Electric Vehicle Test Systems
See Also: EV Test Systems, Electric Vehicle
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Electrification Testing Solutions
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Conformance Test System
TS8980
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Mezzanine System
5181 MMS ECM
ECM P/N 5181 uses TI TLV320AIC23 high resolution audio codecs to provide two channels of Audio input and two channels of Audio output. Each input channel consists of two inputs a left and a right, and each output channel consists of two outputs left and right. The outputs are muteable.
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4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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COTS Systems
Pre-integrated to save you time and money, pre-validated systems proved an optimum computing platform for mission applications.
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Seat Actuation Systems
Extensive solutions for seating cabin interiors including motion and lighting controllers, linear and rotary actuators, power supplies, passenger interfaces, custom harnesses, sensors, pneumatic units, and bladders.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Mezzanine System
5188
ECM P/N 5188 provides an AD8109 crosspoint switch for analog or digital signals with 250MHz of Bandwidth. For single ended applications 8 inputs can be connected up to 8 outputs in any configuration.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Systems Integration (SIL) Lab Data Acquisition
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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NI LabVIEW Base Development System for Windows
NLabVIEW is system engineering software designed for applications that require test, measurement, and control with rapid access to hardware and data insights. The LabVIEW Base Development System is recommended to integrate NI hardware and third-party devices together to build automated desktop measurement applications with an intuitive graphical programming syntax.For applications that require advanced inline analysis or PID control, consider LabVIEW Full Development System.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
