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Product
Semiconductor Test Software
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Radisys Management System
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The Radisys Management System is a carrier-grade management solution built to scale as your network evolves while maintaining high-performance levels.
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Product
CATR Benchtop Antenna Test System
ATS800B
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Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
PXI Platform Completion Hardware
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PXI Platform Completion Hardware enhances your PXI test systems. These products can monitor the health of a chassis, improve device synchronization, share data between systems, add data storage, and more.
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Product
PXI & PXIe Controllers
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We offer you a choice of PXI controller options: embedded and remote. Embedded controllers have all the necessary components to operate your PXI system independently without needing an external PC. Remote controllers, on the other hand, allow you to control your PXI system from desktops, laptops, or server computers.
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Product
USB2.0 Module With 2 CAN Bus Nodes ARINC825 Compliant For Testing & Simulation of Avionic ARINC825/CAN Bus Systems
APU825-2
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USB2.0 module with 2 CAN bus nodes ARINC825 compliant for testing and simulation of Avionic ARINC825/CAN bus systems.
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Product
Mezzanine System
5089
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The 5089 provides eight channels of 12 bit A/D conversion using the Analog Devices AD7328, and is suitable for medium resolution medium speed applications.
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Product
Benchtop Communication Test System
ATS3000A
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The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
PXIe8862, 2.6 GHz 8-Core PXI Controller
790660-01
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The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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Product
PXI Ethernet Interface Module
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The PXI Ethernet Interface Module equips PXI systems with high-bandwidth Ethernet-based connectivity with up to 40 Gb/s data rates per port. Featuring compatibility with industry-standard network and automatic cable polarity detection, this module is ideal for high-performance data transfer and vision applications on the PXI platform. Additionally, the PXI Ethernet Interface Module has independent bandwidth to support up to four GigE Vision cameras without PoE.
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Product
Mezzanine System
5181 MMS ECM
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ECM P/N 5181 uses TI TLV320AIC23 high resolution audio codecs to provide two channels of Audio input and two channels of Audio output. Each input channel consists of two inputs a left and a right, and each output channel consists of two outputs left and right. The outputs are muteable.
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Product
Test System
UltraFLEX
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The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
PXIe8862, 2.6 GHz 8-Core PXI Controller
790659-33
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The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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Product
Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
COTS Systems
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Pre-integrated to save you time and money, pre-validated systems proved an optimum computing platform for mission applications.
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Product
PXI 8x8 Matrix Module, 2-Pole 2A,60W
40-516-002
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The 40-515/516/517 2 Amp, 2-Pole Matrix Modules form part of the System 40 PXI ProgrammableSwitching system. Each module consists of a matrix of 64 2-pole electro-mechanicalrelays under the control of a PXI/PCI interface.These modules are designed for switching medium voltage/power signals in test applicationswhere reed relays do not have sufficient rating. They are also suitable for telecomsapplications where send and return signals need to be switched simultaneously.
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Product
Combination Board Tester
ATE QT2256-640 PXI
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Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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Product
PXI 8 Slot 3U
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Comtel PXI Backplanes 8 Slot 3U. A number of versions are available that cover a wide range of needs. If you have a requirement for PXI Backplanes and/or Systems, please contact Comtel for further information.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
PXIe-8822 2.4 GHz Quad-Core Processor PXI Controller
788815-0118
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The PXIe8822 is an Intel Core i3based embedded controller for PXI systems. You can use the PXI-8822 to create a compact or portable PC-based platform for industrial control, data acquisition, and test and measurement applications. This PXI Controller includes a 10/100/1000/2500 BASET Gigabit Ethernet port, two HiSpeed USB ports, two USB 3.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O.
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Product
PXIe-8822 2.4 GHz Quad-Core Processor PXI Controller
788815-01
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The PXIe8822 is an Intel Core i3based embedded controller for PXI systems. You can use the PXI-8822 to create a compact or portable PC-based platform for industrial control, data acquisition, and test and measurement applications. This PXI Controller includes a 10/100/1000/2500 BASET Gigabit Ethernet port, two HiSpeed USB ports, two USB 3.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
VPX Development System
VPX370 3U
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The VPX370 is a second generation VPX development platform that delivers, performance, flexibility, and scalability all in a compact 3U VPX form factor.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
PXIe Single Slot Gen III Embedded-Controller
PXIe-504
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The PXIe-504 is a 3U single slot PXI Express System Module which acts as an embedded computer for the PXI Express platform. It features an Intel Core I5 Processor in combination with a NVMe SSD and DDR4 RAM. In combination with an ABex / PXIe Chassis it results in a complete computer system.To interact with other devices and the user, it has multiple IO interfaces like DisplayPort, Gigabit Ethernet and USB 3.0 Ports.As a System Module it has a six-lane connection to the PXIe Backplane.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
