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X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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XRF Analyzer
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X-ray fluorescence (XRF) is a non-destructive analytical method used to determine elemental concentrations in various materials.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
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Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Linear Accelerators
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The latest interlaced dual-energy technology offers improved material discrimination, with an option to alternate X-ray energies on a pulse-to-pulse basis.
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Photodiodes
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Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.
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XRF Analyzers
Vanta iX
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The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line.
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Gasoline and Diesel Analyzer
NAX-100S
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Napco Precision Instruments Co
NAX-100S is the X-ray fluorescence spectrometer which is collaborative researched Sense and the University of Michigan in USA,TsingHua University in china and other spectrum experts, It is based on American high-end technology,has a design patent about the unique vacuum system ,special optics path system,designed for the detection of gasoline and diesel,has excellent stability about the ultra low content of elements analysis for petroleum chemical industry products.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Constant Potential Generator Small Focal Spot 10 to 200 kV
CP200DS
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The small focal spot (1 mm) of the CP200DS generator minimizes un-sharpness and gives clearer images, which makes it ideal for digital radiography (DR) when close X-ray shots are possible.Our CP200DS is a light and powerful generator (200 kV) with a metal-ceramic tube which turns it to be the best power-to-weight ratio in the world.Its 100% duty cycle combined to its built-in multiple X-Ray outputs carousel make the CP200DS one of the most versatile generators on the market that will adapt to a very wide variety of NDT applications.The CP200DS, like the rest of the CPSeries product range, operates with the plug-and-play POWERBOX control unit.
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XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Digital mammography system
AMULET
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The new format FPD has a proprietary panel structure with a double layer of amorphous selenium that has high X-ray absorption properties, and was developed by combining Fujifilm''s "Device Development Technology" and "Vacuum Deposition Technology." The first layer efficiently converts X-rays into electrical signals, while the second layer employs the unique "Direct Optical Switching Technology," that captures higher resolution and lower noise image electrical signals rather than using electrical switches such as conventional TFTs. By achieving both "50µm fine pixel size (higher resolution) and low noise," the AMULET system can show microcalcifications and tumors in greater detail, both significant indicators for early diagnosis of breast cancer.
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Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Sulfur Analyzer
682T-HP
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Using x-ray-transmission analysis techniques, the 682T-HP has been developed as a fast, sensitive and compact solution for on-line monitoring of the sulfur content in highly viscous hydrocarbons.
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Data Reporting and Analysis Software
TRACS
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TRACS (Trending-Reporting-Analysis-Capture-Software) is a graphical reporting software tool, which runs over a network and captures data from connected machines for analysis and reporting from a remote computer. Developed in partnership with AutoCoding Systems, TRACS displays live and historical batch data for all production runs and is designed to work with LOMA’s Metal Detectors, Checkweighing, X-ray Inspection and Combination Systems.
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Scientific CCD Image Sensors
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Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Real-time Chemical Imaging System
AZtecLive & Ultim Max
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AZtecLive is a revolutionary new approach to EDS analysis that enables a radical change in the way users perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with your samples. 100 mm2 and 170 mm2 sensor areas. Quantitative analysis at 400,000 cps. EDS mapping at >1,000,000 cps.
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Handheld XRF Analysers
X-MET8000 range
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Hitachi High-Technologies Corp.
The X-MET8000 range of handheld X-ray fluorescence (HHXRF) analysers delivers the performance needed for rapid alloy grade identification and accurate chemistry of a wide variety of materials (solid and powder metals, polymers, wood, solutions, soil, ores, minerals etc). The X-MET is practical, rugged and easy to use to deliver results you can trust.
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Rack-Mount Power Supplies
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Explore rack-mount high voltage power supplies that feature IGBT switch mode technology or active power factor correction. And check out our rack-mount modules equipped with disc sets, which are ideal for ion-beam and electron-beam systems and X-ray equipment. Choose from standard modules or customize.
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XRF and XRD Analyzers
Vanta
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The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.
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Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
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Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Handheld ED-XRF Spectrometers
SPECTRO xSORT
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SPECTRO Analytical Instruments GmbH
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. These energy dispersive X-ray fluorescence devices are recognized for ruggedness and reliability on the job. They offer metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, laboratory-quality results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use. At a range of affordable prices, SPECTRO xSORT spectrometers are leaders in their class for a broad spectrum of applications. - See more at: http://www.spectro.com/products/xrf-spectrometer/xsort-xrf-gun-handheld-analyzer#sthash.18piI4Px.dpuf
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XRF Analysis
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Elemental analysis (Be-U) from sub-ppm to 100% in solids, powders or liquids, X-ray Fluorescence.
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Micro-CT for material science
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Micro computed tomography is X-ray imaging in 3D, by the same method used in hospital CT scans, but on a small scale with massively increased resolution. It really represents 3D microscopy, where very fine scale internal structure of objects is imaged non-destructively. Bruker microtomography is available in a range of easy-to-use desktop instruments, which generate 3D images of your sample’s morphology and internal microstructure with resolution down to the sub-micron level.
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Neutronic Detection
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Neutron imaging is a non-destructive method used to see inside objects that may be inpenetrable by X-ray or other techniques.Neutrons offer the benefit of being able to see through heavy metals such as lead but can also be used to examine delicate processes.Photonis Neutron detector is designed to provide either still images or video using both cold and thermal neutron imaging techniquesfor non-destructive testing and neutron tomography.
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Photonic Detectors
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Excelitas offers photonic detection solutions covering a very broad spectrum, from Gamma, X-Ray, UV, Visible and into the near Infrared...making it a simple choice to find the right detector for your unique detection application. Product ranges include Silicon and InGaAS PINs and APDs, hybrid receivers and photon counting modules. In addition to our wide offering of off-the-shelf devices, we also specialize in customized solutions for your specific needs.
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XRF
M Series
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The M Series is the ultimate in high performance for the smallest x-ray spot sizes. The poly-capillary optics in the M Series is more advanced than the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included. The field of view becomes more limited with higher magnification, so a second camera takes a macro-image of the part to be measured. The dual-camera system allows operators to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the feature to be measured.
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Industrial CT X-Ray Inspection System
X7000
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The X7000 is North Star Imaging’s largest standard system. The large scanning envelope and generous focal distance allow for unparalleled inspection capabilities of very large objects. The system is great for composites, castings, pipes, tubes, welds and similar parts.
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GO-SCAN
15 10 HR
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For the first time ever, Teledyne ICM and Teledyne DALSA, two of the most advanced x-ray solution providers in the world, unite forces and reveal the first Integrated Digital Portable X-Ray Solution for Non-Destructive Testing… ever!
