Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
- InterWorking Labs, Inc.
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SilverCreek SNMP Tests
Set up in less than five minutes - Windows or LinuxCustomize tests via Wizards, Script Generators, and moreAutomate operation with unambiguous test resultsIntegrate with other test harnesses and test toolsIncludes conformance, compliance, vulnerability, robustness, stress, and performance testingInvestigate failures and quickly resolve them with powerful diagnostic and analysis tools
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Mobile Testing Power Supply(Microamp)
M8831
M8831 Power supply, a new generation of programmable linear power supply, are designed with high speed dynamic programming output(Voltage 0-30V, 1ms rising time), high current accuracy (0.001mA resolution) and low internal resistance, which can satisfy all the test requirements. The combination of bench-top and system features in these power supplies not only make it possible to option into other equipments, but also make it possible for users to edit program by panel keyboard, w...show more -
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Cable Test Instruments
Do you have systems that include a large number of coaxial devices? Our best-selling ATE product line includes a cable test instrument that automates the task of precision testing of coaxial devices. These series of cable test instruments include both a scalar and a vector model. They offer fast precision measurements in a rugged and small portable package. Programming options allow instant test set-up and measurement recall from a potential database of thousands of test devices. Using a user interface that includes clear instructions with picture prompts, anyone can successfully make precision microwave measurements with a simple click of a button.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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Triple Output Power Supply
U8030 Series
The Keysight U8030 Series variable DC power supply has a total output of 375 W—making this solution an ideal power source in the design and manufacturing of electronic devices. The U8030 Series power supplies feature an output sequencing capability for semiautomated tests. These power supplies enable you to generate output sequences with minimal programming skills. This solution features excellent load regulation and clean output noise for continued stability.
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100 High Speed Programmer
Commander Accelerator
The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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PXIe Digitizer: 100 MSa/s, 14 bit, 100 MHz
M3100A
The M3100A PXIe digitizer is ideal for general purpose digitizer automated test requirements. It offers high channel density with an advanced data acquisition systems (DAQ). The optional real-time sequencing, inter-module synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including angle of arrival (AoA), baseband electronics designs, wireless device manufacturing and multi-channel coherent signal acquisition.
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High-Performance LAN & USB JTAG Controller
NetUSB II™
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
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PXI Multifunction I/O Module
The PXI Multifunction I/O Module provides I/O with varying numbers of channels, sample rates, and output rates with precise timing, triggering, and synchronization between models. This module can be used for industry applications such as laboratory research, design verification test, and manufacturing test.The PXI Multifunction I/O Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Boundary Scan Test
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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LXI Switch and Control Instruments
L4400 Series
The Keysight L4400 Series of switches, digital input/output and analog output instruments offer the best tradeoff in size, functionality and test. They are standalone instruments that perform the same function as their companion 34980A-Series plug-in modules. They come with a fully operational programming interface including a web-page for easy control.
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Mobile Comm DC Source w/ Battery Emulation, DVM
66321D
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacture...show more -
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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PXIe Arbitrary Waveform Generator, 500 MSa/s, 16 bit, 200 MHz
M3201A
The M3201A PXIe arbitrary waveform generator is ideal for general purpose AWG automated test requirements. It offers high channel density with high-quality output with low phase noise. The optional real-time sequencing, intermodulation synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including envelope tracking (ET) and DPD (part of PA/FEM reference solution), MIMO, baseband electronics design, wireless device manufacturing, ATE, beamforming and other multi-channel coherent signal generation and multi-channel signal generation.
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PIC Instruction Set Simulators
Test developers create requirements-based tests written in the C programming language and the Verocel PICSIM is linked as a library. The program-under-test is loaded into the Verocel PICSIM and executed under the control of the test. Test developers can directly call functions in the software-under-test, monitor all memory accesses (reads andwrites), alter data fetched or stored dynamically, and collect structural coverage data during testing. The software-under-test need not be altered.
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RF Upconverters
SignalCore offers traditional multi-stage and single-stage RF upconverters, and Direct IQ modulators that feature low phase noise, high dynamic range, wide bandwidth, and continuous tuning. SignalCore RF upconverters are compact and built for mechanical robustness and ruggedness. Applications include various test and measurement applications such as those in point-to-point radio, wireless communication, ATE, and software-defined radio. All products are provided with a Graphical User Interface (GUI), driver, and API for easy programming control.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Automation Tool for the CMW Platform
CMWrun
The R&S®CMW is the leading multistandard UE testing platform used by network operators, test houses, handset vendors and chipset manufacturers worldwide. R&S®CMWrun automation software meets all requirements for executing remote control test sequences on the R&S®CMW for wireless equipment in R&D, quality assurance, production and service. The intuitive graphical user interface of the R&S®CMWrun sequencer software allows easy and straightforward test sequence configuration. No programming and code compilation are needed. At the end of the test, an easy-to-read test report of the limits, test results and verdict is generated.
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Test Adapter
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Lab Power Supplies
SYSKON Series
The analog interface is equipped with two programmable trigger inputs and three signal outputs, which can be linked to various device functions for indication, or for controlling external devices and an auxiliary power output. Beyond this, monitor outputs and control inputs for voltage and current setpoints are available as well. Sensing leads allow for auto-sensing operation at the power consumer. Strict menu-driven operation supports highly diverse programming functions. The device is transformed into a freely programmable test signal generator by means of an expanded sequence memory and extra functions.
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Electric Vehicle Supply Equipment ATS (EVSE ATS)
It is a customized system based on Chroma 8000 ATS specializing inverification of EV Supply Equipment (EVSE) and complying with SAE-J1772 in programming the test items for operation.
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PCB Test Fixtures
ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. maintenance, and manufacturing documentation, Gerber data.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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In-System Test Programming System
WriteNow
Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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Functional Test Fixtures
RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Software
PowerPro III
Chroma Systems Solutions, Inc.
PowerPro is a feature-rich, expandable automated test platform that gives you control without spending your valuable time programming and allowing you to get your product to market faster.
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Test Programming
Terotest offers a full test programming service for all of our Automatic Test Equipment. In many cases test programs can be generated from CAD data on the product or component under test, or from autolearn facilities within the test system. Such techniques maximise accuracy and test program fault coverage, and allow quick and easy test program generation.
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Operating Software for elowerk Test Systems
TestBuilder
elowerk TestBuilder is the operating software for elowerk test systems. TestBuilder is based on the Microsoft .Net Framework and runs on Windows Vista and Windows XP. Test programs can be created by CAD data import. The comfortable graphical user interface allows a straightforward editing of test programs. Customized applications can be programmed using a programming interface.
