Showing results: 8086 - 8100 of 8449 items found.
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2132 IN -
Standard Electric Works Co., Ltd
● High quality Taut Band movement.● Three insulation test voltages(DC) : 250V, 500V, 1000V.● Two continuity test on low ohms : 3Ω & 500Ω.● Compact and lightweight.● 200mA continuity short circuit current.● 1mA test current on insulation test at nominal voltage.● Automatic discharge of capacitive and inductive circuit with charge stored in the circuit under test. ● Live warning and display or external voltage presence.● Fuse, air gap, crowbar and overload protected.● On line battery monitoring shows if battery is ok.● Manual zero ohm adjustment.● Low battery consumption.● Mirror scale.● Push and turn locking switch for continuous and hand free testing.● BS 16 edition.
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1832 IN -
Standard Electric Works Co., Ltd
● High quality Taut Band movement.● Three insulation test voltages(DC) : 250V, 500V, 1000V.● Two continuity test on low ohms : 3Ω & 500Ω.● Compact and lightweight.● 200mA continuity short circuit current.● 1mA test current on insulation test at nominal voltage.● Automatic discharge of capacitive and inductive circuit with charge stored in the circuit under test.● Live warning and display or external voltage presence.● Fuse, air gap, crowbar and overload protected.● On line battery monitoring shows if battery is ok.● Manual zero ohm adjustment.● Low battery consumption.● Mirror scale.● Push and turn locking switch for continuous and hand free testing.● BS 16 edition.
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781058-01 -
NI
PXIe, 16 AI (16-Bit, 2 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXIe‑6368 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6368 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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781054-01 -
NI
PXIe, 16 AI (16-Bit, 1.25 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXIe‑6358 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6358 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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781476-01 -
NI
PXIe, 16 AI (16-Bit, 3.5 MS/s/ch), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXIe‑6378 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe‑6378 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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781217-01 -
NI
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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779670-02 -
NI
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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786458-01 -
NI
PCIe, Kintex-7 160T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device - The PCIe‑7857 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7857 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.
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779670-01 -
NI
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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NTS3700 Series -
Novtek Test Systems
FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures. A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and . In addition to FLASH, the systems can also accommodate MRAM, EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA), embedded FLASH microcontrollers and NVM based FPGA. The system's environmental chamber has a range of -55oC to +200oC and is ideal for temperature characterization of memory based devices and packages.
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PXES-2301 -
ADLINK Technology Inc.
The ADLINK PXES-2301 compact 6-slot PXI Express chassis, compliant with PXI Express and cPCI Express specifications, provides one system slot with three expansion slots and five hybrid peripheral slots, supporting a wide variety of enhanced-bandwidth testing and measurement applications. The hybrid-slot design accepts installation of CompactPCI, PXI, CompactPCI Express, and PXI Express modules in any peripheral slot for maximum flexibility. Built on a four-link PXI Express chassis with 8GB/s system bandwidth, the PXES-2301's peripheral slots are all connected with PCIe gen2 x4, with slot bandwidth up to 2GB/s. The PXES-2301 implements a smart system monitoring controller, reporting full chassis status including fan speed, system voltages, and internal temperature.
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ADTS-2000 -
TestVonics, Inc.
TestVonics ADTS-2000 Test Set is a portable, high precision, dual channel air data pitot static test system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The ADTS-2000 meets all requirements of the KTS-2000 , P/N: 18910920000, P/N: 18910920001, P/N: 18910920002, or having NSN: 4920-01-588-4428 and NSN: 4920-01-554-4549 . The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-2000 accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.
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980 12G -
Teledyne LeCroy quantumdata
The Teledyne LeCroy quantumdata 980 12G-SDI Video Generator / Analyzer module supports video and audio functional testing of next gen broadcast monitors, conversion devices and sources up to 12G-SDI. The module is equipped with four (4)12G-SDI-capable output ports. The output ports can be aggregated for Dual link HD-SDI and Quad link 3G-SDI operation. A genlock input supporting both SD analog black burst and HD tri-level to sync the output clocks with a "house sync" but the module can also run off its internal clock. The module's four (4) SDI input ports can also be aggregated for Dual link HD-SDI and Quad link 3G-SDI operation. For single link operation only port 1 on the input or output is functional.
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Protector Adjustable Family -
Test Electronics
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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PI-2500 -
ETI Precision
The PI-2500 is a versatile and technologically advanced primary injection tester capable of testing circuit breakers up to 2000 amperes frame size. It incorporates a low-impedance output transformer with dual secondaries to provide optimal impedance matching to a wide range of breaker sizes. High-capacity internal fan cooling allows maximum utilization of the output transformer and faster recovery after overload conditions. It is housed in a rugged aluminum frame enclosure with removable sides allowing easy access to all internal components to facilitate ease of service and maintenance. The output of the test set is controlled by means of a proven SCR controller. This provides precise initial phase angle control to reduce DC offset for inductive loads and more consistent pulse currents.
