-Voltage DC Power Supplies and Atomic Frequency Standards. Our Energetics portfolio includes Electronic Safe & Arm devices, Detonators, Ignition Safety devices, and Rocket Motor Initiators.
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Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Cold Vapor Atomic Fluorescence (CVAF) Mercury Analyzer
QuickTrace M‑8000
The QuickTrace® M-8000 Cold Vapor Atomic Fluorescence (CVAF) mercury analyzer is ideal for ultra-trace to sub-mg/L mercury quantitation. Due to the high sensitivity of the M-8000, it easily achieves the ultra-trace detection limit of <0.05 ng/L total mercury that is demanded by customers following EPA method 1631. The QuickTrace® M-8000 is also versatile enough to analyze samples >400 µg/L without dilution in a research or industrial setting.
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Miniature Single-Stage Isolators – 780nm And 852nm
AOSense is excited to offer free-space optical isolators at 780 nm and 852 nm. The innovative, small package size enables integration into compact laser sources and amplifiers without sacrificing transmission efficiency. The low external magnetic field enables the isolator to tightly integrate into systems with high magnetic-field sensitivity such as atomic spectrometers, magnetometers, clocks, and cold-atom devices.
