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Atomic

of or related to atoms.


Showing recent results 1 - 15 of 97 products found.

  • Real-time atomic clock combiner

    VCH-317 - VREMYA-CH JS Company

    Real-Time Atomic Clock Combiner (Combiner) produces an uninterrupted in frequency and phase signal on the base of group atomic clocks. Operational principle of Combiner is based on phase synchronization of local crystal oscillator using multichannel phase comparator and digital processor. Digital control of output frequency performed by built-in processor provides such advantages as programming frequency and phase shifts of output signal with high resolution.

  • Atomic Force Microscope

    AFM - A.P.E. Research

    Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.

  • Atomic Force Microscope (AFM)

    nGauge - ICSPI Corp

    The nGauge AFM is the world’s only truly benchtop atomic force microscope (AFM). Produce high-quality topography images down to the nanoscale in seconds on virtually any surface—no vibration isolation table required.

  • Atomic Absorption Spectrometer

    Qualitest International Inc.

    Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.

  • Atomic Force Microscope

    AFM - Anton Paar GmbH

    Anton Paar offers the first atomic force microscope for industrial users. The unique combination of premium technology with unrivalled ease of use makes it the first AFM that is fit for industrial users as well as scientists. It employs a new form of automation on every level of operation to increase the efficiency and simplify the handling of your AFM measurements.

  • Atomic Force Microscopy

    Bruker Nano Surfaces

    Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.

  • Atomic Absorption Spectrometry

    Skyray Instruments

    tomic Absorption Spectroscopy is a spectroanalytical procedure for the quantitative determination of chemical elements. AAS technique is widely applied for determining the concentration of a elements in Chemistry and other fields such as metallurgy, environmental, petrochemical, industrial and pharmaceutical. Skyray Instruments Atomic Absorption Spectrometers feature low limits of detection with multiple atomization modes and state-of-the-art user friendly software.

  • Atomic Absorption Systems

    Agilent Technologies

    Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.

  • Atomic Spectroscopy Data Systems

    Agilent Technologies

    Agilent’s comprehensive atomic spectroscopy software portfolio leads the industry in the simple setup and productivity tools required by routine analytical laboratories, while also providing the flexibility needed for advanced method development in research and academia. Our advanced ICP-MS software, including the powerful ChemStation and MassHunter systems, are used in all of our mass-spec platforms, so you can benefit from a single solution and reduce staff training requirements. Our cutting edge ICP software also enables intuitive control in ICP-MS processes.

  • Atomic Force Microscope

    HDM Series - Park Systems Corp.

    The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.

  • Atomic Absorption Spectroscopy

    Shimadzu Corp.

    Since the atomic absorption spectrophotometer was first launched in 1968, Shimadzu Corporation has remained at the forefront of the world inorganic analysis industry. Shimadzu still maintains an overwhelming market share with highly-regarded products that are selected as the market standard throughout the world. The extensive product range incorporates fully automatic general-purpose systems, a simple and low-cost AA instrument, and a dedicated soil and plant analyzer. They all share great ease-of-use, high functionality, and excellent reliability. Choose Shimadzu to dramatically enhance the productivity and reliability of your laboratory. Shimadzu products will meet all your demands.

  • AFM - Atomic Force Microscope

    Keysight Technologies

    Keysight Technologies offers a wide range of high-precision atomic force microscopes (AFM) to meet your unique research needs. Keysight's highly configurable instruments allow you to expand the system's capabilities as your needs occur. Keysight's industry-leading environmental/ temperature systems and fluid handling enable superior control for electrochemistry, polymer and life-science applications. Keysight offers a broad array of scanners, from one micron to 90 microns, with top-down scanning that protects electronics and piezo elements from damage caused by liquid or harsh imaging environments. And, Keysight's innovative nose cones make changing imaging modes quick and easy. Keysight delivers exceptional worldwide support, provided by experienced AFM application scientists and technical service personnel, giving you the assistance necessary for your research.

  • Atomic Absorption Spectrophotometer

    MRC ltd.

    Integrated flame/graphite furnace Wavelength range 190-900nmWavelength accuracy Better than 0.25nmSpectral bandwidth 0.1 nm, 0.2nm, 0.4nm, 1.2nm, auto switch overGrating 1800 l/mm Focal length 277mm Blazed wavelength 250nmAdopting FUZZY-PID and dual curve modelight-controlled temperature control techniqueThe temperature control accuracy is less than 1%Easy and practical analysis software Adopting large-scale programmable logic array & Inter I2C bus tech Multi-function autosamplerCharacteristic Mass of Some Elements using richoxygen air-C2H2 flame and other flame methods Automatic wavelength scanning and peak picking. Automatic spectral bandwidth changing.Autosampler 55 sample vessels

  • Atomic Emission Analyzer

    Torontech Group

    Automatic Vicat needle unit is to determine the initial and final setting time of cement, mortar pastes and gypsum according to DIN 1164/ EN196/ BS 4550/ ASTM C187-191/ DIN 1168. The beginning and the end of the setting process is determined by the penetration behaviour of a steel needle into a cement paste sample, under certain specified conditions.

  • Atomic Force Microscope

    NX-Hivac - Park Systems Corp.

    Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.