Test Management Software
See Also: Test Management, Test Management Applications, Test Management Solution, Test Management Suite, Test Management Tools, Test Executive Software
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8FE+2FE SC Multi-Mode Managed Ethernet Switch, -40~75℃
EKI-7559MI
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2 x SC-type fiber ports, plus 8 Fast Ethernet portsRedundancy: X-Ring (high-speed recovery time<10ms), RSTP/STP (802.1w/1D)Management: Web, Telnet, Serial Console, SNMPControl: VLAN/GVRP, QoS, IGMP Snooping/Query, LACP, Rate LimitSecurity: IP/MAC, port binding, DHCP Server, IP access list, 802.1X, SNMPv3Diagnostic: Port Statistic, Port Mirroring, RMON, Trap, Email Alert, SyslogDual 12 ~ 48 VDC power input and 1 Relay OutputSupports wide operating temperature -40 ~ 75° C
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Functional Test
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A type of software testing that verifies a program's functions against its requirements, checking that the software works as expected by comparing the actual output to the expected output.
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Power Monitoring Software
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A digital tool that continuously tracks, analyzes, and manages a facility's electrical system in real-time.
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Engineering Testing
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At ARC, we know engineering testing, and with our in-house mixed signal test capabilities, we can get you the right test services for what you need. Working with our leveraged partnerships (National Instruments, Keysight and others), we can augment our standard capability with whatever test requirements you have for power, precision analog, high-speed digital, and RF testing up through to 50Ghz.
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Fluke DAQ 6.0 Application Software
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Fluke DAQ 6.0 is a powerful, versatile data acquisition application that provides effortless configuration, data logging, and analysis for the 2680A and 2645A NetDAQ Networked Data Acquisition Unit » and 2680 Series Data Acquisition Systems », plus adds support for the Fluke 2638A Hydra Series III Data Acquisition System/Digital Multimeter » and Fluke Calibration 1586A Super-DAQ Precision Temperature Scanner ».
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Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Detector Testing
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CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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QW-AddIn For Autodesk® Inventor® Software
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QW-AddIn for Autodesk® Inventor® Software is a QuickWave plug-in for Autodesk® Inventor® Software, a wide-spread mechanical tool, allowing defining a complete project for electromagnetic simulation, also periodic structures and axisymmetrical structures (V2D), directly in the popular CAD environment. A set of self-explaining dialogues provides very convenient tool for setting the electromagnetic properties such as assigning the materials, adding ports, boundary conditions, setting postprocessings and excitation parameters.Automatic mesh generation using Automatic Meshing Intelligent Generation Option (AMIGO) optimises the meshing taking into account requested wavelength resolution in all media, while avoiding unnecessarily small cells. Additionally QW-AddIn for Autodesk® Inventor® Software can be used for optimisation and parameters sweep with QW-OptimiserPlus.QW-BHM is available and heating parameters can be defined together with rotation in XY plane along axis parallel to Z axis. Creating proper axis of rotation can be done by selecting edge or solid body from the project. It will contain the middle point of selected object and its location can be modified either with the mouse or by entering new coordinates.
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Software For Autograph Precision Universal Testing Machines
LabSolutions™ AG
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The Autograph precision universal testing machines are now compatible with the latest in data integrity.Connecting TRAPEZIUM X-V to the LabSolutions system, which provides ER/ES regulatory compliance, enables confident, reliable data management.In addition to Autograph data, consolidated management is available for LC, GC, and UV data.
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Test Sets
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A set of examples used only to assess the performance of a specified classifier on unseen data.
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VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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16GE+4G SFP Managed Ethernet Switch, -40~75℃
EKI-7720G-4FI
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16 Gigabit Ethernet ports + 4 SFP ports, SFP socket for Easy and Flexible Fiber Expansion, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D) IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Performance Testing
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If you want to check the strength of your application or the server’s strength you will need to find out how much load, in terms of the number of users the application can handle. We use the Performance Testing techniques, to check the load an application can handle.
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Avionics Test
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VIAVI Solutions offers a wide range of avionics test solutions supporting engineering, factory, flightline, and return to service test requirements. Working closely with avionic OEM’s and users, we strive to develop a comprehensive and user friendly solution utilizing modern technology to meet the long term needs of the aviation industry.
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Application Lifecycle Management
ALM
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Addressing workload complexity through efficient use of Application Lifecycle Management (ALM) tools and automation to lead to upwards of 10x ROI
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Load Tests
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For the production and quality assurance of electric motors and electric drive systems, the use of flexible and customer-specific testing technology is required. Vogelsang & Benning supplies the same to the needs and the application of the customer.
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Product Lifecycle Management (PLM) Software & Solutions
Denovia
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Design Rule Manufacturing Solutions
Dassault Systèmes ENOVIA enables your organisation to securely collaborate and innovate together successfully build and execute an efficient product production plan.
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Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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16FE+4G SFP Managed Ethernet Switch, -40~75℃
EKI-7720E-4FI
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16 Fast Ethernet ports + 4 SFP ports, SFP socket for Easy and Flexible Fiber Expansion, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D). IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Composite Material Behavior Software
Helius Composite
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Helius Composite software offers detailed information on composite material behavior without finite element analysis (FEA). Use Helius Composite to integrate materials into your designs.
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Test & Development
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Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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Industrial 24G + 4 10G SFP+ L2 Managed Switch
EKI-7528-4XF24T
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24 x Gigabit RJ-45 ports + 4 x 10GbE SFP portsComprehensive Layer 2 Features: Supports VLAN, STP/RSTP, Port Trunking, and IGMP SnoopingRedundancy: X-Ring Pro (< 20ms @250units), X-ChainEfficient Deployment: IXM function enables rapid and simplified network setupEnhanced Security: Includes 802.1x, HTTPS, SSH, SNMPv3, and a Security Pack to protect against both internal and external cyber threatsManagement: SNMP v1/v2c/v3, WEB, Telnet, standard MIB, private MIBWide operating temperature range of -40~85°CRedundant 110/220VAC power inputs
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Microscopy Image Analysis Software
analySIS FIVE
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The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Calorific Value Calculation Software
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The Calorific Calculation Software can automatically calculate calorific values and generate reports that comply with BTU and ISO 6976. In addition, the target gas can be registered according to the customer’s requirement.
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Test Adapter
FECVF1600
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Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
