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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25J-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Atomic Force Microscope
AFM Heron
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25L-12
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25J-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Cleanliness Inspection System / Microscope
CIX90
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Acoustic Microscope
AMI D9650
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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TSC157 Solar Panel Probe
TSC157
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 25Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,114Overall Length (mm): 28.30
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T-7-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) Bead Probe
BTP-1C-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.68 (48.00) - 3.20 (91.00) General Purpose Probe
HPA-52T
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2B40-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Atomic Force Microscope
DriveAFM
The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
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Compact Inverted Microscope, 1mm Field Of View
Viewing transparent samples from below in a Petri dish, flask, well plate or cavity slide. The microscope is compact and can be put inside most incubators to view experiments without opening the door. Time-lapse images can be saved and viewed remotely.Ideal for use as a Bench Microscope in teaching applications.
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Industrial Microscope Solutions
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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SPL-03C-114 Step Probe
SPL-03C-114
Current Rating (Amps): 6Average DC Resistance lower than (mOhm): 50Test Center (mil): 125Full Travel (mil): 170Full Travel (mm): 4.32Recommended Travel (mil): 127Recommended Travel (mm): 3.23Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1I8-7-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25I8-12
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Non Replaceable General Purpose Probe
MEP-20
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25I35-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Digital Microscopes
Digital microscopes are microscopes without eyepieces. A digital camera acts as a detector. Images are displayed on a screen or monitor, turning the microscopy workstation into an ergonomic digital workplace.
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Current Probe
LFR
Power Electronic Measurments Ltd
The LFR is ideal for power quality applications. It has a small, predictable phase error, for power measurements at 45/65Hz. The wide bandwidth allows accurate measurement up to and even above the 400th harmonic.
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Current Probe
PA-629
*Maximum Current Value: +/- 200ADC, 140A RMS*1mA = 10mA, 100mA (switchable)*Rising Time: 1.2uS*Bandwidth: DC ~ 300kHz*Over Range Indicator*Battery, AC Power Supply Adaptor (free), dual usages
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Luminance Probe
LP471LUM2
Photometric probe for measuring the LUMINANCE, spectral response according to the photopic curve, angular field 2°.
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Probes
SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Interposers and Probes
The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-H150-1
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
