- Optomistic Products
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Trident Fiber-Optic Probes
Our most popular and cost-efficient option for the test of multiple LEDs — testing three LEDs with a single Sensor. This method of testing LEDs scales up, so that testing 3, 30, 300 — or any number of LEDs — is far more cost-efficient than other methods. This is our most popular Fiber-optic Probe and can be combined with any of our Universal LightProbe Sensors.
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T75
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Multifunction Installation Testers
Shanghai Beha Electronics Co., Ltd.
Loop impedance and prospective short circuit current measurement• Line impedance and prospective short circuit current measurement• Earth loop resistance in TT-systems• Rotary field test• RCD measurements (contact voltage, trip time, trip current - ramp method)• RCD analysis for test of all RCD parameters • Low Ohm and continuity measurement • Insulation measurement up to 1000V (suitable for 690 V industrial mains systems)• Earth resistance measurement with probes and clamp adapters• Voltage and frequency measurement • Current measurement with clamp adapters(optional)• Power and energy measurements• Harmonics measurement for voltage and current upto the 21st harmonics
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Low-leakage Switch Matrix Family
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wa...show more -
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Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Non-Magnetic Spring Probes
We have spring probes, which are composed of nonmagnetic material to use for test environment that requires to remove the effect of magnetism.
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Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Station...show more -
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Boundary Scan Test
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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Analog Clamp Meter
Operation0C~ 40C(32~104)/<80% R.H.(no condensation) Storage-10C~ 50C(14~122)/<70%R.H.(no condensation) Dimension & Weight 243(L)x91(W)x45(H)mm Approx.360g (Including battery) Accessories Battery UM-3 (AA) 1.5V x1 Instruction Manual x1 Test Lead (red + black) x 1 Carrying case x1 Optional Accessories Temp. Probe (NR-81) AC Line Splitter(DE-10ALS) *Applicable to electrical appliances small current
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Generic Probe Cards, PIB's, and Loadboards
Test Spectrum can provide generic Probe Cards, Probe Interface Boards (PIB), and loadboards. Choose from existing configurations already designed, or a generic test board for your specific tester configuration can be designed quickly.Teradyne J750 Probe Card and PIB; Teradyne Integra Flex PIB; Teradyne Ultra Flex PIB; Teradyne Catalyst PIB; Credence Quartet PIB (Probe Interface Board); Advantest 93K 1024 PIB
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Mini Back Probes/Wire Piercers
618
*Great for backprobing weather pack style connectors used with numerous automotive sensors *Also very handy for piercing and tapping readings on smaller gauge wires - using the included probe adapters *Works with most Test Lead Kits in the field - with standard 4mm banana plug test lead *Set includes four probes - red, black, green, yellow Test probes 21 mm length
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AWS Probes For Ultrasonic Weld Seam Testing (ASTM)
SONOSCAN R
The robust ultrasonic probes with BNC connector allow a fast scanning over comparatively large areas with high precision and repeatability. Both our own and third-party wedges can be attached to our probes. . Thanks to the different types of wedges various material tests can be performed.
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Pilot H4 Next Automatic
The Pilot H4 Next series automatic version represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system.
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Test Leads
8000 Series
The "SOFTIE" by Probe Master lets you say "goodbye" to hand fatigue and finger calluses. A soft probe that bends 90 degrees or more. A probe that conforms to the shape of your hand. This soft flexible probe bends gently to reduce wear and breakage of the lead. Many combinations are possible with the "screw on" accessories shown above. The 48" long, 18GA. test leads, are made of top quality silicone.
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Drop-In Functional Test Fixtures
Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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SMT & THRU HOLE LOADED BOARD TEST PROBES
SERIES 43
MechanicalMINIMUM CENTERS: .075 (1.91)FULL TRAVEL: .250 (6.35)WORKING TRAVEL: .167 (4.24)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 3 amps continuous at working travel, non-inductiveRESISTANCE: At 35 mA test current,30 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickelBARREL: Nickel silver with 24Kt gold plated ID and OD over nickelSPRING: Music wire, 24Kt gold plated over nickel
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Flying Probe Tester
FA1817
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Gaussmeter
DX-105
DX-105 Gaussmeter is a desktop gaussmeter. Which is based on the latest progress of the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probe adapts imported GaAs linear Hall-chip, the difference between any two probes is small, which can be replaced directly when it is damaged. DX-105 Gaussmeter is an ideal DC magnetic field test instrument.
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Adapter/Stainless Steel
WADP-24M29M
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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AC Power Analyzers
Measure voltage, current and power on 4 channels: DC, 1-phase AC or 3-phase ACMake more accurate power measurements: 0.05% at 50/60 HzMeasure current directly: internal shunts to 50 Arms, or with external probes or transducersAddress multiple test scenarios with isolated inputs
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Adapter/Stainless Steel
WADP-NMNM-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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High Power Devices
SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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SMT & THRU HOLE LOADED BOARD TEST PROBES
SERIES 33
ElectricalMAXIMUM CURRENT:3 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,20 mOHMS meanMaterials and FinishesPLUNGER: Heat treated berylliumcopper, 24Kt gold plated over nickelBARREL: Nickel silver with preciousmetal clad ID.SPRING: Music wire, silver plated
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Probe System
Acculogic Sprint 4510
The Sprint 4510 family of flying probers are well known for their speed, reliability, ease of use and large world-wide installed base.Flying probe testers have few restrictions on access, require no test fixtures, and can test boards with virtually unlimited number of nets, allowing test developers to turn a program around in a short time.
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Gaussmeter Probes
2100
Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range. Probe are supplied with flash memory and a temperature sensor that allow the 2100 Gaussmeter to correct for Hall Element inaccuracies due to temperature change. Probes are supplied with a NIST traceable Certificate of Calibration and test data.
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PCI Express Bus Analyzer / Exerciser / Endpoint
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
