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Tool for the Automated Analysis of Measured Data
TRACE-CHECK
Day-to-day testing of newly developed features produces large amounts of data that are never analyzed or used. Sporadic errors often remain undetected and problems relating to complex real-time behaviour are generally hard to identify. To resolve such issues, TraceTronic has designed the tool TRACE-CHECK. This software has been successfully applied in test automation environments,
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Software Composition Analysis
SCA
Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Spectrum Analysis For P50xxB Up To 14 GHz
S970903B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Trace Viewer (Software Application For Trace Analysis)
TraceViewer application provides you with a full range of options when analyzing traces (information on the condition of a fiber at any given point of its length, received from the optical time-domain reflectometer) - receiving, viewing, editing and labeling.
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Water Iron Analysis
Aztec AW633
The Aztec 600 colorimetric iron analyzer provides reliable and accurate measurement of iron concentrations to improve drinking water quality and optimize chemical usage.
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XRF analysis
X-Supreme8000
XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
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Circuit Breaker Analysis System
Weshine Electric Manufacturing Co., Ltd
1. Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
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CD Measurement and Advanced Film Analysis
FilmTek CD
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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PathWave BenchVue Advanced Power Control And Analysis For Multiple Instrument Connections
BV9200B
Control and analyze voltage and current measurements from multiple N6705C, N7900 or RP7900 Series
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*Structural Analysis
Guangzhou Amittari Instruments Co.Ltd
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Data Acquisition and Analysis Software
Magnifi®
Eddyfi® Magnifi® is a constantly evolving, integrated electromagnetic inspection data acquisition and analysis software. It boasts an intuitive graphical user interface (GUI) suited to modern devices, powerful reporting functions and data management, as well as simple inspection configurations.
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Terahertz Spectroscopy Solutions
STRIPP Control IM
Teratonics offers innovative solutions for contactless non-destructive testing and imaging inside dielectric materials and on coated metallic surfaces. Based on the patented technology and our profound know how on its application, we offer: ► Instruments for product and process control as well as for inspection with automated evaluation ► Laboratory services for industrial R&D, fatigue tests, maintenance, end of life studies
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PCIe Exerciser & PCIe LTSSM Exerciser with L1 Substate Analysis
U4305B
Supports 2.5 GT/s (Gen1), 5.0 GT/s (Gen2) and 8.0 GT/s (Gen3) speeds Link width support x1 through x16 lanes Standard PCIe half-size card form factor to fit into most platforms Emulate Root Complex (RC) or Add-In-Card (AIC)
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Automated Routine Analysis of Waters by Purge & Trap Concentration
AQUATek LVA
The AQUATek LVA is a full automation solution for routine analysis of waters by purge and trap concentration. It utilizes a fixed volume loop that is filled with liquid sample, internal and/or surrogate standards are added, and then the sample is transferred to the Lumin or Stratum PTC. Upon completion of the purge step by the concentrator, the AQUATek LVA then initiates a clean up cycle where the sample loop and concentrator sparger are cleaned with 90o C water via the two-stage water heater.
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Surface Form Analysis System
Tropel® FlatMaster®
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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DDR5 Protocol Debug And Analysis Solution
U4970A
The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Spectroscopy Fiber Probes
Spectroscopy probes for medical diagnostics and industrial process control, in volume production of fiber for medical and industrial lasers, for different fiber bundles, etc.
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Complete Power Analysis System
PK3564
PK3564 complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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Spectroscopy Upgrade for Any Microscope
SMS
Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
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Spectrophotometers, Laboratory And Analysis Systems
Instruments, accessories and calibration standards for in-situ and ex-situ optical transmission, reflection, absorption, and photoluminescence measurements
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Refinery Gas Analysis
Gas compositions produced in refinery plants consist of hydrocarbons, permanent gases, H2S, etc. Analyzing these gases is essential to control the quality of chemical products and plant operation. Shimadzu's RGA systems, available in numerous configurations, are designed to analyze various compositions in a variety of processes. In research and development for petrochemical and its catalysis field, target compounds often contain high-boiling point compounds and isomers. The Shimadzu CERGA makes it possible to precisely analyze those samples.
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High Resolution Frequency Response Analysis (FRA) System
TR-AS FRA
The Frequency Response Analysis (FRA) on power transformers is used for diagnosis at works, after putting into operation and for maintenance on site. The frequency dependent admittance is determined and recorded as fingerprint.
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Removable Hard Drive for 16902B Modular Logic Analysis System
E5863A
The Keysight E5863A additional removable hard drive for the 16902B modular logic analysis system enables you to have separate drives for project teams or to remove the logic analyzer from a secure area for use elsewhere. The 16902B comes with a built-in removable hard drive standard.
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Light Analysis
Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Circuit Breaker Analysis Systems
When a fault such as a short circuit or current overload is detected by a protective relay, a trip impulse is sent to the circuit breaker. The circuit breaker must function as specified and interrupt the current as soon as possible or severe damage may occur. The damage caused by a malfunctioning circuit breaker can often be catastrophic, resulting in significant damage to the electrical system.
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FTIR Analysis
Anton Paar offers state-of-the-art Fourier-transform infrared (FTIR) instrumentation with the possibility to automate and connect to other Anton Paar benchmark instruments. It combines FTIR spectroscopy with comprehensive data analysis to provide rapid results and increase efficiency in the laboratory. A high-resolution touchscreen with a user interface inspired by modern smartphones enables operators to conduct the most intuitive FTIR analysis available on the market. Anton Paar’s FTIR specialists and a worldwide service network are ready to support you with your spectroscopy applications.
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Visual Analysis of any Embedded System
SystemView
SEGGER Microcontroller GmbH & Co. KG
SEGGER is announcing the release of SystemView, a free tool enabling the visual analysis of any embedded system. SystemView gives complete insight into the behavior of a program, with minimal side effects on the observed embedded system. SystemView offers cycle accurate tracing of interrupts and task start stop as well as task activation and API calls when an RTOS is used. It visualizes and analyzes CPU load by task and interrupts and scheduler. Test setups with LED and oscilloscope are a thing of the past.
