X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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MXI Computerized Tomography (CT) Option
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The Nordson TEST & INSPECTION µCT inspection option provides Computerized Tomography (CT) functionality to compliment the 2D X-ray investigations on Nordson TEST & INSPECTION X-ray inspection systems. It uses the superior, sub-micron feature recognition 2D x-ray images, that Nordson TEST & INSPECTION X-ray systems always provide, to produce the best CT models for 3D sample analysis, virtual micro-sectioning and internal dimensional measurements. It reduces the number of time-consuming micro-section analyses needed and / or assists in identifying where micro-section preparation and investigation must concentrate. Available with a system order or as retro-fit to suit application and workflow needs.
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Conveyor X-ray Scanners
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Innovative baggage X-ray screening units for quick and easy identification of the material composition of scanned objects.
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Radiation Testers
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The Ranger is a small, handheld, digital survey meter which offers excellent sensitivity to low levels of alpha, beta, gamma, and x-rays. It has built in efficiencies for common isotopes to calculate activity in Bq and DPM. It has a backlit display and a count light and abeeper that sounds with each count detected. Other features include selectable alert levels, an adjustable timer, and an optional wipe test plate. Internal memory and the free Observer USB Software allow you to download your data, set computer alarms, and calibrate your instrument! The Bluetooth and Observer BLE enables saving, sharing,and automation of surveys and RadResponder compatibility
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XRF and XRD Analyzers
Vanta
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The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.
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Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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Electrometer
MAX4000
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Reference grade instrument for use in a wide range of radiation therapy applications, including external beam, low dose, high dose, intravascular brachytherapy, diagnostic x-ray, and mammographic x-ray.
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Ambient Metal Analyzer
AMMS-100 XRF
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The system integrates X-ray fluorescence for metal analysis up to 30 elements and a beta-ray attenuation model for particulate mass monitoring. But module will be using the same sample moving sequentially across the detector and would be significantly effective in industry emission tracing.
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Product
(Visible and IR) Streak Cameras
AXIS-PV
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Our ultrafast cameras are well-suited for time-resolved spectroscopy of ultrafast events in the X-rays as well as in visible light.
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Product
Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
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Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
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Xineos Large Area Detectors
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As a leader in CMOS innovation, Teledyne DALSA developed the Xineos to deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Multi-Sensor Core Logger
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The Geotek Multi-Sensor Core Logger (MSCL) systems enable a suite of geophysical measurements to be obtained rapidly, accurately and automatically on sediment or rock cores. The rugged nature of the equipment makes it suitable for use in either an onshore laboratory/repository environment or onboard survey and drilling vessels. All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to 1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL and X-ray CT systems are designed for a full range of core material in a variety of liner compositions. To accommodate varying customers’ requirements (both operational and scientific), we provide a range of different core loggers and X-ray CT systems:
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Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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X-ray Diffraction and Elemental Analysis
D8 ADVANCE
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The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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Refurbished And Demo X-ray Inspection Systems
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Our 2024 collection of refurbished and demo X-ray inspection systems offers high-quality performance at an affordable price. These precision X-ray inspection systems provide exceptional value without compromising on quality.
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Photodiodes
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Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.
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Superlattice Doping / ALD Services
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Alacron, Inc. is capable of processing sensor wafers on a contract basis to produce backside illuminated wafers sensitive in the UV and soft X-Ray region with an array of anti-reflective coatings based on licensed patented, (US 8,395,243 and US 8,680,637), technology from Jet Propulsion Laboratory (JPL).
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Radiation Detectors
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High Purity Germanium (HPGe) DetectorsSilicon Charged Particle DetectorsScintillation DetectorsORTEC is a leading supplier of solid-state, high resolution, semiconductor radiation detectors. These radiation detectors are used in research, commercial industry, environmental protection, health and medical physics, as well as homeland security to detect gamma-rays, X-rays, and charged particles.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Specimen Radiography System
XPERT 40
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Whether in the biopsy suite or the pathology lab, nothing beats the XPERT 40 Specimen Radiography System in terms of versatility and speed. A 50kV, 1.0 mA X-ray penetrates the densest cores and surgical specimens, identifying the finest details in seconds.
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Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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In Situ Diagnostics
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For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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Battery Inspection
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We design, develop and manufacture X-ray solutions specifically for battery cells. At Exacom we stand for passion, innovation, out of the box thinking, honesty and reliability, as well as speed and a hands on mentality.
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Coating thickness XRF Standards
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We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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Energy Dispersive X-ray Fluorescence Analyzer
X-5000
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HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation.
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
