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Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Test System
Tessy
TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Datapaq Solar Tracker System
The SolarPaq® Thermal Profiling Systems from Fluke Process Instruments are designed specifically for solar photovoltaic (PV) manufacturing including applications like contact firing, contact drying, anti-reflection coating for the solar cell, lamination and other thin film processes. These systems, consisting of user-friendly Insight™ software, Datapaq® Q18 data loggers, stainless steel thermal barriers, thermocouples with PTFE or mineral insulation and accessories, provide users with the tools needed to gather accurate, repeatable results for process optimization, maximize cell efficiency and throughput, and more.
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Development System
FE-RE2
* Emulates Atmel AT89C51IE2/RE2 and others * 128K Code Memory * Real-Time Emulation * Frequency up to fmax 60 MHz * 3V and 5V Support * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * RS-232 and USB Interface * C Compiler and Assembler
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High-Capacity Compact Real-Time System
ADwin-Gold II
10 times more computing power than ADwin-Gold with the processor ADSP TS101S at 300 MHzMore memory: 768 kB CPU-internal RAM, 256 MB DRAMHigher resolution: 2 18 bit ADC with 8 analog inputs each via multiplexerFIFO memory at the digital inputs for fast detection of rising and falling edges with 100 MHz event counter2 analog outputs, 16 bit, 32 digital I/Os (TTL)
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Galvo Mirror Systems
Thorlabs offers Galvo Mirror Systems for both small (<5 mm) and large (<10 mm) beam diameters. Choose from single- or dual-axis galvo motor options as well as your choice of metallic silver, metallic gold, a dual band dielectric coating for 532/1064 nm, or a broadband dielectric coating for 400 - 750 nm.
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Liquid Phase Epitaxy Systems
MODEL LPE-3750 / 4750
The Tek-Vac LPE-3750 / 4750 Liquid-Phase Epitaxial Reactor utilizes a graphite slider boat technique to produce high quality semiconductors at high throughput rates. Automated Control provides uniform processing from run to run. An IBM PC, or compatible, uses Graphic Displays to develop process recipes and procedures. The LPE-3750 / 4750 can operate in a stand-alone mode.
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UV Lamp Control Gear
UV Series
These are designed and manufactured to meet not only customers specifications, but also our own high standards of workmanship and performance.
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PC/104-GPIB, ISA GPIB Instrument Control Device
778041-01
ISA GPIB Instrument Control Device - The PC/104-GPIB is a plug-and-play IEEE 488 interface for industrial environments. The PC/104-GPIB performs the basic IEEE 488 Talker, Listener, and Controller functions required by the IEEE 488.2 standard. The PC/104-GPIB includes a license for the NI-488.2 driver software, which provides high performance and maximum reliability for connecting to third-party instruments using GPIB. The PC/104-GPIB is software- and register-compatible with the AT-GPIB/TNT.
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Contactless Control of Plastic Molding
Danube
The "Danube" installation carries out non-contact control of the mold of plastic molding on the basis of a Sick Ranger laser scanner (Germany).
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Digital Map Systems
Elbit Systems of America’s Global Digital Map Unit is built on a proven design that accommodates multiple data formats and provides unmatched situational awareness to aircrews. The GDMU displays detailed map, flight plan, and threat information to aircrews. Each system performs interactive functions with the mission computers and generates digital video map data for head down displays.
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PC-based DSP Systems with Analog I/O
PCI, cPCI / PXI : 32 / 64 bit, 33MHz6711 or 6713 DSP32MB SDRAMLow latency burst interfacesHigh data transfer ratesGreat trigger flexibilityMultiboard support
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Live-Cell Analysis System
Analyze your cells for days, weeks or even months as they sit stationary in the stable environment of your tissue culture incubator.
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Semiconductor Switching Systems
Keithley 700 Series
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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Pinpoint Laser Systems Products
The Microgage PRO is the next generation in laser measuring and alignment tools. This extremely versatile measuring and alignment tool combines key features and capabilities into one portable, compact, easy to use, product for multiple industries. A precise laser beam forms a straight reference line for a machine or assembly and each receiver measures in two axial directions, horizontal and vertical (X & Y).
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Online Partial Discharge Alarm System
PD Annunciator™
The PD Annunciator™ unique design consists of a three channels acquisition module paired with sensors of your choice, most commonly TEV and Acoustic or HFCT. With many advancements and innovations, the PD Annunciator™ handles partial discharge monitoring on metallic cabinets using our proven and advanced technologies.
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Test Automation Systems
iTest
Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Metrology System
IMPULSE V
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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Redundant Power Supply Systems
Redundant Power Packages provide redundant DC power in one package.
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Linear Actuators MCS Controls
MCS
For those who need more than pushbutton control, Thomson offers a full line of MCS actuator control units. From simple to complex control, these units offer a variety of features with both DC and AC voltage outputs.
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Method Optimization System Triple Capillary Column GC
Simultaneous Three-Column Analysis with a Single Sample Injection and No Column Replacement Provides More Efficient Investigation of Separation Conditions
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High Voltage DC Cable Test Systems
We can offer from ±18kVdc to ±30kVdc units which all have automatic earthing for discharging capacitive loads. They are designed to perform tests on installed cables and jointing systems.
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Automated Metrology System
EVG®50
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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Rodent Behaviour Measurement System
LABORAS®
LABORAS is a high throughput system for automated recognition of a large number of rat and mouse behaviors. LABORAS is completey non-invasive, uses a home cage environment and automatically determines accurate and consistent behavioral data without the need of human observers. In addition LABORAS calculates precise position tracking parameters.
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Macro-Vickers Hardness Testing System
LV Series
LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Control Console (Automatic)
HTGY / 596
Wuhan Huatian Electric Power Automation Co., Ltd.
Special equipment for test transformer，It can seamlessly connect various test transformers of different grades.
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Ku-Band Antenna Systems
A complete line of Ku-Band and Ka-Band SATCOM antenna systems featuring TECOM technology for non-stop gate to gate in-flight connectivity for commercial large Air Transport, Business Jet and various military applications.
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300mm Single Touchdown Burn-in and Test System
FOX-15
Up to 15 wafers at a time Known Good Die solution Lowers production cost
