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Panels
Designed mainly for Fanout Panel-Level-Package (FO-PLP) applications, Camtek’s Golden Eagle is used for the inspection and metrology of standard panel sizes, up to 650mm x 650mm. The Golden Eagle addresses the challenges of FOWLP while providing a robust system that addresses the most stringent, high-volume manufacturing requirements.
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Video Inspection Station
VIS300
Video Inspection Stations are available with?or without on-screen measurement capabilities?and offer?an excellent way to evaluate or test small works or items in?difficult to access locations.? As todays electronic and mechanical systems keep getting smaller, it becomes impossible to test or measure these products with traditional methods. For many applications, from development to production testing, video based inspection can help maintain quality control. Many of these systems are used in labs for development or used in production for testing production samples.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Wafer Inspection System
JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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GPR System for Concrete Inspection
StructureScan Mini XT
Geophysical Survey Systems, Inc.
The StructureScan Mini XT is GSSI’s newest generation of our very popular all-in-one GPR systems. The StructureScan Mini XT offers a 2.7 GHz antenna for superior target resolution and can reach depths of 20 inches (50 cm). Ideal for locating rebar, conduits, post-tension cables, voids, and real time determination of concrete slab thickness.
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High-speed In-Line 3D CT Inspection System
X-eye 6300
Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Chip Inspection System
GEN3000T
GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Scientific Cameras
Thorlabs' Scientific-Grade Cameras are specifically designed for microscopy and other demanding applications. The Zelux™ CMOS cameras have small footprints and provide cost-effective solutions for general-purpose imaging applications. Kiralux® cameras have CMOS sensors with high quantum efficiency in a compact housing and are offered in monochrome, color, NIR-enhanced, and polarization-sensitive versions. Our polarization-sensitive CMOS camera is ideal for materials inspection, flaw detection, a...show more -
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GeoSwath Module
The GeoSwath Plus Sonar Module contains a wide-swath bathymetric sonar suitable for a range of survey and inspection tasks. The GeoSwath Plus is a 500kHz interferometric sonar, or phase detecting bathymetric sonar (PDBS) from Kongsberg GeoAcoustics. Boat-mounted GeoSwath sonars are used worldwide for high accuracy surveys including port and harbour navigation and environmental mapping: the Gavia’s GeoSwath module makes this capability available in a commercial AUV. The GeoSwath Plus offers:...show more -
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Inspection System
Pixie
3-D Metrology for automation. Pixie is a standard system for automated optical quality inspection. Pixie can be configured with 2 to 5 servo driven axis movement and the high-speed measurement capabilities make it suitable for inline and stand-alone solutions.
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Building Inspection System with Moisture Hygrometer & MSX® IR Camera
FLIR MR277
The MR277 is the first FLIR building inspection system to combine the advantages of Infrared Guided Measurement (IGM) and our patented Multi-Spectral Dynamic Imaging (MSX) with advanced environmental sensors to help you quickly locate, clearly identify, and easily document problems. IGM technology and a laser pointer isolate the area where you can use the integrated pinless moisture sensor for non-invasive readings or external pin probe for invasive measurements. With automatically calculated en...show more -
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Integrated Systems
Innerspec’s Integrated Systems are designed to provide automated and semi-automated NDT inspections in factory environments. These systems can incorporate unique sensors, instrumentation, software, as well as customized mechanical devices to integrate the inspection system with other equipment and processes.
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Semiconductor Package Inspection System
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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AOI Handlings System
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a revi...show more -
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Testing and Measurement
AkroMetrix provides a variety of products to help you identify and evaluate warpage: For warpage measurements along a production line or at room temperature, AkroMetrix has developed the LineMoiré Production Level Automated Flatness Inspection System. If you need to measure warpage and flatness during pre-defined temperature profiles, AkroMetrix's TherMoiré In-Process Warpage Measurement Systems may fit your requirements.
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Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Integrated Vision System
In-Sight 7000
In-Sight 7000 FeaturesYou will find so many machine vision applications for the award-winning In-Sight 7000 series of vision systems. These completely integrated smart cameras feature autofocus, fast image capture, integrated lighting and lens with powerful vision tools for inspection, color, OCR applications and more. They also have the capability to power and control a range of external lightingall in a compact, industrial IP67 package.
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ISC-1780, VGA, 1.58 GHz Processor, Monochrome/Color Smart Camera
785140-01
The ISC‑1780 is a high-performance smart camera for machine vision and is powered by a 1.58 GHz dual-core Intel Celeron processor. The combination of the onboard processor with a CMOS image sensor provides an easily distributed all‑in‑one system. In addition to high-performance image acquisition and processing, you can use built-in digital I/O and industrial communication options for dynamic, real-time communication and integration with industrial automation devices including programmable logic ...show more -
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Corona Camera
UV-260
Being with high sensitivity UV-260 is a power tool to detect UV emission in full daylight with high signals from faraway and nearby sources. UV-260 is an ideal predictive maintenance device for overhead transmission lines and high voltage substations. UV-260 is newest genaration of UV imaging system with an emphasis on high performance functionality and easy operation, it is widely used in transmission line inspection, electrical utilities, HV research institutes, HV electrical component inspection, HV panal inspection, service providers, laboratories and more.
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Surface Defect Inspection System
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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AVI
Combining Omron's advanced vision systems and motion control to provide fast, flexible and accurate inspection possibilities for post-SMT applications.
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Acoustic Microscope
AMI D9650Z
The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
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CMOS USB3 Cameras
CELERA One Series
CELERA One camera series provide the same excellence in quality, flexibility and performances of CELERA cameras, with the only exception of a single USB3 interface, while keeping the original extremely reduced dimensions and rugged design that make CELERA One cameras suitable for most applications: automated optical inspection, high performance sorting systems, industrial metrology, microscopy, medical diagnostics and machine vision.
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Laser Sherography NDT Sensor for Post-Production Quality Control or In-Field Component Inspections
FlawExplorer
The FlawExplorer is a laser shearography NDT sensor designed to be used for post-production quality control applications or in-field (in-service) component inspections. Depending on the application, the sensor can be configured with thermal or vacuum (partial) excitation systems and may also be automated. It incorporates the very latest in phase-shifting technology delivering accurate and reliable measurement results through clear and sharp imaging with sub-micrometer displacement resolution.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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X-Ray Inspection System
TruView™ Cube
The Perfect Solution for a Powerful Small Form Factor X-ray Inspection System. The all new TruView™ Cube X-Ray Inspection System is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. Ideal for applications where space is premium, the the TruView™ Cube X-Ray sits comfortably on your laboratory bench.
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LCZ LCR Meter
SS1062
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..
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SS-OCT Lasers And Systems
Impressive performance, demonstrated reliability, competitive price, and superior customer service has made Axsun the market-leading brand among SS-OCT system developers, manufacturers, researchers, and entrepreneurs. The Axsun tunable laser platform is the core of thousands of state-of-the-art SS-OCT systems deployed worldwide in applications ranging from medical diagnostics to industrial inspection. Axsun SS-OCT Imaging Engines with integrated Data Acquisition enable compact high-performance SS-OCT systems with quick time-to-market, customizability and scanner compatibility, along with opportunity to scale rapidly.
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Packaged Food X-ray Inspection System
EPX100
Our revolutionary new x-ray system is so advanced it will not only improve your product safety and meet regulatory compliance but also will optimize and streamline your product inspection.
