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Product
Universal LightProbe S2 Sensors
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Optomistic Products’ Universal LightProbe S2 Sensors are designed for the In-circuit, Functional or Finished Product test of an LED’s color and/or intensity. Implemented in a unique and customizable 2-Part solution, the S2 Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.
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Product
S2 Spectra USB Sensors
ULP S2 SPECTRA USB
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Universal LightProbe S2 Spectra USB Sensors test a wide range of LED intensities and any color in the visual spectrum, plus white, providing a linear response with a serial digital output via a PC. A standard USB Cable is provided to connect to a mini-type B five-pin USB connector, which is integrated into the S2 Spectra USB Sensor.Operating temperature range: 0oC to 70oCOutput Port: A standard mini-type B five-pin USB connector is integrated into the S2 Spectra USB Sensor,and a standard USB Cable is provided to connect to a USB portSensor Size: 0.560 in. dia x 1.38 in. long.Typical response time: < 10mS for color and intensity as a serial bit- stream (19200 baud rate)Fiber-Optic Probes: Can be paired with any of a wide range Universal LightProbe Fiber-Optic Probes
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Product
S2 Penta High-Sensitivity Sensors
ULP S2 PCI/V HS
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The Universal LightProbe S2 Penta High Sensitivity Sensor features the same popular built-in color binning as the regular S2 Penta Sensor, and is designed test extremely dim LEDs, providing an analog output for intensity, ranging from 0 to 4 volts, corresponding to the LED’s luminous intensity in millicandelas. Implemented in a unique and customizable 2-Part solution, the S2 Penta High Sensitivity Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longTypical response times: <1.2s color & intensity outputs simultaneously (the brighter the LED, the shorter theresponse time)Fiber-Optic Probes: Wide Aperture Fiber-Optic Probe recommended
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Product
S2 Spectra Sensors
ULP-S2 WBI/V
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The ULP S2 Spectra Sensor tests for LED intensity, and for any color in the visual spectrum, plus white. The S2 Spectra Sensor is well-suited for the test of “boundary” color LEDs, as it can unambiguously and repeatedly distinguish between not only adjacent visual colors such as green and yellow, but it can determine different hues of the same color such as yellow and amber, regardless of LED intensity. Implemented in a unique and customizable 2-Part solution, the S2 Spectra Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Output Loads: ‘Int.’& ‘Color’- 2Kohms min., 100pF max.Sensor Size: 0.560 in. dia x 1.38 in. long.Typical response time: Typical response time: <10mS capture time; <100mS overall response timefor color and intensity simultaneouslyFiber-Optic Probes: Can be paired with any Universal LightProbe Fiber-Optic Probe
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
POF Ext Ø 1,5mm 600mm, from 5mm Lens to VPC ITA Contact
YAV90CLR10
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The probes for sensing LEDs, P/N YAV90CR10 feature an Optical Head to correct missalignment errors in X and Y axis. As a result, the relative read out will oscillate less tan 5% with a missaligment of + 0,5 mm Offset
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
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The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
S2 Blinx Digital Sensors
ULP-S2 BLINX
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The Universal LightProbe S2 Blinx Digital is designed for the simple ON/OFF test of any color blinking or steady-state LED, for fast results with a digital output. The Universal LightProbe S2 Blinx Digital Sensors check the ON/OFF status of any color LED, whether stable or blinking/pulsed, up to a rate of 15 Hz, and provide a Logic “1” output (5 volts) only if the LED is “ON” and a Logic “0” if the LED is “OFF.”Operating temperature range: 0oC to 70oCPower consumption: Operates from +5, 12, 24 or 28 volts D.C., at 6mA max.Voltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Load: 20mA max. (Source/Sink). Non-inductiveOutput Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longOperating Temperature Range: 0hC to 70hCTypical response times: <66mS, shorter for brighter LEDsFiber-Optic Probes: Wide Aperture Fiber-Optic Probe recomended
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Product
S2 Unicolor Sensors
ULP-S2 SCI/V
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The Universal LightProbe S2 Unicolor Sensor is designed for the intensity test of any single one of the five main LED colors (blue, green, yellow, orange, and red) plus white and Infrared (700nm to 1,000nm). Implemented in a unique and customizable 2-Part solution, the S2 Unicolor Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Loads: 20 mA max. Non-inductive.Output Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longOperating Temperature Range: 0hC to 70hCTypical response times:<10mS capture time; 65mS overall response time; intensity output of correct color only.Fiber-Optic Probes: Can utilize any Universal LightProbe Fiber-Optic Probe
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
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Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
SSD Test Systems
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Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Test System Replication/Build-to-Print
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Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Fixturing Kit
10744A
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The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
Advanced SoC Test System
3680
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The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
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Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
High Speed Test Bench
AT444
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AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
