Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
Test Hook Probe
CX-S11
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
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Product
Gaussmeter
DX-101
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DX-101 Gaussmeter is based on the Hall effect magnetic field strength of the latest developments in instrumentation, the design of desktop-type Gauss meter. Maximum range 330.0mT and 3000mT two tranches, the minimum basic error of 1.0%. Test probe connectors is imported, stable and reliable connection.
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Product
Test Probe
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Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Topside Probing In-Circuit Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.
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Product
Test Contactor/Probe Head
xWave
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Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Product
Handheld Digital Multimeter, AC/DC Voltage, Continuity, Diode, 3.5, 2000, Manual, 250 V
72-13440
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*Palm size digital multimeter with 2000 count clear LCD display*CAT II 250V environment safety rating*Manual functional select and manual range selection*2m drop test, precision protection*Auto backlight off*Knobs shift smoothly, in-line with ergonomics*Equipped with comfortable protective cover and test probe holder*Powered by AAA 1.5V x 2 batteries*Non-contact voltage (NCV) detection*12-month limited warranty *view Terms & Conditions for details
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Product
Digital Leeb Hardness Tester
TIME®5310
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Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Product
Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,30 kg
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Product
Test Service Offerings
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Product
Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Product
Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Product
Cleaner for Test Probe
EQOmat
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We have developed EQOmat, a cleaner exclusively for test probes that removes dust such as flux and solder debris adhering to the tip of the test probe. The structure and thinness built with the user's convenience in mind are important items that have sufficient functionality and are indispensable for long-term use of the probe. * EQOmat is an abbreviation for Ecological Qualified Octopus Mat.
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Product
CAM/TRAC Test Kits
Series 47
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The VP Series 47 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 47 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those wanting to provide their own ITA Interface.
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Product
Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Analyzer
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Product
Stand-Alone Test Fixture
MA 2011/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Product
Plug Solutions
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Operation based on the insertion of a plug or test probes which isolate field equipment from the relay, and provide secondary connection points for secondary injections.
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Product
ICT Probes
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ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Test Probe Leads, With 19-mm Tips And 4-mm Tips
U1169A
Accessory Kit
The U1169A consists of one pair (red and black) of insulated test leads, one pair of test probes with 19-mm tips and another pair of test probes with 4-mm tips. Recommended for use with Keysight handheld digital multimeters. Rated at CAT III 1000V, CAT IV 600V, 15A.
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Product
Battery Probes
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C.C.P. Contact Probes Co., LTD.
CCP offers a variety of different high current battery testing probes.
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Product
Mini-Link™ Miniature Jumper
Series ML-100
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Mini-Link Miniature Jumpers. Used to jumper from row-to-row or from pin-to-pin. Their miniature size makes it possible to stack one on top of the other. A convenient test probe slot is provided as well. Mini-Links are available from the factory with or without a handle, used for ease of inserting or extracting.
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Product
Exchangeable Test Fixture
MA 2109/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Product
LOADED BOARD TEST PROBES
SERIES-70
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ElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35mA test current70 18 mOhms mean73 60 mOhms mean74 40 mOhms meanMaterials and FinishesPLUNGER: Heat treated beryllium copperor steel hardened to 55-60RC70 24Kt gold plated over nickel73 24Kt gold plated over nickel74 Rhodium plated over nickelBARREL: Nickel silver70 24Kt gold plated ID and OD over nickel73 No Finish74 24Kt gold plated ID and OD over nickel
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Product
High Voltage Clip for Test Leads
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- The new Parrot clips are high voltage gripping clips for test leads and probes. High Voltage Parrot clips replace insulated alligator clips, plastic coated miniature alligator clips, small crocodile clips or large alligator clips.- Parrot Clips have a design with a new metal tube tip which is connected directly to the lead.- The tip, the hooked rod and the spring are housed in a plastic support.
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Product
IEC60068-2-75 Spring Hammer Test
CX-T03
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Shenzhen Chuangxin Instruments Co., Ltd.
*Impact hammers are used to check the durability of enclosures for electrical appliances of other electronic products.If damage occurs from the Impact Hammer test .Accessibility probes can be used to measure the extent or severity of the damage.The Impact Hammer simulates the mechanical impact to which electrical equipment may be subjected. *This hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks.* The impact tester made of stainless steel or alloy.
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Product
Probe Cards
Direct Dock
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Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Product
Probe Card Analyzers
PB3600
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The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
