-
Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
-
-
Product
System Components
-
System components and accessories complete the Bender product portfolio:Coupling devices for ground-fault monitoring at high voltages, analog measuring instruments, power supply units, interface converters and interface repeaters.Please contact us for advice regarding these and other system components.
-
Product
Torque Metering System
Model TMS2200
-
Full capability of standard RDT2100 model with the addition of a Class I Division II certification of the system.
-
Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
-
-
Product
Mixed signal LSI test system
-
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
-
Product
Imaging Gauge Software Test System
-
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
-
Product
Powertrain Analysis System
KiBox2
-
With the KiBox2 analysis system, you have all the data related to vehicle powertrains under control.
-
Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
-
Product
Desktop Type AE Systems
-
Compared to the online remote AE systems, desktop type AE systems are connected to and accessible within the local network, either directly by wires or via wireless local networks. Such desktop type AE detection system is normally use with a computer or laptop on a desk or table on site or near the facility. It is usually conducted and real-time controlled by professionals to accurately locate the AE ‘Hits’ sources and analyse the AE data in full aspects. There are two types of AE systems that can be used as desktop type systems, the SAEU3H multi-channel AE system and the RAEM systems respectively.
-
Product
Miniature IC Handler
3270
-
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
-
Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
-
Product
Mezzanine System
5093
System
ECM P/N 5093 provides 2 independent full bridge circuits. The two full bridge circuits can be used together to drive one small two phase stepper motor. Each full bridge circuit can drive one small dc motor or other bipolar load. Note all inductive loads should employ transient protection.
-
Product
3D SPI Series
MS-11e
-
- Exclusive15MP / 25MP CoaXPress Camera System- Dual Projection Shadow Free Moiré Technology- Precision Compound Telecentric Camera Lens- Automated Z-Height Calibration System- Automated PCB Under Board Support System- Precision PCB Warpage Compensation- Closed Loop Communication With Screen Printer- Absolute Repeatability and Reproducibility- INTELLISYS® Industry 4.0 Intelligent Factory Automation System
-
Product
Automatic and Accurate Inspecting Systems
Circuit AOI
-
The Circuit AOI system is designed to perform automatic and accurate inspecting systems. It integrates rigid mechanical system with advanced vision technology and manufactured and tested by strict is standards. It is suitable for circuit inspection for PCB/FPC, verification and repair. Innovation and unique inspection algorithms are applied to inspect open, short, protrusion, nick, scratch, pin hole, island, line width/space violation, object missing and others defects. AOI system can use offline setup project and check results. It will improve the throughput.Compare to halogen lighting, the full angle LED lighting of Circuit AOI can obtain the best image contrast and is good for different panel type inspection.
-
Product
UHVDC(Untro High Voltage DC) Testing
-
In the super (ultra) high-voltage transmission field, UHVDC converter stations are mainly composed of three parts: AC system, valve system, and DC system. Each part consists of primary and secondary electrical equipment. PONOVO, relying on its core technology, extensive system testing experience and high-efficiency production capabilities, have continuously explored super (ultra) high-voltage test technologies, and nearly 10 types of test equipment have been developed for converter system substations and system debugging.
-
Product
Upstream-Measurement-System
AMA 310 UMS & VAROS 107
-
This system combines the KWS devices AMA 310/UMS and VAROS 107 to a high-end monitoring system for the return path frequency range. An AMA 310 in a 19-inch version (3.5 RU) with UMS module is used in the headend, in the field the CATV handheld VAROS 107 is the counterpart.
-
Product
Custom Designed Test Fixtures
-
We specialize in automated test systems for both RF and digital devices, modules and systems. Please call to discuss your test requirements.
-
Product
Satellite Geo-location System
-
The Satellite Geolocation System is an accurate, fast, all-in-one solution for locating ground-to-satellite transmission sources.
-
Product
Various Types of Automatic Hardness Testing System
-
Various Types of Automatic Hardness Testing System
-
Product
IT Battery Test System
-
Shenzhen Sinexcel RE Equipment CO., Ltd
IT battery test system support for multiple charging mode (such as CC, CV, CP, pulse, etc.) and discharge mode, to ensure that the battery performance and safety in the practical application. IT battery test system is designed to be modular, easy to maintain, and with anti-reverse connection, data loss and other protection functions
-
Product
Self-Learning Ship Condition Monitoring System
Datum Hawk
-
Datum Hawk is an advanced self-learning condition monitoring system, represents the ultimate sensor system for real-time condition-based ship monitoring, providing savings of both time and money.Datum Hawk is a “Smart”, intelligent system, capable of carrying out the torsional signature analysis of main engine(s), auxiliary engine(s) and diesel generator(s), giving a true insight into the vessel’s mechanical health.
-
-
Product
Broadcast Recording And Compliance Logging System
AMR130
-
The Mividi® Broadcast Recording and Compliance Logging System (AMR130) provides a cost-effective solution for broadcast compliance monitoring and logging. It is a Windows PC based system that utilizes GPU encoding for low-cost video transcoding. The software supports stream recording, file management, editing and playback. The recorder takes transport stream input from UDP over IP or ASI interfaces, as well as Internet OTT streaming input using HLS, RTMP, RTSP, and MPEG-DASH protocols. A single system can support continuous recording of 30 streams.
-
Product
Visible / Infrared / Imaging Test System
System 1808
-
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
-
Product
Scanning Electrochemical Systems
-
The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.
-
Product
Measuring Devices for Magnetically Soft Materials
TMAG-RJJ-3.1
-
The system is a mobile version of computerized measuring system MAG-RJJ-6.0 and is designed for measure the dynamic magnetic properties of the soft magnetic materials e.g. oriented or not-oriented electrical sheet. The system provides the opportunity of a tabular and graphic presentation of the obtained data, which can be presented by means of monitor, printer or plotter. The system works under Windows 2000/XP.
-
Product
Semiconductor Metrology Systems
-
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
-
Product
60 GHz Systems and Modules
-
The Pasternack / Vubiq 60 GHz development system provides rapid evaluation of Pasternack’s 60 GHz waveguide modules and customer prototyping for system development. This 60 GHz developer kit is created from a partnership between Pasternack and Vubiq (pronounced “View-bik”), an industry expert in designing 60 GHz RF systems. Our 60 GHz wireless development system makes it easy to design new products and applications in the emerging unlicensed millimeter wave ISM band.
