-
product
Recording System
Surveyor DFR DDR
The Surveyor Recording System is a DFR/DDR with local Input Modules connected to a Controller. The Input Modules are connected to the Controller by multiconductor cables. The Controller contains a single board computer running 64-bit Microsoft Windows 10® and the E-MAX Director program, for recording, storing and transferring data.
-
product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
-
product
Test System
USB Explorer 280
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
-
product
Engineering/Development System
ULTRA L
The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
-
product
Lithography System
JetStep S3500
The JetStep S3500 panel lithography system is designed specifically for advanced packaging panel production. The system incorporates advanced features that address requirements for panel-level packaging, such as die shift due to placement accuracy or subsequent processing steps, CTE mismatch, panel warpage and panel handling.
-
product
Optical Systems
Optical systems like optical objectives or oculars are a crucial block of modern electro-optical systems. Performance of these systems is often limited by parameters of optical block. Superior optics can significantly increase surveillance ranges of electro-optical surveillance systems like thermal imagers, VIS-NIR cameras, SWIR cameras, and night vision devices. Optical systems in form of optical sights are also used as independent systems in surveillance technology.
-
product
NIR Systems
NIR spectroscopy is a proven analytical method guaranteeing reliable and efficient process monitoring and control in a wide range of process applications.
-
product
LXI Dual 24 X 8 Video Matrix
60-710-721
The 60-710 is a Dual 24 x 8 Video Matrix Module suitable for switching frequencies up to 25MHz. It has an impedance of 75Ω implemented using 50Ω SMB connectors. It is designed to provide a simple and scalable bidirectional matrix for video frequencies and is intended for the easy construction of high performance bidirectional matrix switching systems.
-
product
Thermosel System
The difficulty with viscosity measurements of hot melts and liquids at elevated temperatures has been in maintaining accurate temperature control that is consistent from sample to sample so that meaningful data could be obtained. The Brookfield Thermosel solves this problem by providing a stable, precisely controlled sample environment. This, together with the inherent accuracy of the Brookfield Viscometers, is fundamental to the Thermosel System, which produces viscosity measurements that are not only accurate but entirely reproducible.
-
product
GENERAL INSPECTION MACHINE AFTER SOLDER MASK
DVI is a technology of automated optical inspection, which can inspect deep to the difference from semi-transparent layers or semi-reflective layers.
-
product
System Solutions
Diamond offers a range of off-the-shelf and ready-to-build computer and ethernet switch systems that feature great flexibility and expansion capability. Our systems include industrial grade and rugged / Military grade products. Due to the wide range of configuration options, please contact your local Diamond salesperson for specific ordering information and part numbers.
-
product
Portable gear inspection- and 3D-measuring systems
ultimate independent measurement - on the production machine or on the shop-floor without rotary table
-
product
VME Data Acquistion System
ADM-31
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.
-
product
GPS Systems
High accuracy 100Hz GPS with Real-time Kinematics (RTK) correction for the most precise position-based test and measurement applications.
-
product
SIMRC - 16 x Uncommitted Reed Relay, SPDT
1010-R-16-1-5/3D
Our small format embedded switching (SIM relay) cards offer a choice of switching configurations using low cost industry standard SIM connectors. They free the designer from the detail of routing complex switching circuits, you may select from a wide range of cards using the built in RS-232 and I2C interfaces. These low-cost embedded switching cards are intended to be mounted on to a simple motherboard. They may be used to construct very high density switching networks. SIM based switching cards also allow for very simple in-field maintenance.
-
-
product
Metrology & Inspection Systems
Our optical and e-beam wafer metrology and inspection products quickly and accurately measure pattern quality before and during high-volume chip manufacturing.
-
product
Scanning & Inspection
API’s offers a range of portable measuring and laser scanning solutions together with robot or tripod mounted 3D structured light scanner.
-
product
PXI 4 x Changeover Switch 2.5GHz, 50 SMB
40-710-514
This RF switching card has a bank of four individual high performance RF changeover switches (50 or 75 Ohm, Bi-directional) with very low insertion loss, suitable for handling signals up to 2.5GHz. Applications include aerial switching, routing high frequency signals into oscilloscopes and analyzers.
-
product
Defeat Systems
Security Intelligence Technologies, Inc.
In order to help control voice privacy, we offer Defeat Systems. Confidential personal and business information can only stay confidential if no one else has access to them. Defeat systems fight electronic eavesdropping equipment that can compromise conversation security.
-
product
Thickness and Flaw Inspection
OmniScan MX ECA/ECT
With thousands of units being used throughout the world, the OmniScan® MX is a field-proven, reliable instrument that is built to withstand harsh and demanding inspection conditions. Compact and lightweight, its two Li-ion batteries provide up to 6 hours of manual or semi-automated inspection time.
-
product
Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
-
product
Reel to Reel Non-Contact OS Inspection System for TAB/COD/TCP/TBGA
TRV
*Most suitable mechanism for non-contact inspection*Sprochet-less transfer decreases products damage.*Easy operation by Fixture alignment mechanism*Equipped with Tracing Test function
-
product
Exposure Systems
Model 2000AF & 2000SM
The OAI Model 2000 Exposure Systems may be configured as either an edge-bead exposure system (2000SM) or a flood exposure system (2000AF); both configurations are based on OAI’s proven, time-tested platform.
-
product
MBE systems
GEN Family
Veeco provides the industry’s broadest line-up of innovative and reliable molecular beam epitaxy (MBE) systems.
-
product
Measurement System
BLS-I/BCT-400
The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
-
product
Wafer & Die Inspection
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
-
product
Sensing System
DAS
Our Distributed Acoustic Sensor(DAS) with excellent pattern recognition software can detect and locate the distributed thousanfs of acoustic events. Whenever any vibration or sound around its sensing fiber is detected, our DAS system will process the measured data in real-time and its pattern recognition software will recognize the types of the events, such as digging, pipeline leakage, fence breach, vehicle moving person walking. And, the detected events are reported to the alarm server to help operators take actions to protect theor facilities.
-
product
X-Ray Inspection System
TruView™ Cube
The Perfect Solution for a Powerful Small Form Factor X-ray Inspection System. The all new TruView™ Cube X-Ray Inspection System is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. Ideal for applications where space is premium, the the TruView™ Cube X-Ray sits comfortably on your laboratory bench.
-
product
Measurement Systems
MicroMeasure3D
Sciences et Techniques Industrielles de la Lumière
STIL MicroMeasure3D, PORTICO3D and MAESTRO3D are measurement systems designed to achieve true 3D metrology of each point for the most demanding applications adapted to Industry 4.0 standards.
