Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Multimeter Test Probes
Multimeter Test Probes, Voltmeter test leads,with the Parrot™ Clip Invention provide precise, HQ, accurate, reliable contacts and connections. Parrot™ Clips with HQ leads and banana plugs or other connectors are the best solution for DDM, analog multimeter for high voltage measurements as well as for high current measurements. Measurements with multimeter test probes require both: Hands-on direct point contact and grip on, Hands free removable connection.
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Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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General Purpose Test Probes
Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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IC Test Probes
C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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Single Ended Test Probes
Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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Specialist Test Probes
High Current Test Probes, Ultra-high Current Test Probes,Kelvin Test Probes, High Frequency Test Probes, Switching Test Probes
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Test Probes / Test Fixtures
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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µHELIX® Test Probes
Series S200, S300, S400, and S500
Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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Accessibility Test Probes
TF-24 Series
Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Test Probes & Clips
CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Fine Tip Test Probes
U1164A
Compatible with test leads shipped with U1210, U1240B, U1250, U1270 series of handheld clamp meter and multimeters
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Remote Test Unit (RTU) Expert
RTU Series
VeEX’s Remote Test Units (RTU) are self-contained, scalable test and monitoring probes for communications networks. When used as part of the VeSion cloud-based monitoring system, these rackmount probes are optimized to work with a centralized server system. In addition, the probes can be operated in standalone mode via web browser.
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The Mag Lead
136
*Mag Lead features a magnetic disconnect near the test probe end. *Just disconnect the test probe and you can “stick” to any metallic ground or test point. *Quit fumbling with alligator clips that fall off - Mag Lead’s powerfull magnet will hold tight! *This is a time saving tool - if you don’t have to walk to your tool box to retrieve your alligator clips, even on just half the occasions, then you’ve saved time. *Very helpful for automotive reference points and troubleshooting. *Can eliminate the need to hold probes while checking or monitoring a signal. *Two high power, low resistance magnets hold the probe to the lead. *Fits almost all Digital Multimeters and can be used with hand-held scopes too. *Get the Mag Lead, it stays put and won’t fall off, like alligator clips do!
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Terminal Test Kit (94 Pcs)
3601
Peaceful Thriving Enterprise Co Ltd
*Total: 94 pcs*Alligator Clip x 2 pcs*Testing Probe x 2 pcs*Flat Terminal x 48 pcs*Testing Needle x 4 pcs*1 to 2 Connector x 2 pcs*Round Terminal x 24 pcs*5K Variable Resistor x 2 pcs*Polarity Tester / Stroboscope x 2 pcs*Insulator Pierce Through Clip x 2 pcs*SRS Air Bag Replacement Connector x 2 pcs*Male / Female to Male / Female Extension Wire x 4 pcs
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High Voltage Probe Meters
Shanghai Beha Electronics Co., Ltd.
*High voltage test probe *is a high voltage probe that is used with Oscilloscope● Attenuation Ratio: 1000:1*Measuring range: AC 20KV/DC 30KV
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Gaussmeter
DX-103
DX-103 Gaussmeter is a desktop gaussmeter.Which is based on he latest progress of the the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probes adapt imported GaAs linear Hall-chip, the difference between probes is small, which can be replaced directly when it is damaged, and is an ideal AC & DC magnetic field test instrument.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Benchtop Test System
300 Series Benchtop ATE
The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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Handheld Digital Multimeter, AC/DC Voltage, Continuity, Diode, Resistance, Temperature, 3.5, 2000
72-13435
*Clear LCD Display*Equipped with comfortable protective cover, test probe holder*2m drop test, precision protection*Auto Power Off*Auto Backlight Off*Loud Buzzer Sound*Knobs shift smoothly, in-line with ergonomics*Powered by AAA 1.5V x 2 batteries*12-month limited warranty *view Terms & Conditions for details
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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6 Sided Bed of Nails Testers
BoxProber Family
6 sided Bed of Nails circuit board test fixture. Probes top bottom and all 4 sides. Central camming mechanism pull plates inward. Mechanically or electrically actuated options. Designed primarily for testing products in plastics. Side access electrically probes outside panel connectors. The unit will also optically read LEDs and key segments off LCD displays. Solenoids will press buttons and servos will turn selector switches. DC motors are used to adjust multiple turn potentiometers. Microphone will detect audio output tones. Top and bottom of circuit boards can also be probed if removable access panels are available. This unit will also probe all 6 sides of a circuit board. This is typically utilized in applications where connector testing is required.
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Passive probe with X1/X10 switch
They are normally designated X1 and X10, although 1X and 10X are sometimes seen. The designation refers to the factor by which the impedance of the scope itelf is multiplied by the probe.The X1 probes are suitable for many low frequency applications. They offer the same input impedance of the oscilloscope which is normally 1 MΩ. However for applications where better accuracy is needed and as frequencies start to rise, other test probes are needed.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
