Backplane Test
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Semiconductor Test Services
Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
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EOL Testing of Speed Sensors
Complete programming and end of measuring stations integrated in the assembly line for rotary electronic sensors with automatic sensor recognition.
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Test Bench For Circuit Breaker
SCR ELEKTRONIKS have developed Test Bench for Circuit Breaker to test 2, 5 & 10 at a time. Panel is provided with constant DC current source.
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14-slot ATX-supported PICMG Bus Passive Backplane
ATX6022/14
*1 PICMG, 4 PCI and 9 ISA*Compatible with AX61400, AX6145, and AX6156LE*Supports both AT and ATX power supply
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UAT Test Management
User Acceptance Testing is the final stage of the Software Development Life Cycle, which is conducted by the users. User Acceptance Testing is extremely important to determine whether the project is working fine as per the end user's point of view. The UAT test management process has to be done in an organized manner to reap maximum benefits from the process.
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METES - Meter Test Systems
Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Pack Testing
PEC offers a 600V-600A and a 1000V-500A system with either 1 or 2 channels. The systems are programmable using the standard PEC LifeTest application, offering a user-friendly environment for configuring and analyzing drive cycles and other energy storage simulations.
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Flying Probe Test System
A8a
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Diagnostic Test Tool
BIRST™ (Built-In Relay Self-Test)
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Compact EMC Test System
Multi-CE5
The Multi-CE5 includes an Electrical Fast Transient Generator (EFTG), a Combination Wave Generator (CWG) and a Coupling-/Decoupling Network (CDN) for single-phase power supply lines. The software program CE-REMOTE allows full remote control of the test generator via Ethernet light guide as well as recording, evaluation and documentation of test results, according to IEC 17025. To record the wave shape of impulses, it is equipped with an Impulse Recording Function (IRF).
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Transformer Testing Equipment
Offering you a complete choice of products which include Automatic Transformer Turns Ratio Instruments (ATRI- 3), Automatic Transformer Turns Ratio Instrument (ATRI-201), VTRI-2000 ( Transformer turns ratio instrument ), Current Transformer Test Set (CTC-1), Potential Transformer Tester ( PT Tester ) and Current Transformer Tester ( CT Tester ).
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Coil Test System
CTS
International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
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EMC Test Equipment
TDEMI eXtreme series
Highest measurement speed. Highest accuracy. Incredible dynamic. New operation modes. The novel product line TDEMI eXtreme (TDEMI X) is the latest and most advanced level of full digital measurement equipment for emission testing on the fast lane. It is based on the unrivaled and patented TDEMI® real-time technology of GAUSS INSTRUMENTS. It is easy and efficient in upgrading its frequency range by a various number of extensions which can be integrated into the instrument step by step. The frequency ranges are 1 GHz, 3 GHz, 6 GHz, 18 GHz, 26.5 GHz or 40 GHz respectively. A large variety of configuration possibilities makes the TDEMI X to the customized solution perfect fitting into your lab and to your application according to civil standards (e. g. CISPR, EN, FCC Part 15, ANSI C63.2, ANSI C63.4), military standards (e. g. MIL-461G, but also its previous versions and revisions) as well as avionic standards (e. g. DO-160). The frequency range of the TDEMI X instruments starts at 9 kHz in its standard configuration and can be extended down to 10 Hz by the option MIL/DO-UG or even down to DC by the available option OSC-UG as well. Like all other TDEMI measurement systems, the TDEMI X measurement systems can be remotely controlled and fully automated via Ethernet (TCP/IP) very easily.
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Test System
MxDSRC™
The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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Functional Testing Service
Is your software working the way it is intended to? Will it work in the real world as it does in simulations? Is the code really executing as per its outlined specifications? Do various parts of the application interact as planned? Will users find the application functioning as per their requirements or will they get lost in the flow? Functional testing answers all these questions and more:- Tests your application against its intended output parameters to make sure it works the way it is meant to.- Tests if the functions of the application are working as intendedUnderstand if various parts of the application are interacting as planned.- Check if the user navigation is simple, free-flowing, and friction-less.- Functional Testing ensures optimum quality for content, design and user experience.
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Battery Boxes Testing Equipment
Battery boxes can be tested for faults by placing the box on a metal plate. By applying a test voltage to an electrode inside the box, the moulding can be checked thoroughly - particularly at the injection points - and any faults found. Defects will be identified by a spark passing from the electrode, through the defect itself, to earth (the conductive material placed outside the battery box.
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Mechanical Testing Machine
Shenzhen Bonad Instrument Co., Ltd.
The design of our drop tester machines is divided into several styles according to the product and package sample’s size and weight. Some drop testers are specially used for small and light consumer electronics such as mobile phones, tablets, and other digital products or handheld mobile devices. And some other drop test machines can be used for the drop test on the complete package loaded with the product, even on the heavy-duty and bulky packaging cartons.Our drop test machines are designed to meet ISO, IEC, ISTA, ASTM test standards. For more information, please contact us, BONAD will provide you with professional technical consultation and high-quality testing equipment.
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Handover Test Systems
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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Continuous Testing Platform
BlazeMeter
BlazeMeter was designed and built by engineers who are passionate about open source. From mobile to mainframe, IDE or UI, bring teams together in a single platform with shared visibility, tests, and reports.
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Security Testing
For an application to be successful, it has to ensure the security of the customer’s data, which in turn helps to gain the trust of the customers, avoid legal battles, and enables growth in business.
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Strain Gauge Test
This test measures the structural stresses induced in equipment when subjected to various environmental and operational loads. Strain gages, which are resistive devices whose outputs are proportional to the amount that they are deformed under strain, are placed at selected locations to yield stress levels which may then be compared to design allowable limits.
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FEA and Strain Gauge Testing
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Air Data Test Sets
For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Mobile, Hardened Test Set
MBX1
With the MBX1 platform and our software, you can easily test SCADA and substation automation systems (SAS) in a highly secure way. The mobile solution allows you to perform quick assessments and temporary monitoring, e.g. during commissioning.
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SAS Protocol Test System
Sierra M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Multi-Platform Vehicle Test Set
Kratos Defense & Security Solutions, Inc.
The Multi-Platform Vehicle Test Set (MPVTS) is a self-contained portable equipment rack test instrument for performing vehicle electrical system verification. A custom MPVTS software application can be designed specifically to perform complete pre-mission verification of your airborne, ground, or marine vehicle. The MPVTS is the first test set designed to be completely vehicle platform independent.
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8-slot ATX-supported PICMG 1.3 Bus Half-size Backplane
HAB208
The HAB208 has a PICMG 1.3 CPU card slot, a PCIe x 16 slot and a total of six 32bit/33MHz PCI slots. The onboard 24-pin ATX power connector and 8-pin connector for thermal detected board are featured. Furthermore, the backplane supports two onboard SATA ports (optional function). The HAB208 is perfect fit for AXIOMTEK's half-size CPU cards, the SHB210 and SHB211, which are built around the PICMG 1.3 form factor. We have enclosures, the AX60551 & AX60552, to house the backplane.
