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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Test Handler
M4841
Test Handler
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
ARINC 818 Analyser
Protocol Analyzer
iWave’s ARINC 818 Video Protocol Analyzer (VPA) instantly verifies the ADVB Packets against ARINC818 Standards. ARINC818 VPA software efficiently captures, decodes the ADVB data, and displays the ADVB data, raw video data, and error status. It is an excellent troubleshooting tool that helps to quickly detect and rectify errors in the ARINC 818-2 applications, simultaneously ensuring compliance of the system with the ARINC 818-2 standards.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
ARINC interface
RAR-EC
Interface
Available in a range of configurations to match your needs, the 11 channel RAR-EC provides complete, integrated databus functionality for ARINC 429, ARINC 575 and selected 2-wire, 32-bit protocols, for an ExpressCard interface. The RAR-EC supports maximum data throughput on all channels while providing onboard message scheduling, label filtering, multiple buffering options, time-tagging, error detection and four avionics-level I/O discretes.
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Product
ARINC Protocols
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Abaco's ARINC solutions provide feature-rich functionality and a high degree of flexibility combined with a user-friendly design and graphical application support.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
FPD Tester Model
27014
Test Platform
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
3U cPCI 8 Channel ARINC 429 Module
DP-cPCI-4296
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DP-cPCI-4296 board features cPCI based eight channels ARINC429 protocol interface. As part of the cPCI family, the DP-cPCI-4296 board is fully compliant with compactPCI® specification 2.0 R3.0. and CompactPCI® Hot Swap Specification 2.1 R1.0.
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Product
ARINC 818 Monitor
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ARINC 818 Monitor is a rugged display module, powered by High-Performance FPGA to accept various ARINC 818 line rates up to FC 4x and display the converted video data on the monitor of various ICD Specification with very low latency. It supports any progressive video up to Full HD @60fps. These monitors empower pilots to organize and visualize the key information they need.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
VXI Digital Test Instrument
T940 Series
Test Instrument
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Product
ARINC 818 to DVI Converter
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The ARINC 818 to DVI converter is a rugged standalone module available in 6U cPCI form factor used for ARINC 818 to DVI conversion, DVI to ARINC818 conversion, ARINC 818 Mux as well as ARINC 818 Duplicator either on front panel or via cPCI back panel. It is a video Converter module designed with Cyclone V GT FPGA, using Analog device Video Encoder, and Decoder to provide video interfacing requirements.
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
AFDX ® / ARINC 664 Test And Simulation PMC Module
PMC-664
PMC Module
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Standard Ethernet processes simultaneous to AFDX® / ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applications*Windows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)Easy to use tool for configuring A*FDX® / ARINC 664 end systems (XML based)
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Product
ARINC PCI Interface Card
PCI-A429
Interface Card
Alta Data Technologies’ PCI-A429 interface module offers a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
ARINC 664 Part 7 Test & Simulation Interface for PCI
PCI-C664-V2
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Avionics Interface Technologies
Supports IEEE 802.3 10/100/1000 Mbit/s Full-Duplex Ethernet links - Utilizes SFPs to support both copper and optical interfacesSimulates multiple ARINC 664 End Systems - VL traffic shaping and input VL redundancy management - Supports up to 4K Output VLs and 4K Input VLs - Supports up to 16K Sampling & Queuing output message ports and up to 16K input Sampling & Queuing message ports - ARINC 653, UDP, IP protocols managed onboard - IRIG-B time code encoder/decoder - Automatic message sequencing & periodic data generated onboardError Injection including Runt Frames, Short IFG, and Invalid MAC FCS - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
