Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
Ingun Spring Probes
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MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
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Product
General Purpose Twin-Lead Tester
69136
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Tests voltage in 90-250 volt range, AC or DC.Neon lamp glows indicating live circuit.The 5'' (127 mm) test leads have probes on the ends.Handy pocket clip.
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Product
Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Product
Heat Test Probe 43
CX-43
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Shenzhen Chuangxin Instruments Co., Ltd.
It's the necessary tool to proceed protecting electric shock test of household and similar electrical appliances.
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Product
FEA and Strain Gauge Testing
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Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Product
Plug Solutions
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Operation based on the insertion of a plug or test probes which isolate field equipment from the relay, and provide secondary connection points for secondary injections.
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Product
DMM Test Probe Kit With Multi-Stacking Banana Plug
5325A
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DMM test probe kit with multi-stacking banana plug
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Product
CAM/TRAC Test Kits
Series 40
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The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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Product
Rugged Connectors
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Guaranteed for a minimum of 100,000 connections, our rugged connectors are designed to meet your industrial & ergonomic demands in harsh testing environments. We offer numerous connector specifications all fitted with interchangeable spring loaded test probes. Supplied as a single hand held unit, panel mounted or fitted to a test lead, the combinations are limitless. Designed directly from your CAD data and thoroughly tested, our rugged & reliable connectors are used worldwide on a daily basis.
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Product
Testing Services
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Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box testing—confirm quality of RF welds before the shield envelope is complete. We developed this method for testing the Navy’s Advanced System Integration Lab (ASIL) chamber at Patuxent River, shaving weeks off the construction/testing schedule.
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Product
Gaussmeter
DX-103
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DX-103 Gaussmeter is a desktop gaussmeter.Which is based on he latest progress of the the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probes adapt imported GaAs linear Hall-chip, the difference between probes is small, which can be replaced directly when it is damaged, and is an ideal AC & DC magnetic field test instrument.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
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Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Product
Gaussmeter
DX-102
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DX-102 Gaussmeter is a portable gauss meter, based on the latest progress of Hall effect magnetic field measuring instrument, adopted DSP technology. Test probe adopts import GaAs linear Hall chip, the difference between any two probes is small, if damaged, it can be replaced directly. DX-102 Gaussmeter is an ideal DC magnetic field test instrument.
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Product
CAM/TRAC Test Kits
Series 43
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The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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Product
Robotic Probing of Circuit Cards
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System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Product
Advanced High Speed Test Probe
SQprobe
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SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.
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Product
IEC60335 Nail Test Probe
CX-Z12
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Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Product
6 Sided Bed of Nails Testers
BoxProber Family
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6 sided Bed of Nails circuit board test fixture. Probes top bottom and all 4 sides. Central camming mechanism pull plates inward. Mechanically or electrically actuated options. Designed primarily for testing products in plastics. Side access electrically probes outside panel connectors. The unit will also optically read LEDs and key segments off LCD displays. Solenoids will press buttons and servos will turn selector switches. DC motors are used to adjust multiple turn potentiometers. Microphone will detect audio output tones. Top and bottom of circuit boards can also be probed if removable access panels are available. This unit will also probe all 6 sides of a circuit board. This is typically utilized in applications where connector testing is required.
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Product
Kid's Finger Test Probe 19
CX-19
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Shenzhen Chuangxin Instruments Co., Ltd.
Children Finger Test Probe 19 is intended to simulate access to hazardous parts by children of 36 months or less.
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Product
EMC Accessories
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Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Product
Test Probes & Clips
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CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Product
Non-Contact Voltage Testers
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PeakTech Prüf- und Messtechnik GmbH
User-friendly tester for non-contact voltage testing from 50 V to 1000 V AC. Suitable for outlets, lamp sockets or against wire insulation testing. If AC voltage is present at the relevant measuring point, this is indicated visually by a flashing red LED and the integrated buzzer sounds. If the measuring point is voltage-free, the test probe lights up permanently green.
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Product
Test Contactor/Probe HEad
cRacer
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The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Product
Test Leads and Probes
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Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
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Product
Test Probe
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Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Product
THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 80
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MAXIMUM CURRENT: 6 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS meanMaterials and FinishesPLUNGER: Heat treated berylliumcopper, 24 Kt gold plated over nickelBARREL: Nickel silver with 24 Kt goldplated ID and OD over nickelSPRING: (Standard) Beryllium copper,silver plated. (-1) Stainless steel,silver plated
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Product
Test Sphere Probe
CX-500
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
