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Product
MicroPhase I LRP - Dual Phase Voltage Detector / Phase Comparator
MP1-02P
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Hachmann Innovative Elektronik
MicroPhase I LRP is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. Thanks to the "LRP-switch" the threshold value can be lowered from 2,5 µA (HR, MR, LR and LRM) to 1,0 µA (LRP).
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Product
3GHz to 20GHz Microwave Mixer with Wideband DC to 6GHz I
LTC5552
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The LTC®5552 is a high performance, microwave double balanced passive mixer that can be used for frequency upconversion or downconversion. The device is similar to the LTC5553, but with a broadband, differential DC to 6GHz IF port. The LTC5552 is recommended for applications where the IF frequency range extends below 500MHz. For applications where the IF frequency is always above 500MHz, the LTC5553 is recommended, since it includes an integrated IF balun.
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Product
Parallel systems
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Did you know you can couple several Gill AC, Gill 12 and Weld Testers together or any combination of Gill AC, Gill 12 or Weld Tester, to give you a parallel logging multiple Potentiostat / Galvanostat / ZRA / FRA system, capable of recording from each working electrode at up to 60 readings per second. Coupling several Gill ACs or Gill 12s together gives the added abilities of the Weld tester and the ability to perform fast sweeps. Using our latest software, it has never been easier to couple instruments together to provide a Parallel System. In fact up to 32 instruments can be controlled at the same time. These instruments can either have individually enclosures or be rack mounted.
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Product
Intel® 8th & 9th Gen. Core™ I Mini-ITX Motherboard
PPC-MB-610
Motherboard
Supports Intel® 8th & 9th Gen Core™ i processor (LGA1151) with Intel Q370 chipsetTwo 260-pin SO-DIMM up to 32GB DDR4 2666 MHz SDRAMSupports triple display of DP/VGA/LVDSSupports PCIe x16 (Gen 3), 1 M.2 M key & 1 M.2 E key, 6 x USB 3.1Supports 2 x SATA 3.0 (Raid 0, 1)Supports TPM 2.0 (optional)Supports 4 RS-232,1 RS-232/422/485Supports 1 GPIO(8 channels)
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Product
Parallel Active Multifunction Filter
SINAF 3.0
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Lifasa - International Capacitors, SA
The active filters offer the best possible solution to solve the problems related to the quality in the electrical network, both in industrial three-phase installations, as commercial or service installations. These problems are caused, not only by the harmonics, but also by the consumption of reactive power (generally of capacitive type).
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Product
Parallel Interface Voltage Output D/A Converters
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Analog Devices offers a large portfolio of parallel interface voltage output D/A converters (DACs). We provide precision, fast settling, rail-to-rail micropower VOUT D/A converters, with resolutions of 8 bits up to 16 bits, single-channel to 40-channel density, and a unipolar or bipolar supply. These devices are used in a wide variety of applications such as process control, automotive test equipment, or digital gain and offset adjustment.
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Product
Dual-Mode Stereo Audio Processor i
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Digital & analog audio processing for airchain, general overload protection & production. From simple audio level control and peak limiting to signature AM/FM “On Air” sound, Inovonics processors make managing your audio easy and trouble free.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Parallel Seam Sealers
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It is an equipment to hermetically seal the packages, such as the crystal and SAW devices, optical devices, sensors, MEMS, etc., by seam welding. Hermetic sealing can be accomplished in both N2 and vacuum environment. Furthermore, we are offering a variety of products for research and development and production applications.
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Product
Parallel Test Systems
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Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Product
Mark I Single Setpoint Monitor
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The Mark I is a self-contained unit featuring a single set point control. A simple two-step adjustment permits detection of an overspeed and/or underspeed condition at either 10% or 25% of operating RPM.
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Product
MCB Thermal Trip Calibration Test Bench (IEC 60898 Cl 9.10.1.2, Annex I.1, IS)
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The test system is designed and customized to carry out 2.55*Intest as per Table 7 (test c) of IEC 60898 (also mentioned for routine testing of MCBs. The test is done at dc current to exactly analyze and correct the bimetallic properties of the MCB as far as thermal tripping is concerned. The unit comes with a pneumatically operated test fixture with in-built dc stepper motor that is controlled by a micro controller / PC to calibrate the breaker into a narrow tripping band programmed by the user.
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Product
Parallel NTDS Isolation Tap Box
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IXI’S NTDS parallel isolation tap box is the ideal solution for relibility tapping NTDS parallel type A, B, C, and H interfaces. It connects easily to existing cables forming a tee connection that can be used for data monitoring and acquisition over long distances without interference with your system.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
Compact Fanless System With 10th Gen Intel® Xeon®/Core™ I CPU Socket (LGA 1200)
MIC-770 V2
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Intel® 10th Gen Xeon®/Core™ i CPU socket-type (LGA1200) with Intel® W480E/H420E chipsetWide operating temperature (-10 ~ 60 °C), 9 ~ 36 VDC input power range2 x GigaLAN, 2 x USB 3.2 (Gen2) and 6 x USB 3.2 (Gen1)2 x RS-232/422/485 and 4 x RS232 serial ports (Optional)1 x 2.5" HDD/SSD, and 1 x mSATASupports Advantech i-Modules, FlexIO and iDoor technology, flexible configure additional HDMI, DVI, Comport, DIO, Remote switch IOVGA and HDMI™ output (The terms HDMI, HDMI High-Definition Multimedia Interface, HDMI trade dress and the HDMI Logos are trademarks or registered trademarks of HDMI Licensing Administrator, Inc.)Microsoft Azure PnP, AWS IoT Greengrass, Ubuntu CertifiedRED Compliance
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Intel® 6th/7th Generation Core I Desktop Compact Fanless System
MIC-7700
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Intel® 6th/7th Generation Core i Desktop CPU (LGA1151) with Q170/H110 chipset2 x RS-232/422/485 and 4 x RS232 serial ports (with expansion cable)1 x 2.5" HDD, 1 x CFast, 1x mSATA and 1 mini-PCIe with SIMSupports 2 LAN, Isolation COM, 32-bit GPIO modules2 x GigaLAN and 8 x USB 3.0VGA and DVI outputSupports Advantech’s i-module, SUSIAccess, and embedded software APIs9 ~ 36 V DC input power rangeWide operating temperature
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Product
Parallel Robots
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The Omron Quattro robot excels at high-speed applications in packaging, manufacturing, assembly, and material handling.
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Product
Compact Fanless System With 8th/9th Gen Intel® Core™ I CPU Socket (LGA 1151)
MIC-770
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Intel® 8th/9th Gen Core™ i CPU socket-type (LGA1151) with Intel® Q370/H310 chipsetWide operating temperature (-10 ~ 50 °C), 9 ~ 36 VDC input power range2 x GigaLAN, 2 x USB 3.1 and 6 x USB 3.02 x RS-232/422/485 and 4 x RS232 serial ports (Optional)1 x 2.5" HDD/SSD, and 1 x mSATASupports 2 x LAN, isolation COMs, and 32-bit GPIO modulesSupports Advantech i-ModulesSupports Advantech SUSIAccess and embedded software APIsVGA and HDMI™ output (The terms HDMI, HDMI High-Definition Multimedia Interface, HDMI trade dress and the HDMI Logos are trademarks or registered trademarks of HDMI Licensing Administrator, Inc.)
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Product
Holographic Concave Gratings - Type I
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type I holographic concave gratings are recorded on spherical substrates, with equidistant and parallel grooves.Their geometric optical properties are the same as classically ruled gratings and are interchangeable with them.When used in a spectrograph, Type I holographic concave gratings are traditionally arranged on the Rowland circle (i.e., the circle defined by the grating center and the tangential radius of curvature of the grating).
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Product
Massively Parallel Board Test System
I7090
In-Circuit Test System
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 230gf
K100-I126230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 230gf, Steel with Gold Plating.
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Product
"Soft Grid" and Parallel Operation AC Generator Excitation Regulator
svrsp
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The Kinetics model SVRSP Exciter/Regulator rectifier is designed and rated in capacity and operating parameters for the application of exciting the DC fields on an AC generator operating in parallel with other AC generators and the power system is a "soft system" in relation to loading. A "soft system" is a generating system that may not be able to sustain the rated AC voltage under impulse/step loading conditions and results in voltage reduction when tan impulse/step load is applied.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Intel® 8th/9th Generation Core I 2U Fan System
EPC-P3066
Embedded PC
Intel® 8th/ 9th Gen Core™ i processor (LGA1151) with Intel C246/H310Up to 4 x extension Card by Riser Card (Optional)3 x GigaLAN and upto 8 x USB3.02 x RS-232/422/485 and 4 x RS232 serial ports, 16 bit GPIO4 x SATA (max), 1 x M.2 E key, 1 x M.2 B/M key, 2 x F/S mSATAVGA+HDMI or 2 x HDMI output (Optional)12~24V DC input power rangeSupport Advantech I Door moduleSupport SUSI, WISE-DeviceOn and Edge AI Suite
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
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Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
