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Product
CXG RF Vector Signal Generator, 9 kHz to 6 GHz
N5166B
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Essential signal generation for IoT and general-purpose devices.
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Product
PXIe-5644, 6 GHz, 80 MHz Bandwidth, RF PXI Vector Signal Transceiver
782376-01
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6 GHz, 80 MHz Bandwidth, RF PXI Vector Signal Transceiver—The PXIe‑5644 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5644 features the flexibility of a software defined radio architecture with RF instrument class performance.
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Product
RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Signal, Contact, Receiver, QuadraPaddle, 5 Amp, Twin Female
610138200
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Primary mating contact 610138118. (May mate with other Male Adapter and ITA contacts, as well.)
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Product
Image Sensor Testing
IP750Ex-HD Family
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The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
Video Pattern Signal Generator
Model A223800/01/02/03/04
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Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader
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Product
Laser Diode Burn-in Reliability Test System
58604
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The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Vector Signal Analyzers
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Vector signal analyzers combine superheterodyne technology with high speed ADCs and other DSP technologies to provide fast FFT-based, high-resolution in-channel spectrum measurements, demodulation, and advanced time-domain analysis. A vector signal analyzer is especially useful for characterizing complex burst, transient, or modulated signals in aerospace & defense, radar, wireless communications, and avionics.
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Product
Signal, Patchcord, Receiver, 72", QuadraPaddle, 24 AWG Twisted Pair, Single Ended (5 Amps)
7-124424000-072
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Signal, Patchcord, Receiver, 72", QuadraPaddle, 24 AWG Twisted Pair, Single Ended (5 Amps)
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Product
HV Test System up to 20000 Volt
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Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
PXIe-5663E, 6.6 GHz PXI Vector Signal Analyzer
781260-01
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6.6 GHz PXI Vector Signal Analyzer - The PXIe‑5663E offers wide instantaneous bandwidth and supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. You can use a PXIe‑5663E as either a spectrum analyzer or vector signal analyzer, and you can use it with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5663E can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5663E provides a low-cost solution to high-performance RF measurements.The PXIe-5663E comprises the following modules:• PXIe-5601 RF Signal Downconverter• PXIe-5622 IF Digitizer• PXIe-5652 RF Analog Signal GeneratorThere is no physical device named "PXIe-5663E".
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Product
Signal, Patchcord, Receiver, 36", QuadraPaddle, 22 AWG Twisted Pair, Single Ended ( 5 Amps)
7-124422000-036
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Signal, Patchcord, Receiver, 36", QuadraPaddle, 22 AWG Twisted Pair, Single Ended ( 5 Amps).
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Product
PXIe Microwave Signal Generator
LSX2091X
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The LSX2091X is a 20GHz Single Channel PXIe Microwave Signal Generator that offers industry leading performance, in a modern modular 2 slot PXIe format that can be used on the desk, embeded in a system or or easily scaled up to multiple channels ATE systems.
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Product
VXI Digital Multiplier
4152A
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The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
40GHz Dual Channel MW Signal Generator 19" 1U Rack
LSX4092R
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The Lucid-X is a small footprint modular microwave signal generator that is available in multiple form factors, including Desktop, PXIe module, benchtop, rackmount, and portable. It has been designed to provide low phase noise, with a frequency range all the way up to 40GHz.
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Product
Signal, Patchcord, ITA, 36", QuadraPaddle, 24AWG Single Conductor Shielded, Single Ended
7-121974000-036
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Signal, Patchcord, ITA, 36", QuadraPaddle, 24AWG Single Conductor Shielded, Single Ended.
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Product
Vector Signal Transceiver-based Radio Solution (VRS)
ATS-3100 VRS
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The ATS-3100 VRS, the newest member of the ATS-3100 PXI Integration Platform product family and fifth-generation radio test solution, is a single, consolidated platform for testing legacy, modern, and next-gen, software-defined radios for military, civil, and commercial users. Integrating the PXI Vector Signal Transceiver (VST) from National Instruments (NI), the platform enables faster test time with wider bandwidth (up to 1GHz) than any other radio test solution available today.
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Product
Signal, Patchcord, ITA, 72", TriPaddle, 24 AWG Twisted Pair, Single Ended ( 3 Amps)
7-103424000-072
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Signal, Patchcord, ITA, 72", TriPaddle, 24 AWG Twisted Pair, Single Ended ( 3 Amps).
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
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Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
24-Bit High-Resolution Dynamic Signal Acquisition and Generation Module
PCI-9527L
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The PCI-9527L is a high-performance, 2-CH analog input and 2-CH analog output dynamic signal acquisition board. This board is specifically designed for audio testing, acoustic measurement, and vibration analysis applications.The ADLINK PCI-9527L features two 24-bit simultaneous sampling analog input channels. The 24-bit sigma-delta ADC provides a sampling rate up to 216 KS/s at high resolutions, making it ideal for higher bandwidth dynamic signal measurements. The sampling rate can be adjusted by setting the onboard DDS clock source to an appropriate frequency. All channels are sampled simultaneously and accept an input range from ±40 V to ±0.316 V. The PCI-9527L analog input supports software selectable AC or DC coupling and 4 mA bias current for integrated electronic piezoelectric (IEPE) sensors.
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Product
PXIe-2512, 7-Channel, 10 A PXI Signal Insertion Switch Module
780587-12
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PXIe, 7-Channel, 10 A PXI Signal Insertion Switch Module—The PXIe‑2512 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2512 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).
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Product
Vector Signal Generator
SGT100A
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The R&S®SGT100A has a clear focus on automated environments with high speed and a compact design. The radio frequency chain has been optimized for the fastest frequency and level switchover times. In the baseband, the multisegment waveform mode helps users quickly switch from one test signal to the next. Though compact in size, the R&S®SGT100A has excellent RF characteristics (signal quality and level accuracy). Maximum output level, level repeatability and excellent EVM performance are key characteristics in production environments. Equipped with a LAN and USB interface, the R&S®SGT100A enables remote control of test equipment in automated applications.
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Product
Positioning Test System
TS-LBS
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The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Signal, Contact, ITA, TriPaddle, 10 Amp, 14-18 AWG, Crimp/Solder
610110172
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Primary use in CASS applications.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
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The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
