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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
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Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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PNA Microwave Network Analyzer
N5225B
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Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Keysight Streamline USB Vector Network Analyzer, 20 GHz
P9374A
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Compact, faceless, USB vector network analyzer (VNA). Affordable full two-port VNA which dramatically reduces your size of test. Up to 20 GHz.
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Product
LANTRACKER
PH-100/120
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The Lantracker is a network tester, pin-by-pin cable tester, and tone generator all in one. As a network tester, it detects whether a network is active or inactive and displays network speed (10/100/1000 Mbps) in either case. It also flashes the network hub or NIC’s port light corresponding to the cable it is connected to, to show the cable’s port number. As a cable tester, it performs loop-back or remote tests of network, data, voice, and coaxial cables, displaying the results on a pin-by-pin LED display which moves from pin to pin automatically or manually. The Lantracker can be used to test cable or shield integrity, testing network function and speed, and tracing cable using its tone generator function (tone probe not included). Includes an adaptor for testing coaxial-F cable. Uses 1 9V battery.
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Tiny Network Appliance With Intel® Celeron® J3355/J3455 For Entry Level SD-WAN And Security Gateway. Ideal For SD-WAN Deployments.
FWA-T011
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Tiny Network Appliance with Intel® Celeron® J3355/J3455Up to 4 x GbE RJ-45 ports4G LTE and Wi-Fi supported (optional)Optional TPM 2.0 or non-TPM supported by requestTiny and fan-less design supported by optional wall/ VESA/ DIN-rail mounting kit
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ENA-X Vector Network Analyzer
E5081A
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Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Coupling/Decoupling Network
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Suzhou 3ctest Electronic Co.,Ltd.
coupling/decoupling network is to test the capacity of high speed communication line for surge test. Data transmission rate is up to 1,000MBit/s. It is designed to meet the requirements of figure 14 in IEC/EN 61000-4-5: 2005. The material of decoupling device is high conductive magnetic material. Stable decoupling capacity and transmission rate, easy to use and compact size.
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VLSI Test System
3380D
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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PXIe-5633, 26.5 GHz PXI Vector Network Analyzer
788182-26
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The PXIe-5633 is a single-slot PXIe Vector Network Analyzer (VNA) that helps you streamline your production test applications. This VNA supports automatic and manual precision calibration, full vector analysis, de-embedding, and pulsed S-parameter capabilities, making it ideal for validation and production operations without the high costs and large footprints associated with traditional benchtop VNAs. The PXIe-5633 also integrates into NI RFmx and Instrument Studio software to provide automated control for test program development. Additionally, the PXIe-5633 features a hardware pass-through path that you can use for PXI Vector Signal Transceivers (VSTs) testing directly at the VNA ports. With combined modulated and S-parameter measurements on a single connection, you can cover both VST and VNA tests on a single device.
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Automated Compliance and Device Characterization Tests
N5990A
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The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Wireless Protocol Analysis
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GL's protocol analyzer provides monitoring a communication link in accordance with industry protocol standards by non-intrusively tapping the network under test. The simple framework of the protocol analysis software helps you easily identify the improper sequence of protocol messages, and filter out frames causing the protocol violation.
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Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Tabletop Single Site Test Handler
3111
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The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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200 Vdc External Voltage Bias Fixture
16065A
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Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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IP Networking
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We are the industry leader in IP Networking testing. We have a strong and wide-reaching industry reputation and participates in many industry organizations including the IETF, the IPv6 Forum, Open Networking Foundation and NetSecOPEN.
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Streamline Vector Network Analyzer, 9 KHz To 20 GHz, 2-port
P5004B
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Compact, faceless, vector network analyzer (VNA). Flexible two-port VNA dramatically reduces your size of test. Up to 20 GHz.
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6TL29 Semi-Automated Test Platform
AQ377
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- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Standardize Production Test Software For PCBAs And Electronic Devices
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The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
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The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Rackmount Network Appliance With Dual AMD EPYC™ 9004 Processors For Gateway And NGFW. Ideal For High-Performance Network Security.
FWA-6183
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Dual AMD EPYC™ 9004 Processors, up to 256 Cores16 x DDR5 ECC RDIMM slotsHot-swap 2.5" disk bays and system fan, redundant PSU, 1 x HH/HL Gen5 PCIe x16 slotIntegrated security features with secure boot, memory encryption, virtualization, and multi-key encryptionIPMI v2.0 compliant, with web interface8 x Advantech network module expansions w/ PCIe Gen5 bandwidth
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8 Ports 1GbE Fiber Module
NMC-0804
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Ideal for multi-segment network deployments and fiber-based networking. 2 x Intel® i350_AM4, 8 x SFP slots, 2 x PCIe x4, Gen2, RoHS compliant.
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Product
ATE Self Test Fixtures
AL663
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AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
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The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
PNA Microwave Network Analyzer
N5224B
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Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start





























