Geometry
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Inspect a Large Range of Part Geometries
ECHOMAC® PA Composite Tester
ensures complete inspection of the part. The system is scalable, allowing the flexibility of adding channels as needed to handle a large range of part geometries. Meets or exceeds USA, European and other international specifications in aerospace and automotive industries. MAC can supply mechanics designed to meet customer requirements ranging from inline bubbler systems to stand alone immersion tanks with part placement.
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UltraScan PRO Spectrophotometer.
Hunter Associates Laboratory, Inc.
The D65 illumination source is calibrated in the ultraviolet region for the accurate measurement of whitening agents. UltraScan PRO has an extended wavelength range into the near infrared and near ultraviolet that permits the measurement of camouflage materials and UV blockers. The system uses diffuse/8° geometry with automated specular component inclusion/exclusion. It also features three sizes of sample measurement areas with automated lens change. The UltraScan PRO includes EasyMatch QC software and an electronic record keeping version that is 21 CFR 11 compliant is available.
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Lithography Systems
When it comes to shaping what a chip can do, lithography systems lead the way by transferring intricate circuit designs onto substrates with unmatched precision. From prototyping to high-volume manufacturing, these tools define the geometry of modern microchips, as well performance.
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Probe Card Analyzers
PB6500
The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Disposable Spiral Mixers
Using simple, time-proven geometry, Nordson EFD’s patented disposable Spiral Mixers™ deliver complete and thorough mixing for a wide variety of two-part materials.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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ICP-MS spectrometers (ICP MASS)
SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
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UltraScan VIS Spectrophotometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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Thin Film Analyser
TFA
The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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Impedance Measurement
CITS880s
Finer geometries and thinner copper can present a challenge for fabricators measuring impedance on leading edge PCBs. The CITS880s answers that challenge with the introduction of Launch Point Extrapolation (LPE). LPE extrapolates the TDR response back to a point close to the start of the transmission line effectively allowing to users more accurately to measure the instantaneous or incident impedance of the line.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Fracture Mechanics Clip-On Gages
Model 3541
Jinan Testing Equipment IE Corporation
The Model 3541 is designed for determination of fracture mechanics parameters such as JIC, KIC, R-curve, fatigue crack growth rate (da/dN), and testing to standards such as E1820, E399, E647, etc. These COD gages conform to the requirements of E1820 (the replacement for E813 and E1737) for JIC and R-curve determination. Special configurations are available to meet the requirements of ASTM E399 for fracture toughness (please consult the factory for these configurations). In addition, the modified groove design complies with E1820 tests where greater stability and accuracy results from the sharper groove root. Clip-on gages are used for a variety of fracture mechanics tests, including compact tension, arc shaped, disk shaped, bend specimens or other specimen geometries in compliance with ASTM and other standards organization’s test methods. Clip-on gages can be used directly on test specimens where the knife edges are integral with the test specimen or, alternately, with optional bolt-on knife edges mounted on the test specimen.The Model 3541 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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SANA Mini Portable Interferometer
CA3005
CA3005 SANA mini is a portable, non contact fiber endface interferometer for single fiber connector. This interferometer has a high performance while the size of the instrument is incredible small. SANA mini need only a USB link to work without any external power supplies. It can test the geometry parameters of single fiber connectors such as radius of curvature, apex offset and fiber height. The data and report are generated in excel format and it is very helpful for management and analysis. SANA mini is a suitable interferometer for field usage.
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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ReMesh
ReMesh is the CAD program, which provides powerful tools for geometry creating, checking and editing. Program has tools to remesh discretely or semi-analytically specified geometry in 3D and has convenient interface for editing geometry manually. Problems with remeshing of such geometries arise in EMC simulations.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Torque Sensors
In universities and industry, for basic research or quality assurance: Kistler torque sensors guarantee precise definition of the power and friction values of drives, transmissions and pumps. Strain gage technology (DMS) is a powerful solution for measurements on rotating shafts, and also for long-term dynamic and static measurements. Maximum precision, the most rigid structure possible and high temperature stability: thanks to these assets, DMS sensors can accomplish the most demanding tasks. Piezoelectric reaction torque sensors offer convincing features such as exceptional overload protection, high signal resolution and a wide frequency range. They are ideal for measurement tasks when conditions are difficult due to geometry, temperature range or dynamics.
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Wall Thickness Measurement Gauges
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Portable wall thickness measuring device for non-destructive measurement of up to 24 mm. Thickness measurement of all non-magnetic materials such as glass, synthetic materials, stainless steel and composites; can also be used for objects with complex geometries.
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Portable Spectrophotometers
Hunter Associates Laboratory, Inc.
Measure on the go—including samples on plant production floors, in storage areas, shipping departments, or virtually anywhere that’s convenient. Our portable spectrophotometer are available in Directional 45°/0° and Diffuse d/8° geometries.
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Integrating Sphere Solutions
An integrating sphere is a light collector which takes advantage of physical geometry to homogenize any radiation being emitted inside by relying on a high-reflectance coating material. Depending on the wavelength range the end user using a sphere with, different coatings have different advantages based on the application.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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X-ray Diffraction and Elemental Analysis
D8 ADVANCE
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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High Precision Angular Positioning, Calibration and Geometry Inspection
LabStandard DUO
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.2 axis design for rotary tilting applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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Hardness Testing Devices
NewSonic’s hardness testing devices test hardness in a nondestructive way using the UCI method (ultrasonic contact impedance). The testing procedure enables quick and mobile measurements (1-second type) to supplement traditional hardness testing. The devices feature compact measurement probes which can also be used in difficult testing positions and component geometries. The areas of application include incoming goods inspection, mix-up checks, production controls, quality assurance, weld seam inspection, cut edge checks, maintenance of built-in components, as well as the replacement of dynamic hardness testing devices in the case of thin materials (below 50mm, e.g. boilers, pipes)
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Software Module for Efficient and Accurate 3D Measurement
Verisurf Measure
Measure part features and complex profile geometries informed by real-time deviation display between CAD and measured data for real-time decisions. Produce one-click inspection reports in standard or custom, shareable formats that feed to your quality management system.The Measure module’s device interface operates and optimizes most popular measurement systems making them more productive and ensuring a better return on your investment. You can also import externally captured data and process it against the nominal CAD model and tolerances. Even run datasets offline with feature extraction and pre-defined datums and constraints.
