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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40L-013
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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NI-9269, 100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module
781098-02
100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module - The NI‑9269 is a channel‑to‑channel isolated analog output module. The NI‑9269 adds channel‑to‑channel isolation for increased safety and improved signal quality. Channel‑to‑channel isolation is commonly needed for applications that have multiple electrical systems, such as automotive tests, or industrial applications that are subjected to increased noise and often contain multiple ground planes.
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Mezzanine System
5362
ECM P/N 5362 provides eight channels of LVDS I/O with fixed 100 ohm termination. Speeds are up to 200M bits per second. All channels power up as inputs. Software can then enable outputs on a channel by channel basis.
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PXIe, 28.2 Gbps, 48-Channel PXI High-Speed Serial Instrument
PXIe-7903 / 788917-01
The PXIe-7903 is designed for engineers who need high-performance FPGA coprocessing capabilities or who need to validate, interface through, and test serial protocols. It includes a Xilinx Virtex UltraScale+ FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe-7903 takes advantage of FPGA multigigabit transceivers to deliver 48 TX and RX serial lanes.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Lighting Systems for Aviation
Flying on every major platform, Astronics offers decades of proven experience in delivering standard and custom lighting solutions that illuminate the world’s aircraft. From commercial to business to military, chances are we offer experience with your type of fixed-wing or rotorcraft program.
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sbRIO-9264, Non-Enclosed, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
781119-01
Non-Enclosed, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The sbRIO‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the sbRIO‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection. Non-enclosed modules are designed for OEM applications.
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IFC Antennas & Radome Systems
System solutions providing inflight internet and live TV connectivity including satellite communications (SATCOM) systems, protective radome enclosures, antenna mounts, bird strike solutions, and adapter plates.
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Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50B-S
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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NI-9228, ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-01
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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NI-9205, ±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module
780173-01
±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module - The NI‑9205 performs single-ended or differential analog inputs, with four programmable input ranges for each. It is an effective combination of channel count and speed at a low price for an economical multifunction system. You can choose from four programmable input ranges. To protect against signal transients, the NI‑9205 includes up to 60 V of overvoltage protection between input channels and common. In addition, the NI‑9205 also includes a channel-to-earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range. It is rated for 1,000 Vrms transient overvoltage protection.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Mezzanine System
5081
The 5081 provides four channels of 12 bit digital to analog voltage output, with multiple single ended output ranges. Each channel is software selectable for 0 to +5V, 0 to +10V, +/-2.5V, +/-5V, +/-10V or -2.5 to 7.5V ranges. The outputs reset to 0.0 volts on power up.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Single Sensor Enhanced Vision Systems
Rely on the industry leading Max-Viz enhanced vision systems (EVS) from Astronics to enhance your safety and situational awareness while flying.
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NI-9206, ±10 V, 250 kS/s, 16-Bit, 32-Channel, 60 VDC Isolation C Series Voltage Input Module
779526-01
±10 V, 250 kS/s, 16-Bit, 32-Channel, 60 VDC Isolation C Series Voltage Input Module - The NI‑9206 performs differential analog input with four programmable input ranges. The module provides up to 600 VDC (400 VDC in Europe) channel‑to‑earth ground isolation, making the module ideal for accurately monitoring large fuel cell and battery stacks. By referencing the module common (COM) to the middle of the NI‑9206 bank, you can measure 16 consecutive cells and remain within 10 V of the module COM.
