Speed
See Also: Sport, Dynamometers, Motor
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Static Generating & High Speed Systems
The forces of static electricity are beneficial for many applications i.e. Bonding film to package prior to heat sealing - edge and/or web pinning at chill cylinder - bonding of protective covering to metal or wood. Many applications using DC ion production of either positive (+) or negative (-) ions to accomplish a bonding process are available.
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Precision Impedance Analyzer (20Hz to 10MHz)
ST2839
ST2839 series precision impedance analyzer is a new generation impedance test instrument by adopting the current international advanced automatic balance bridge principle. Its basic accuracy of 0.05%, the fastest test speed of 5.6ms, the frequency range of 20Hz-10MHz, and the impedance test range of up to 1GΩ can meet the testing requirements of components and materials, especially for low-loss (D) capacitors and high-quality Measurement of Factor (Q) Inductors. The four-terminal pair port configuration method can effectively eliminate the influence of the electromagnetic coupling of the test line, and expand the lower limit of the low-impedance test capability ten times lower than that of the conventional five-terminal configuration instrument.
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Ranging Sensor Heads
A ranging sensor head that is designed and manufactured for short range measurements of a moving or stationary target's range, speed and direction.
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High Speed Spectroscopy Camera
SynapsePlus CCD
Superfast electronics (up to thousands of spectra per second). Very low read noise. Best linearity in its class. Different chip types to suit every spectroscopy need. Open Electrode (OE) 1024 x 256 pixels, Front-illuminated UV enhanced (FIUV) - 2048 x 512 pixels, Front-illuminated visible (FIVS) - 2048 x 512 pixels, Back-illuminated UV enhanced (BIUV) - 1024 x 256 and 2048 x 512 pixels, Back-illuminated visible (BIVS) - 1024 x 256 and 2048 x 512 pixels, Back-illuminated deep depletion (BIDD) – 1024 x 256 pixels.
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Fluorescence Microscopes
Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Laser Tachometer
LaserTach™
The LaserTach™ ICP™ tachometer senses the speed of rotating equipment and outputs an analog voltage signal for referencing vibration signals to shaft speed. The sensor allows for measurements in excess of 30,000 RPM from distances as far as 20 inches (51 cm).
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FRAMOS SLVS-EC RX IP CORE
Sony’s SLVS-EC interface standard has emerged as the best high speed interface to Sony’s best image sensors, enabling higher throughput, greater signal integrity, and simpler designs. Engineers developing solutions using Xilinx FPGAs and SoCs can take advantage of FRAMOS’s SLVS-EC RX IP Core, Evaluation Board and tested source code examples. Device builders and camera vendors can de-risk the design while reaping the benefits of Sony’s latest high-speed interface.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Terahertz Systems
Optoelectronic Terahertz-Generation. TOPTICA provides complete systems and components for both time-domain and frequency-domain terahertz generation. For time-domain applications, the TeraFlash sets new standards in terms of dynamic range, bandwidth and measurement speed. Combining TOPTICA's FemtoFiber smart laser technology with state-of-the-art InGaAs antennas, the system achieves a peak dynamic range of more than 90 dB and a bandwidth greater than 5 THz.
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PXI FPGA Board
PXIe-8316-DSP
The PXIe-8316-DSP FPGA board is a user programmable hardware platform with an 8-lane Gen3 PXI Express (PXIe) interface. It includes four QSFP ports (16 lanes) to support High Speed Serial (HSS) connections.
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RazorMax Express 16 CompuScope 16-Bit, 1 GS/s, PXIe Gen3 Digitizer / Oscilloscope
The GaGe RazorMax Express CompuScope PXIe Gen3 x8 digitizer features unprecedented speed and resolution with either four or two 16-bit channels at 1 GS/s and 600 MHz bandwidth, and PXIe Gen3 data streaming rates up to 5.2 GB/s in a 3U Single Slot PXIe form factor.
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High Voltage 50 Ω Pulse Generator
TLP-3010C
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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ARINC 429 Test And Simulation PCI Module
PCI-C429
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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High-Performance Autoranging DC Power Module, 50V, 10A, 100W
N6752A
The Keysight N6752A is a 100 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Test Switches
RTS
STATES Type RTS Test Switches are designed to simplify and speed testing and check-out of relay, control and instrumentation systems. They eliminate the need to change connections and prevent open-circuiting CTs during tests.
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2D-3D Laser Measurement
Long range profiling laser displacement sensor is built to satisfy the most demanding automated dimension, angle, curvature and height in the industrial application. At a fast speed of 6,000 frames per second and up to 2.5µm resolution, it also has measuring of up to 800 mm.
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1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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Utility Detection Radar
DS2000
There’s a lot going on underground that you need to know about before you ever start to dig. The Leica DS2000 Utility Detection Radar finds all potential threats, including non-conductive pipes and fibre optics, increasing safety by lowering the risk of accidently hitting underground assets. Increase safety, speed up work and lower asset management costs with the ability to prevent hazardous outages and collect more information. The DS2000 betters your business by making it safer, faster and more efficient.
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Advanced TCA
ADLINK vigorously promotes the advantages of the AdvancedTCA technology by providing complete platform solutions that offer high-density processing power, faster data throughput, and intelligent system management. Designed for next-generation telecom, datacom, and equipment manufacturers, ADLINK's AdvancedTCA platforms significantly reduce over-all development costs, come with extended operating lifecycles, and speed up critical time-to-market.
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Goniometer Systems
Our Goniometetric measurement systems are optimized to provide precise measurement of angle dependent spatial radiation properties of LED luminaires, lamps and other light-producing modules. Using a variety of photometric and spectroradiometric detector options, our goniometer systems achieve optical properties as a function of angle with accuracy, precision and speed.
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VTAC Insert
The configurable VTAC high speed data insert features a data transfer rate of more than 12.5 Gbps per differential pair. Gold-plated, self-aligning contacts are specifically designed to reduce crosstalk to increase signal integrity during HSD transfers while maximizing cycle life.Each VTAC insert has a cycle life of over 150,000 without signal degradation.
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Silicon Drift Detector
Octane Elite (SDD) Series
The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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High-Performance Application and Security Load Module
PerfectStorm 10/1GE Load Module
Keysight Network Applications and Security
Equipped with powerful multi-core, multi-threaded network processors, PerfectStorm 10/1GbE is designed to satisfy the testing needs of manufacturers needing speed flexibility in their testing resources. Networking equipment manufacturers building new equipment or service providers and large enterprises integrating this them benefit from testing and verifying performance and functionality prior to deployment.
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Performance Testing Service
How an application performs under various conditions is a fundamental measure of its quality. Performance testing will ascertain and provide you with the critical knowledge of how various components of your application will perform in terms of response time, throughput, speed, scalability and stability under various conditions of load, stress and pressure. Performance Testing helps you build a rock-solidly reliable system that just works.- Determines your application’s reliability and predictability- Find and eliminate performance bottlenecks from the system- Establish performance limit benchmarks for your application- The ultimate determinant of the user’s experience quality.
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Protocol Analyzer
USB Explorer 200
The USB Explorer 200 is a non-intrusive high speed USB 2.0 protocol analyzer that enables you to display bus states, packets sent and decode descriptors of the USB protocol. It can detect errors in devices, host controllers, embedded softwares or drivers as well as measure their performance.
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Handheld Digital Tachometer
TurboTester
The TurboTester® is an innovative and cost-effective handheld digital tachometer for testing and quality control of dental handpieces and ultrasonic scalers. The TurboTester® is a non-contact instrument which measures rotational speed (rotations / revolutions per minute) of high and low-speed handpieces and the vibration frequency of ultrasonic scalers.
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Dynamically Controlled, High Speed Digital I/O PXI Express Card
GX5292e
The GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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PXIe-S5090 2-Port 9 GHz Analyzer
PXIe-S5090
The PXIe-S5090 delivers metrology-grade VNA performance and speed to National Instruments’ PXI system. This high-performance vector network analyzer allows testing of two-port devices from the bench to the production floor in a compact, modular form factor. With 138 dB dynamic range and +13 dBm maximum power, this VNA is engineered for short time to first measurement and also for high performance automation with fast test times.
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OEM, Embedded, and Custom Electronics
Picosecond timingPrecision analog and mixed signal processingDigital delay and pulse generationHigh speed photonics and fiberoptic timing distributionAerospace instrumentation and simulation
