X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
-
Product
Multi-Element Standards
-
These multi-element standards consist of multi-layer thin film coatings, one on top of the other, upto a maximum of 6 elemental coatings. It is generally recommended to have coating thicknesses < 20 µg/cm2, so as to cause negligible notable matrix effects, in particular absorption of X-rays emitted in lower deposits by those covering them.
-
Product
Optical Design and Simulation Services
-
The key area of expertise and the basis for all developments at the Fraunhofer IOF is optical and mechanical design as well as the simulation and analysis of optical and opto-mechanical systems inclusive of thermal and thermo-optical effects. Extensive design and modeling tools enable the simulation and optimization of systems for the THz to X-ray range - from micro-optics to astronomical telescopes.
-
Product
Inline 3D-CT Automated X-ray Inspection Systems (3D-AXI)
3Xi Series
-
Saki's 3D-AXI (X-Ray) series adds significant inspection capability. The system utilizes Planar Computed Tomography (PCT) providing high precision CT imaging at high speed.
-
Product
SAXS
-
Anton Paar’s precise and reliable solutions for SAXS/WAXS/GISAXS/RheoSAXS studies provide excellent resolution and the best possible data quality for your daily research of nanostructured materials. The robust systems employ brilliant X-rays as well as scatterless beam collimation and are equipped with a wide range of sample stages to cover many different applications.
-
Product
TEL-X-Ometer X-ray System
-
X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
-
Product
Metrology Solutions for Semiconductors
-
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
-
Product
Survey Meters
-
Measures alpha, beta, gamma, and x-rays. Its digital display shows readings in your choice of counts per minute (CPM), CPS, Sv/hr, or mR/hr, or in accumulated counts. Now with the USB and the Observer USB Software, you can download your accumulated data form the Digilert200's internal memory, set computer alarms, and calibrate your instrument.
-
Product
Photonic Detectors
-
Excelitas offers photonic detection solutions covering a very broad spectrum, from Gamma, X-Ray, UV, Visible and into the near Infrared...making it a simple choice to find the right detector for your unique detection application. Product ranges include Silicon and InGaAS PINs and APDs, hybrid receivers and photon counting modules. In addition to our wide offering of off-the-shelf devices, we also specialize in customized solutions for your specific needs.
-
Product
XRF analysis
X-Supreme8000
-
XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 for quality assurance and process control requirements across a diverse range of industries.
-
Product
X Ray Flaw Detector
-
A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
-
Product
Handheld ED-XRF Spectrometers
SPECTRO xSORT
-
SPECTRO Analytical Instruments GmbH
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. These energy dispersive X-ray fluorescence devices are recognized for ruggedness and reliability on the job. They offer metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, laboratory-quality results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use. At a range of affordable prices, SPECTRO xSORT spectrometers are leaders in their class for a broad spectrum of applications. - See more at: http://www.spectro.com/products/xrf-spectrometer/xsort-xrf-gun-handheld-analyzer#sthash.18piI4Px.dpuf
-
Product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
-
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
-
Product
Soldering Inspection Video Microscope
MS-1000
-
The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
-
Product
Sulfur Analyzer
682T-HP
-
Using x-ray-transmission analysis techniques, the 682T-HP has been developed as a fast, sensitive and compact solution for on-line monitoring of the sulfur content in highly viscous hydrocarbons.
-
Product
Analytical Services
-
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
-
Product
Scientific Solutions
-
Our backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) and front and back illuminated CMOS image sensors (CIS) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, in vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
-
Product
Portable XRF Analyzer
X-5000
-
The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
-
Product
Micro-XRF spectrometer
Atlas™
-
The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
-
Product
Personal Alarm
ND-20
-
Rugged Die Cast Aluminum Belt Worn Personal Alarm, Dual Range for Beta, Gamma and X-Ray
-
Product
Electron Probe Microanalyzer
EPMA-8050G
-
This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
-
Product
Linear Array Detector Cards
X-Card 0.2 to 2.5mm
-
A product family of high performance linear X-ray detector cards with preamplifier ASICs. The preamplifier ASIC converts the charge output from the photodiode array into voltage with serial output for easy integration with readout electronics. Can be arranged end-to-end to form large linear detector arrays.
-
Product
Temperature Controlled Microscope Stages
-
Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
-
Product
Gratings for Synchrotron, FEL and EUV Light Sources
-
HORIBA Scientific holographic lamellar gratings exhibit ultra-low grooves roughness and unique efficiency uniformity making them ideal for Synchrotron, Free Electron Laser (FEL), EUV or Soft X-ray light sources.
-
Product
GO-SCAN
15 10 XR
-
Featuring Teledyne DALSA’s high-resolution CMOS detector, and the lightest x-ray generator on the market, Teledyne ICM’s CPSERIES, the Go-Scan solution is without a doubt the all-around NDT solution when it comes to image quality, ease of use, handiness, and reliability.
-
Product
Charge Integrator Amplifiers
AD8488
-
Analog Devices’ charge integrator amplifiers convert the charge acquired by X-ray or photodiode detectors to a voltage. The channels are composed of CMOS transistors, using typical high input impedance CMOS gates. The integrators generate charge dependent voltages using a range of selectable capacitance values that accommodate a broad range of input charge values. The integrators are followed by single-ended input to differential output voltage amplifiers where offset and low frequency noise voltages are subtracted from the input voltages.
-
Product
X-Ray Inspection System
MX1
-
Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
-
Product
Nuclear Magnetic Resonance Spectrometer
NMR
-
NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
-
Product
Radiation (EMF, Nuclear, RF)
-
Sper Scientific radiation meters measure EMF, Nuclear, and Microwave radiation levels. Whether you are, measuring the RF strength of Wi-Fi and LAN network, or the electromagnetic field emissions from electrical power lines and transmission equipment, computers, HVAC, audio/video, and other electrical appliances. Our meters are small and light enough to go anywhere, yet sensitive enough to detect minuscule amounts of gamma, beta or X-rays.
-
Product
LIXI WorkStation
-
The LIXI WorkStation utilizes real-time xray to provide a cost effective solution for a variety of inspection needs. The system features a mobile cabinet for ultimate portability within your facility, while providing the operator with a high degree of safety.
-
Product
Research & Industry
XPERT 20
-
A small focal spot x-ray source provides increased visibility and sharpness of detail. With an X-ray source of up to 25kV and 1.0mA, the XPERT 20 provides images with the highest resolution to locate the smallest detail. Designed for use in the most limited spaces with complete shielding and other radiation safety features, the XPERT 20 is fully compliant with U.S. Federal and State requirements for radiation safety and operates with only a standard AC power source.
