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- Pickering Interfaces Inc.
product
PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 395kΩ
50-298-142
The 50-298-142 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Resistor Simulation Card
SET-1210
The card has two ranges of values that meet the requirements of most functional test systems.The SET card is designed for applications in which resistive sensors provide information about parameters such as temperature (e.g. when testing motor controls)Each channel of the SET-1210 resistor simulation card is able to simulate the common short-circuit and no-load conditions, which can occur in a system due to faulty wiring or sensors.
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Wavefront Modeling And Simulation
The CAST-CRPA Simulation Systems provide a precise, coherent, and repeatable GNSS RF signal “wavefront”, that is a perfect solution for testing phased array, or “CRPA” antenna systems, in a laboratory environment. The system generates a complete set of RF signals for each antenna element, which are referenced to the phase center of the antenna manifold. In addition, the CAST system allows users to add interference and IMU signals that can also stimulate EGI’s and a wide range of modernized navigation devices.
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PCI Precision Resistor Card 4-Channel, 2Ω To 13.6kΩ
50-297-131
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI/PXIe Fault Insertion Switch, 64-Chan 2A, N/C Through Relays, Fault Buses on M & U
42-190C-112
The 40-190C-112 (PXI) and 42-190C-112 (PXIe) are fault insertion switches with 64 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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SpaceWire-USB Brick Mk3
326
The SpaceWire Brick Mk3 is a USB 3.0 (also works with USB 2.0 and USB 1.1) to SpaceWire interface device that is suitable for use in all stages of SpaceWire equipment development: initial SpaceWire evaluation, instrument simulation, control system simulation, unit testing, integration support, and EGSE. The SpaceWire Brick Mk3 provides two SpaceWire interfaces, support for high speed data transfer, the capability to inject various types of errors on demand, the ability to transmit and receive time-codes and act as a time-code master, and comes complete with highly optimised host software for low latency transmission of SpaceWire packets directly to and from the host PC.
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Systems Integration (SIL) Lab Data Acquisition
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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PXIe-7862, Kintex-7 325T FPGA, 16-Channel AI, 1 MS/s, PXI Multifunction Reconfigurable I/O Module
786672-01
PXIe, Kintex-7 325T FPGA, 16-Channel AI, 1 MS/s, PXI Multifunction Reconfigurable I/O Module - The PXIe-7862 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of timing and synchronization. With 16 analog input channels connected directly to a Kintex-7 325T FPGA, you have ample space to design applications that require precise timing such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe-7862 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe-7862 also includes peer-to-peer streaming for direct data transfer to other PXI Express modules.
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Walk-In/Drive-In Temperature Environmental Chamber
Burnsco Environmental Test Chambers
These custom designed chambers are used for testing large products, vehicles, or batch testing. They offer temperature and humidity simulation capabilities for climatic testing and temperature/humidity cycling whenever there is a need to simulate wide temperature and humidity extremes. They can be made almost any length, width or height.
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Grid Simulator
PAS-F
The Intepro PAS-F Series is a broad line of programmable three phase output regenerative utility grid simulator products. With power levels ranging from 45kVA up to 1.6MVA, the series is capable of testing the largest of dispersed energy inverters. The PAS-F combines utility grid simulation with regenerative bi-directional AC source controlled power that is capable to both source and sink full current from the equipment under test (EUT).
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Reach-In Xenon Lamp Weathering Test Chamber
Weiber xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. Reach in chambers provide a compact testing area for small applications. These are easy to install, transport and occupies less space.
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 472Ω
50-297-120
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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DDoS Testing
DDoS testing is a simulation of a DDoS attack performed under controlled conditions with real traffic. The goal of DDoS testing is to answer specific questions about the target environment.DDoS attacks are unique for many organizations in that they are relatively infrequent, but when they do occur they're often catastrophic. This catastrophic nature requires that a strategy be implemented to protect the organization, but a lack of real-world experience may limit the effectiveness of any solution. The infrequency of DDoS attacks often means that IT teams are developing solutions based on the "last attack" and waiting until the "next attack" to determine success. To address these challenges, NimbusDDOS created the first DDoS attack simulation platform. Our DDoS simulation services provide organizations the ability to proactively perform DDoS attack tests, using the same techniques used by real attackers. Unlike a real attack, a DDoS test is performed in a controlled manner and structured in a way to achieve the customer's objectives.
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Test And Simulation Devices
BreakingPoint
Control global threat intelligence at Internet-scale to create massive-scale, high fidelity simulation and testing conditions for battle-testing infrastructures, devices, applications, and people.
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PXIe-7856, Kintex-7 160T FPGA, 1 MS/s PXI Multifunction Reconfigurable I/O Module
784145-01
Kintex-7 160T FPGA, 1 MS/s PXI Multifunction Reconfigurable I/O Module—The PXIe‑7856 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe‑7856 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe‑7856 also includes peer‑to‑peer streaming for direct data transfer to other PXI Express modules.
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Bidirectional DC Power Supply + Regenerative Load
62000D
Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 6.97kΩ
50-298-130
The 50-298-130 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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DC Power Supply With Scope, Arbitrary Waveform Generator, Automotive Application Features, And PathWave BenchVue Software Bundle
E36154ABVX
The Keysight E36154ABVX consists of a Keysight E36154A DC power supply, a Keysight E36150ADVU Scope View and arbitrary waveform generation (AWG) capabilities, a Keysight E36150ATMU Automotive Standards Testing Capabilities with Enhanced Programming Speed, ISO Preset Library, Playback Simulation and E-Logging features, and Keysight BV9200B PathWave BenchVue advanced power control analysis software. The E36154A includes single-output and auto-range capabilities, 30V, 80 A, 800 W, and LAN and USB interfaces.
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PCIe-7852, Virtex-5 LX50 FPGA, 750 kS/s Multifunction Reconfigurable I/O Device
781103-01
Virtex-5 LX50 FPGA, 750 kS/s Multifunction Reconfigurable I/O Device - The PCIe‑7852 features a user-programmable FPGA for high performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7852 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.
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MIL-STD-1553 A, B Simulator/Analyzer/Tester
CIC201
MIL-STD-1553 A, B Simulator/Analyzer/Tester - CIC201B VME/VXI B Size Interface, CIC201C VME/VXI C Size Interface - The CIC201 can be used for Validation Testing, Production Testing, full bus simulation and monitoring, as a general purpose 1553 interface or a stand alone bus Analyzer. For precise message scheduling and measurements, the Major and minor frame times are independent of message sequences or retransmissions on errors and the start of all command messages are independent of message length, response time or length of response. Message timing is calibrated and RT responses have low jitter.
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Specialty Lab Testing Services
Serving the Testing and Consulting needs for the Aerospace, Automotive, Bio-Medical, Military, Electrical and Electronics Product Industries since 1995 with technical excellence and exemplary customer service. Failure Analysis, Electronics Qualification, Screening, Environmental Test, Shock, Vibration, Package Test, and Transportation Simulation. Our customers come from a diverse group of manufacturers, from start-ups to Fortune 500 companies.
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ARINC825 (CAN Bus) Test & Simulation Module for PCI With 2 Or 4 CAN Bus Nodes
ACP825-x
ARINC825 (CAN bus) Test & Simulation module for PCI with 2 or 4 electrically isolated CAN bus nodes operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s. The ACP825-x PCI card can work either with full functionality as an active CAN node for testing and simulating or in Listening Only mode for monitoring and recording purposes.
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Test Package
Shenzhen Bonad Instrument Co., Ltd.
We can provide a variety of different specifications of freezing load test packages, including AHAMHRF-1 2007/ SASO 2664-2007 Sawdust freezing test package, AS1731.4-2003 Australian frozen Load Test Package, AS72-2005 North American Commercial Refrigeration Load Simulation Test Package, IEC 62552 Test Package for Freezing Load Testing in Refrigerators. In addition, we can also provide customization according to test requirements. For more information, please contact us, BONAD will provide you with professional technical advice and high-quality testing equipment.
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Electronics
Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Package Testing
Lansmont package testing equipment is designed to perform industry standards, such as ASTM, ISTA, ISO, EUMOS and others. Our equipment is compliant with all of the most common ASTM and ISTA package testing procedures. There are individual standards that specifically reference how to perform drop testing, compression testing, side impact testing and vibration testing. In addition to those standards, there are groups of procedures referred to as distribution simulation tests, which incorporate some strategic combination of testing inputs, with the idea of simulating a typical journey through the supply chain. Some of the most common distribution simulation standards that are performed globally are published by ASTM and ISTA.
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PXI Precision Resistor Module 4-Channel, 1.5 to 3.55k
40-297-123
.This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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USB-7846, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device
783201-02
Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7846 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7846 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.
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Rapid-Rate Cycling Chambers
TCC
Through simulation of wind volume and wind speed, TCC-150 can minimize specimen temperature variations, enabling more accurate quick temperature change testing. For specimen temperature, the ramp rate is 15°C/min. For air temperature,the ramp rate is 23°C /min (temperature heat-up average).
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 62.1Ω
50-298-011
The 50-298-011 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PCI Precision Resistor Card 3-Channel, 2.5Ω To 395kΩ
50-297-142
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI Precision Resistor Module 9-Channel, 1 to 31.5
40-297-110
The 40-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
