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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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A-S General Purpose Probes
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 230Overall Length (mm): 5.84Rec. Mounting Hole Size (mil): 38Rec. Mounting Hole Size (mm): 0.97Recommended Drill Size: #62 or 0.97 mm
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Automatic System Function Tester
3240
Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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Protective Relay Test System
MTS-5100
The MTS-5100 is the only all-in-one relay test set with a direct front panel interface for all functions, without exception!
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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Fully Automatic Solar Cell
Module Laminator-H
1. Model: BSL2236OAC-H2. Effective lamination area: 2200mm × 3600mm3. Dimensions: length 17410mm × width 3665mm × height 2164mm4. Heating method: heat conduction oil heating5. Compressed air source pressure: 0.6～0.8MPa6. Working vacuum degree: 100～40Pa7. Evacuation rate: 70L/S8. Temperature control accuracy: ±1.5°C9. Temperature control range: room temperature - 180°C10. Temperature uniformity: effective lamination area≤±2℃11. Lamination chamber height: 30mm12. Evacuation time: depending on the process, it is recommended to take 5 to 8 minutes13. Upper cover stroke: 300mm
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Next Generation Network Testing
UX400
The VeEX UX400 is the smallest multi-service transport test solution to offer test capabilities ranging from DS1/E1 all the way up to 6x 100G traffic generation, supporting the latest 100G/40G optical pluggable form factors (CFP4, CFP2, CFP, QSFP28, QSFP+, no adapters required). Its modular architecture allows for up to six independent test modules and up to twelve concurrent tests or combinations of tests, including legacy PDH/DSn, SDH/SONET, OTN, Ethernet, Fibre Channel, CPRI/OBSAI, C/DWDM spectrum analysis and more. The platform's software architecture has been developed so that multiple users or scripts are able to access and operate different test modules at the same time, maximizing the use of resources. A battery backup option is available for the portable UX400 platform. Test modules can also operate in a standard 19" rack – the UX400R, when portability or battery operation is not needed.
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AC Resonance Test System
KV Hipot Power Test Equipment Co.,Ltd
KVXZ-270kVA/270kV Variable Frequency AC Resonance Test System is applied for AC dielectric test for electric equipment.
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EPA-5 General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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C-Mic Auto Test System
BK9010B
Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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PXI-5412, 20 MHz Bandwidth, 1-Channel, 14-Bit PXI Waveform Generator
779176-02
20 MHz Bandwidth, 1-Channel, 14-Bit PXI Waveform Generator - The PXI‑5412 is a 20 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms and standard functions including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Vibration Testing System
Wewon Environmental Chambers Co, Ltd.
Vibration Testing is performed to determine if a product can withstand the rigors of its intended use.
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Dayton Audio Test System
DATS V2
Highly accurate measurement of loudspeaker impedance and T/S parametersEasy-to-use, fully-featured measurement software with intuitive interfaceCompact USB measurement module with molded test leads and alligator clipsSoftware includes signal generator, scope, and measurement of inductors and capacitorsData can be saved to create a driver parameter library or exported to popular box design programsNew V2 hardware and software simplify setup and eliminate warm-up/cool-down times
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Power Module And Device Testing System
Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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SoC Test System
V93000 SoC / Smart Scale
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Motion Simulator For Test Systems
Metis
METIS is a motion simulator for sensor and end system level testing. Configurable design allows you to create system you need! - 1-axis rate table for gyro testing - 2-axis unit for 6DOF accelerometer and gyroscope testing - 3-axis Gimbal system for simultaneus Yaw, Pitch and Roll stimulus.
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Operating Software for elowerk Test Systems
TestBuilder
elowerk TestBuilder is the operating software for elowerk test systems. TestBuilder is based on the Microsoft .Net Framework and runs on Windows Vista and Windows XP. Test programs can be created by CAD data import. The comfortable graphical user interface allows a straightforward editing of test programs. Customized applications can be programmed using a programming interface.
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Pilot H4 Next Automatic
The Pilot H4 Next series automatic version represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Electric Power System Characteristics Test
This test is also known as the power supply line voltage and frequency variations test. A few of the measured characteristics are: voltage and frequency modulation, voltage spike, and voltage transient recovery.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Automatic Calibration Module
ACM2543
ACM2543 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 44 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process.
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EMC Compliance Test Systems
ECTS2
Now in its second generation, the ADAPTIVE POWER EMC Compliance Test Systems use a greatly enhanced harmonics and flicker measurement system and newly designed flicker impedance options to support single and three phase AC harmonics, flicker and AC and DC immunity compliance testing up to the maximum required current of 75A per phase.
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HPA-64 General Purpose Probes
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
