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Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
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Atomic Absorption Spectrometer
Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Ozone Gas Delivery Systems
MKS ozone gas delivery systems provide field-proven, high concentration, ultra-clean ozone generation for advanced thin film applications such as Atomic Layer Deposition (ALD), Chemical Vapor Deposition (CVD), Tetraethyl Orthosilicate (TEOS)/Ozone CVD (HDSACVD), contaminant removal and oxide growth. Gas delivery models have integrated ozone concentration monitoring, flow control, and power distribution. Additional system options include safety monitoring, status indicators and ozone destruction capability.
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Nanolattice Standards for Analytical Instruments
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
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Glow Discharge Atomic Emission Spectrometer
GDS900
LECO's Glow Discharge Spectrometer (GDS) offers you state-of-the-art technology designed specifically for routine elemental determination in most conductive ferrous and nonferrous materials. The GDS900 features improved performance, stability, accuracy, and precision in steel, iron (including as-cast), aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium materials, while featuring our user-friendly Cornerstone® brand software to help streamline your analysis.
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Analytical Services
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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NanoLattice Pitch Standard (NLSM)
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Atomic Spectroscopy
Agilent’s comprehensive atomic spectroscopy software portfolio leads the industry in the simple setup and productivity tools required by routine analytical laboratories, while also providing the flexibility needed for advanced method development in research and academia. Our advanced ICP-MS software, including the powerful ChemStation and MassHunter systems, are used in all of our mass-spec platforms, so you can benefit from a single solution and reduce staff training requirements. Our cutting edge ICP software also enables intuitive control in ICP-MS processes.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Rubidium Atomic Audio Clock
PERF10
Stanford Research Systems, Inc.
Perfection is a high standard - but your studio clocks deserve nothing less. That''s why we designed the PERF10, to offer audio professionals and demanding audiophiles a frequency reference of staggering accuracy and unmatched stability.
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Electronics & Power
Excelitas Technologies offers a wide range of high-performance electronics, power and energetics technologies to drive your most demanding photonic systems. Our Electronics & Power offering includes Capacitor Chargers, Spark Gaps and Transformers, High-Voltage DC Power Supplies and Atomic Frequency Standards. Our Energetics portfolio includes Electronic Safe & Arm devices, Detonators, Ignition Safety devices, and Rocket Motor Initiators.
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Atomic Spectroscopy
Tens of thousands of installations worldwide rely on PerkinElmer spectrometers to obtain accurate results from inorganic elemental analyses quickly, efficiently, effortlessly. No matter what your field, application or sample type, we have the tools and expertise to help -- all based on more than 50 years at the forefront of atomic spectroscopy technology. Take advantage of our complete array of solutions for unparalleled performance, accuracy, and confidence.
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Atomic Force Microscope
DriveAFM
The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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kSA ACE
The kSA Atomic Control for Epitaxy (ACE) metrology tool is a highly sensitive instrument that measures the in situ flux rate of atomic species using the principle of atomic absorption spectroscopy.
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ALD
Atomic Layer Deposition (ALD) offers precise control down to the atomic scale.Atomic layer deposition holds tremendous promise across a wide array of industries, including energy, optical, electronics, nanostructures, biomedical, and more. Please check out our Applications section for more details in any and all of these areas.
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Atomic Force Microscope
XE7
Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
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Nuclear Safeguard Systems
Nuclear Safeguards are measures to verify that States comply with their international obligations not to use nuclear materials (plutonium, uranium and thorium) for nuclear explosives purposes. Global recognition of the need for such verification is reflected in the requirements of the Treaty on the Non-Proliferation of Nuclear Weapons (NPT) for the application of safeguards by the International Atomic Energy Agency (IAEA). Also, the Treaty Establishing the European Atomic Energy Community (the Euratom Treaty) includes requirements for the application of safeguards by the European Commission. Organizations such as the IAEA and EURATOM and others are tasked with ensuring declared amounts of material are indeed present in the facilities in which they are stored and that such material is not being diverted to other uses.
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NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Atomic Force Microscope (AFM)
CombiScope
The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Ozone Gas Generators
SEMOZON® Ozone gas generators and subsystems are the industry standard for compact, high concentration, ultra-clean ozone gas generation. Applications include Atomic Layer Deposition (ALD), Atomic Layer Etch (ALE), Chemical Vapor Deposition (CVD) and Wet Cleaning.
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CVAF – Cold Vapor Atomic Fluorescence
Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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ALD Applications
Atomic Layer Deposition (ALD) has the potential to optimize product design across a wide array of applications from making silicon chips run faster, to increasing the efficiency of solar panels, to improving the safety of medical implants.
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Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Atomic Force Microscope
AFM Heron
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer
QuickTrace M‑7600
The QuickTrace® M-7600 Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer easily achieves the ultra-trace mercury detection limit of <0.5 ng/L. The QuickTrace® M-7600 is ideal for ultra-trace to sub-mg/L mercury quantitation. The M-7600 is designed for routine and research use in a variety of settings, including environmental laboratories, industry, and research institutes, for virtually any aqueous acidified sample.
