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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Benchtop Communication Test System
ATS3000A
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The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Liquid Test Fixture
16452A
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The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
Low-Barrier Schottky Diode Detector, 10 MHz to 18 GHz
8472B
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The Keysight 8472B Low-Barrier Schottky Diode (LBSD) detector has been widely used for many years in a variety of applications including leveling and power sensing. It offers good performance and ruggedness. Matched pairs (Option 001) offer very good detector tracking. A video load (Option 002) extends the square-law region to at least 0.1 mW (-10 dBm).
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Product
Test System
UltraFLEX
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The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
Laser Diodes
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ProPhotonix distributes Ushio ex OCLARO /Opnext, Osram, Panasonic, Sony, QSI and Ondax semiconductor laser diode products. Within this range we offer laser diodes with wide ranges of wavelengths and power outputs that suit the diverse needs of our customers.
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
Laser Diode Testing
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The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.
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Product
Laser Diode Modules
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Fiber-coupled laser diodes are finding more and more industrial applications, for example in printing technology, comparable graphic areas, material processing or sensor technology.
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
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Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
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The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
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80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Test Port Cable, 1 Mm
11500K
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Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
2.5G DFB Laser Diode Chips
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Guilin GLsun Science and Tech Group Co., LTD
2.5G DFB Laser Diode Chips by GLSN
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Product
Laser Source Simulator
MT1888 Series
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The MT1888 products are state-of-the-art Laser Source/Spot Simulators (LSS) used for the testing of laser guided munitions such as the Hellfire & Hellfire II missiles, Paveway, and the AGM-65E Laser Maverick missile.
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Product
USHIO Red Laser Diodes (633nm - 690nm)
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The Optoelectronics Company Ltd
Features: 5.6 mm CAN package, Optical output power: 80 mW (CW), 300 mW (pulsed – pulse width: 10 ns, duty: 10%), Lasing wavelength: 658 nm, Wall-plug efficiency*: 33%, Operating temperature: -10° – +60° C (CW); -10° – +75° C (pulsed), Single transverse mode, TE mode oscillation, MTTF >10,000 hours
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Product
TVS Diodes
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Power TVS diodes provide outstanding protection for both alternating current and direct current power line applications by a Power TVS diode in a surface mount package. When compared to other devices, such as MOVs, power TVS diodes provide much better protection. Bourns provides a broad voltage range of devices with surge current ratings ranging from 3, 6, 10, and 15 kA to suit a variety of applications.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Bottom Electrode SMD Test Fixture
16197A
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The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Laser Diode Driver
S-101
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LD Driver slot module of FOTS system is an efficient module that is user centered, which can drive various kinds of laser diode for the use of optical signal transmission or light source. The module has a built in LD socket, in which LD of 14 pin butterfly type is installed, which makes it possible for the user to change the LD he or she wants to drive when needed. It is leaded to get rid of the inefficiency of expense, at which various types of expensive united source module needed are purchased. By operating monitoring PD and high-performance processor that are installed inside the module, the output power and temperature of LD can be driven accurately and stably. The laser diodes can be modulated internally in square, sinusoidal, and triangular waves and its output power and temperature can also be maintained the level set by the user. In order to realize the various functions, the efficient and multi-functioned control programs with high speed processor, LCD monitor or GUI for remote control are available.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
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The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Laser Diode Drivers
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Renesas offers a portfolio of laser diode driver (LDD) ICs for DVD/CD/Blue-ray optical drive and laser projection applications.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
