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Product
Package Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
Thermocouple System
Model TCIC
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Industrial Measurement Systems Ltd.
High Speed 8 Channel Thermocouple Interface CardPDF VersionModel TCIC Thermocouple Interface Card with USB or RS232 / 485Main FeaturesLow cost high speed thermocouple measurement 400 channels / second
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Product
LT-300A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Product
Measurement System
A0010A RIN
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realizes world's widest 40 GHz measurement bandwidth with high-sensitivity, low-noise 40 GHz optical receiver and Agilent high-performance X-series signal analyzer. SYCATUS developed unique calibration method, which achieves high accuracy and repeatability.Feature
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Product
Thermal and Mechanical Testing System
3500 System
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The Gleeble 3500 is a fully integrated digital closed loop control thermal and mechanical testing system. Easy-to-use Windows based computer software, combined with an array of powerful processors, provides an extremely user-friendly interface to create, run and analyze data.
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Product
Telemetry System for Electrics
HTS-SS Blue
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Our HTS-SS Blue sensor station system provides comprehensive telemetry information about your electric-powered aircraft and is compatible with the HTS-Volt, HTS-GPS, HTS-TEMP, HTS-ORPM, HTS-MRPM, HTS-C200 and HTS-C50 suite of sensors.
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Product
Portable CMM with Point-and-Click Automation
zCAT
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Powered by Verisurf AUTOMATE software – zCAT combines a revolutionary, lightweight and portable form factor with easy-to-use software that serves as a common, mobile platform for in-process inspection or reverse engineering.
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Product
Testing Software
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SMC supplies as standard several types of software adapted to each set, for automatic testing, unit operation and reports or results acquisition, which allows the full functionality of the equipment; the following programs are included with the corresponding equipment:
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Product
Test Fixtures
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Test fixtures are a product for the test and the testing of printed circuit boards. The test adapters offered by uwe electronic are suitable for both manual testing and automated testing with vacuum operation. The test fixture can be either fully equipped and wired or delivered without installed components. Pneumatic, Mechanical and Vacuum Fixtures.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Test Sockets
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Yamaichi Electronics Co., Ltd.
A test socket is the ideal point to test your home’s internal phone wiring for faults. You can also use it to identify any potential faults with the phone line outside. Your test socket is located in your master socket. It is the point between the internal phone wiring in your house and the phone line outside. That means by plugging into your test socket you can bypass all the internal wiring and test your device directly on the phone line.
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Product
Test Patterns
DisplayMate Multimedia Edition
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DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Product
Development System
FE-51MX
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* Emulates Philips P8xC51MA/B/C , P89C669 Microcontrollers * 1MByte Code Memory * Based on bond-out Technology * Frequency up to 24MHz 3V / 5V Operation * Huge Real Time Trace Memory * Windows Debugger for C/C++ and Assembler * Target Board Included * RS-232 or USB Interface * 64K C/ASM and 8K C++ Included
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Product
Switchgear Test Systems / Circuit Breaker Testing
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ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
(250 kN) Fatigue Testing System
8802
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The Instron 8802 is a high stiffness, 250kN fatigue rated servohydraulic testing system that meets the challenging demands of both static and dynamic testing requirments. The 8802 systems include a range of configurations available to provide complete testing solutions to satisfy the needs of advanced materials and component testing. The design of the 8802 frame makes it ideal for installation within a laboratory environment, generally without the need for strangethened floors or raised ceiling heights.
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Product
Universal Monitoring System
R&S®UMS400
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The ever-increasing frequency range of wireless communications services calls for monitoring stations up to 8 GHz, in some cases even up to 20 GHz. Typically, this requires a monitoring sensor installed close to the antenna(s) in order to keep cable losses as low as possible for highest sensitivity. This is possible for both the R&S®UMS400 and R&S®CS-MC20, thanks to an outdoor housing.
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Product
Production Process Automation System
OPLAN
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OPLAN v2.6 is a system for production process automation of a television company. The system supports all the stages of operation. From the content ingest, description and preparation, creation of preliminary line-ups and daily broadcasting schedules, registration of commercials and arrangement of commercial blocks, broadcast preparation and automation, to the control and analysis of broadcasting results.
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Product
IR Inspection System
EVG®20
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The EVG 20 offers a fast inspection method, especially for fusion bonded wafers. A live imageof the entire wafer via IR transmission supports void detection down to a radius of 0.5 mm. The infrared inspection system is a perfect match for fusion bonding processes either as the stand-alone EVG 20 tool or as a station in EVG''s integrated bonding systems.
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Product
Image Management System
PAX-it™ 2
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PAX-it 2 allows you to easily capture, organize, analyze, network, transmit, and print high-resolution images. Through the use of a simple "electronic filing system," millions of images can be effectively organized and shared throughout your work environment, whether within the same building or around the world.
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Product
HALT/HASS Testing
HALT HASS Chamber
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AST applies stresses (such as temperature and vibration) to products well beyond its normal use environment. This type of testing is done to determine product operating and destruct limits. These stresses are applied as the product is functionally tested and continuously monitored for failures.Highly Accelerated Stress Testing (HALT) and Highly Accelerated Stress Screening (HASS) are two types of accelerated stress testing. These types of tests are commonly used to eliminate design problems, helping to develop a robust, mature product prior to market introduction. It can also be used to screen out infant mortality issues prior to shipment.
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Product
VME & CPCI Systems
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Verotec has a selection of configured systems plus individual elements such as backplanes, power supplies and cooling products, compliant with the PICMG / VITA specifications, and supported by a range of accessories. We offer these in standard VME and CompactPCI platforms across various mechanical form factors with customising options to suit specific applications.
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Product
Supercapacitor Test
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The CT3001A/C battery test systems are upgraded from CT2001A/C with higher precision and data logging rate. The tester can be used to run precision tests for coin cells, pouch cells, prismatic cells, and especially supercapacitors (ultra-capacitors). Each tester has 8 independent channel which can be programmed to run constant current charge/discharge, constant voltage charge, constant power discharge, constant resistant discharge, and direct current internal resistance (DCIR) tests.
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Product
Vibration Testing
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DATASYST Engineering & Testing Services, Inc.
Small, medium and large electro-dynamic vibration systemsServo-hydraulic vibration systemsCombined environment system (Temp-RH/Vibration)
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Product
Sensing System
DAS
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Our Distributed Acoustic Sensor(DAS) with excellent pattern recognition software can detect and locate the distributed thousanfs of acoustic events. Whenever any vibration or sound around its sensing fiber is detected, our DAS system will process the measured data in real-time and its pattern recognition software will recognize the types of the events, such as digging, pipeline leakage, fence breach, vehicle moving person walking. And, the detected events are reported to the alarm server to help operators take actions to protect theor facilities.
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Product
AC Warning System
AC-15
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Monitors AC on pipelines or structuresAlarm at 15v AC ThresholdConforms to NACE SP0177-2007Audio and Visual AlarmsCalibration Test UnitSuperbright LED'sReplaceable 9v Batteries
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Corrosion Test
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The purpose of this test is to determine the resistance of materials and protective coatings to corrosive atmospheres when a more corrosive environment than the salt fog/spray test is required. The test is used when material is stored or operated in areas, for example, where acidic atmospheres exist, such as in industrial areas or near the exhausts of any fuel-burning device. Gases such as sulfur dioxide are used to replicate the exhausts of fuel burning devices.





























