- Applied Rigaku Technologies, Inc
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer
QuickTrace M‑7600
The QuickTrace® M-7600 Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer easily achieves the ultra-trace mercury detection limit of <0.5 ng/L. The QuickTrace® M-7600 is ideal for ultra-trace to sub-mg/L mercury quantitation. The M-7600 is designed for routine and research use in a variety of settings, including environmental laboratories, industry, and research institutes, for virtually any aqueous acidified sample.
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Erbium Fiber Frequency Comb
Detailed description of item: The AOSense frequency comb is a low noise, polarization maintaining (PM) device. Key features include a PM fiber architecture centered at 1550nm with turnkey modelocking; a free-running linewidth of the carrier-envelope offset frequency of <200 kHz; a temperature-insensitive all-fiber f-2f interferometer exhibiting fceo beatnotes with SNR > 45dB (300kHz RBW); and dual fast/slow cavity length actuators with a bandwidth of >300 kHz. The repetition rate of the...show more -
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Atomic Force Microscope
XE-PTR
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Multitype ICP Emission Spectrometers
ICPE-9800 Series
Due to their high detection sensitivity down to ppb levels, ability to analyze a broad 5 to 6-digit range of concentrations, and ability to measure multiple elements simultaneously, ICP emission spectrometers are used in a broad range of fields, such as environmental testing, pharmaceuticals, foods, chemicals, and metals. ICPE-9800 Series of simultaneous ICP atomic emission spectrometers are next-generation systems that offer the superior accuracy necessary to simultaneously and quickly analyze ...show more -
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Space Payloads
With our expertise in both space and quantum technology we are exploring space based quantum instruments. CASPA is Teledyne e2v’s satellite platform for developing and demonstrating quantum scientific sensors and precision atomic timing in space.
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The Nanomotor®
The patented Nanomotor® is a piezo driven linear motor. It is a multifunctional basic part for many positioning and manipulation devices. It has a positioning stroke of up to more than a centimeter while operating with atomic resolution. The Nanomotor thus bridges eight orders of magnitude. The Nanomotor consists of a cylindrical housing and a slider with a free axial hole inside. It combines high resolution in the sub-nanometer range with a large positioning stroke. The Nanomotor utilizes a pie...show more -
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The Level AFM For Educational Purposes
"Eddy"
„Eddy“ is an Atomic Force Microscopy system for student's education. It bases on the approved Level AFM setup and includes a full sample set and a large cantilever set.
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Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Nano Tribometer
NT-30
NT-30 enables user to study interactions at atomic level. Easy to interchange modules with advanced high precision mechanical design allows it to unfold new hidden mysteries in nanotechnology.
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Rubidium Instruments
Our range of atomic / rubidium disciplined time and frequency standards in a variety of enclosures and sizes to suit all appliations. These acurate time and frequency references are used in telecoms, aviation, nautical and precision test and measurement enviroments.
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Surface Analysis
Dimension FastScan Bio
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Mineral Insulated Cables
We have world-class manufacturing plant for producing wide range of Mineral insulated (MI Cable), metal-sheathed cable. The applications of MI Cable are many such as blast furnace, atomic research, nuclear reactors, Kilns and many more. We provide standard as well as custom-built cables as per the customer need/ application requirement. We have very flexible lines so always ready to meet the demand.
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Atomic Absorption Spectrometry
Is an easy, high-throughput, and inexpensive technology used primarily to analyze elements in solution.
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Atomic Absorption Systems
Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.
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High Power Microwave Plasma Source
The High Power Microwave Plasma Source can be combined with a 6kW microwave generator for a high concentration of radicals providing a high productivity manufacturing solution. The High Power Microwave Plasma source is capable of igniting in multiple process gases, over a wide operating range with performance benefits in current and emerging applications such as, high throughput photoresist removal, advanced surface cleaning and conditioning, as well as, advanced deposition applications at the atomic level.
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Atomic Spectroscopy Software
The range of Agilent atomic spectroscopy software, available with and without compliance solutions, includes SpectrAA, MP Expert, ICP Expert and ICP-MS MassHunter software.
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Atomic Absorption Spectrometer
Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Rubidium Oscillator
IQRB-2
The IQRB-2 low noise rubidium oscillator is a sub-miniature atomic oscillator combined with 'active noise filter' technology. This rubidium oscillator has 100 times less drift than OCXOs and with short term stability of 0.002ppb/s at 100s this rubidium oscillator provides significant improvements in performance over other rubidium components.
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Microscope Photoluminescence Spectrometer
Flex One
Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can ...show more -
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Atomic Force Microscope
NX10
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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Frequency Reference
Quartzlock time and frequency standards offer a complete range of cost effective and low noise in both atomic controlled (rubidium oscillator) and GPS controlled (off-air) time and frequency reference, calibrators and standards. These acurate time and frequency references are used in telecoms, aviation, nautical and precision test and measurement enviroments.
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Rubidium Oscillator
Rubidium oscillators are a type of atomic clock and are the most accurate time standards known and are used as time distribution services to control things such as telecommunications infrastructure, TV broadcasts and global navigation satellite systems (GPS).
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Electronics & Power
Excelitas Technologies offers a wide range of high-performance electronics, power and energetics technologies to drive your most demanding photonic systems. Our Electronics & Power offering includes Capacitor Chargers, Spark Gaps and Transformers, High-Voltage DC Power Supplies and Atomic Frequency Standards. Our Energetics portfolio includes Electronic Safe & Arm devices, Detonators, Ignition Safety devices, and Rocket Motor Initiators.
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Advanced Stand-Alone AFM
SmartSPM
The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Cold-Atom Frequency Standard
Rack-mount microwave atomic clock using laser-cooled 87Rb atoms. Production unit target specifications: Allan deviation 2×10-12 @ 1 s, 2×10-14 @ 104 s; flicker floor 1×10-14; absolute accuracy < 1×10-13.
