Showing results: 1276 - 1290 of 1358 items found.
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784122-01 -
NI
2- or 6-Port PXI Vehicle Multiprotocol Interface Module—The PXIe‑8510 is a hardware-selectable controller area network (CAN) and/or local interconnect network (LIN) interface for developing applications with the NI‑XNET driver. The PXIe-8510 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals, such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time for processing complex models and applications.
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AIM GmbH
AIM’s Fibre Channel test, simulation and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive and scalable DDR3 memory and IRIG-B time encoder/decoder functions are standard. The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function test, simulation, monitoring and analyzer functions for Fibre Channel networks. The dual core processor provides onboard processing and data transfer capabilities for the most demanding Fibre Channel applications including upper layer protocol support done on board level. Large and high data throughput DDR3 RAM is accessible for the onboard processor as is a high performance FPGA implementing the customized Fibre Channel interfaces enabling the board to analyze incoming and modify outgoing data in real time. Each module provides 2 Fibre Channel compliant full duplex ports, implementing the full link level services. SFP cages make it suitable for different media types as optical or electrical network technologies. Ports operate either in Traffic Simulator or Analyzer/Monitor mode with support for port related Frame Statistics. Sophisticated packet capturing mechanism and monitoring features are complimented with powerful triggering and filtering capabilities.
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NI
PXI Vehicle Multiprotocol Interface Modules use hardware-selectable NI-XNET Transceiver Cables (TRC) to communicate High-Speed/Flexible Data‑rate CAN, Low-Speed/Fault Tolerant CAN, and/or LIN. Using the NI-XNET driver, you can create applications that require real-time, high-speed manipulation of hundreds of CAN and/or LIN frames and signals. The NI-XNET device-driven DMA engine enables the onboard processor to move frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time. PXI Vehicle Multiprotocol Interface Modules work well in applications such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, and automation control.
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National Technical Systems
When the required testing of a product includes a transport simulation test, there are several standards that various organizations have published for package testing methods. These include the International Organization for Standardization (ISO), American Society for Testing and Materials (ASTM), Military Standards (MIL-STD-810), and in more recent years the International Safe Transit Association (ISTA) whose test standards are becoming more widely accepted. ISTA has organized its test protocols into Series, and there are a total of seven Series. Testing must be performed in an ISTA certified lab and must comply with minimum requirements of a current ISTA testing procedure. But In order to perform a proper ISTA certified test, which of the series should be used?
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Hill Engineering, LLC
Hill Engineering's expertise in residual stress and material performance provides us with a unique opportunity to effectively design and manage production quality programs. For example, a quality system for residual stress in aluminum forgings would provide the means to control, monitor, and certify the residual stress. In general, the quality system seeks to identify key metrics in the manufacturing process, establish a testing protocol for these metrics to qualify the manufacturing process, and then perform either lot-release and/or surveillance testing to demonstrate process stability over time. Process simulation may be used to identify locations for quality control measurements and portable measurement technology like hole drilling may be used to perform quality control measurements inside of a manufacturing facility.
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Bloomy Controls, Inc.
The Battery Fault Insertion Unit (FIU) provides intelligent switching of cell-simulation channels for the Battery Simulator 1200. The switching capability enables simulation of open-circuit and short-to-rail fault conditions on any cell channel for the purposes of battery management system (BMS) testing. Additionally, a four-wire auxiliary input allows you to connect an external digital multimeter (DMM) instrument to any cell channel for very high-accuracy bypass current and cell voltage measurements. Each FIU provides 24 independently-programmable cell-switching channels for one or two 12-cell Battery Simulator 1200 units. Additional Battery Simulator 1200 and FIU instruments can extend functionality up to 120 series-connected cell channels.
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DAS-429UNET/RT8-717 -
Excalibur Systems, Inc.
The DAS-429UNET/RT8-717 is an ARINC 429, multichannel interface card with additional ARINC-717 receive and transmit channels. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the ARINC 429 & ARINC-717 bus, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.The EXC-429UNET/RT8-717 adapter is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application (only versions 8.1 or higher).
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786457-01 -
NI
PCIe, Kintex-7 325T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device - The PCIe‑7858 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7858 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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778998-01 -
NI
13-Bit, 32-Channel, 800 kS/s PXI Analog Output Module—The PXI‑6723 delivers low-cost, high-density analog outputs to meet a wide range of applications, such as stimulus-response, signal simulation, waveform generation, and actuator stimulation. In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24‑bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PXI‑6723 can replace several kinds of instruments, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators. You can control each data point for each channel to define common waveforms, such as square, sine, or sawtooth, as well as complex waveforms.
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786458-01 -
NI
PCIe, Kintex-7 160T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device - The PCIe‑7857 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7857 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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KLA-Tencor Corp
KLA’s advanced process control and process enabling solutions support integrated circuit manufacturing. Using KLA’s comprehensive portfolio of defect inspection, review, metrology, patterning simulation, in situ process monitoring and data analytics systems, IC manufacturers can manage yield and reliability throughout the chip fabrication process - from research and development to final volume production. SPTS provides deposition process solutions for insulating materials and conducting metals that cover a range of chip manufacturing process steps. IC manufacturers use KLA's array of products and solutions to help accelerate their development and production ramp cycles, to achieve higher semiconductor die yield and improved IC quality, and to improve overall profitability in the IC manufacturing process.
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Wewon Environmental Chambers Co, Ltd.
The environmental chamber for conditioning of samples prior to testing, It also can be used for a variety of materials of high – low temperature alternating test. The test for temperature, humidity, time can be programmed. Provides conditions of temperature from -70 degree to +180 degree and of humidity form 10% to 98%.environmental chamber ● The ideal simulation environmental chamber for all heat and cold testing between -70 ºC and 180 ºC temperature range.● Well suited for reliability testing based on current test standard in the temperature range of -70 °C to 180 °C & 10% to 98% RH.● This design SUS environmental chamber meet all requirements for extreme testing and low temperature alternating climate profiles from -70 °C -180 °C with humidity
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LE-170SA -
LINEEYE Co., Ltd.
LE-170SA is a compact hand-held size line monitor for CAN/LIN. It has a touch screen and can be control as for smartfones. It has 1 CAN channel and 1 LIN channel and it can monitor both CAN and LIN communication thus monitoring of the network which has both CAN and LIN is available. The monitor function can diplay the communication data in real-time while saving it. The simulation function can send/receive the test data instead of the original communication partner. The ID filtering and trigger function make your development/evaluation more efficient. It also can measure 4 external signals as degital signals or analog signals while monitoring the communication data.It is light (300g) and convenient for field testing. The line monitor is useful for not only development but also maintenance.
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40-195-001 -
Pickering Interfaces Ltd.
The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.
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40-195-101 -
Pickering Interfaces Ltd.
The 40-195 is a 22 Channel Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions on pairs of signals between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Relays in-line with the signal paths allow open circuit conditions to be simulated on either side or both sides of a signal pair. Relays between each channel pair enable adjacent signals to be shorted, and relays between signal paths and the "Fault" connection allow the application of external user applied fault conditions.
