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Custom Test Fixtures
Cortek Test Solution’s design capabilities range from very basic to extremely sophisticated solutions. Developing custom test fixtures demands more engineering time as well as an in-depth knowledge of mechanical design, pcb test methods paired with precision machining. Our experienced engineers will evaluate your requirement and design innovative mechanical test fixtures to meet your application needs in both the R & D and production environments.
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Signal Chain µModule Receivers
µModule®
Analog Devices µModule® (micromodule) receivers consist of high performance, high speed ADCs with fixed-gain, high speed amplifiers and antialias filters. Our integrated ADC and driver products include integrated bypass capacitance and simplify the high frequency layout required to preserve ac performance. The board space savings are significant for instrumentation applications such as spectrum analyzers, oscilloscopes ,and communications test equipment, or for communications applications such a...show more -
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EasyEXPERT Group+ Software (for PC)
Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a ...show more -
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PXI/PXIe Wide Current Range Multiplexer Module, Single 24-Channel, 1-Pole
42-514-108
The 40-514-107 (PXI) and 42-514-107 (PXIe) are low density multiplexers in dual 12-channel, 1-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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PXI-6733, 16-Bit, 8-Channel, 1 MS/s PXI Analog Output Module
778512-01
16-Bit, 8-Channel, 1 MS/s PXI Analog Output Module—The PXI‑6733 is a high-speed analog output device designed to deliver simultaneous, multichannel updates for control and waveform output applications, such as stimulus-response tests (including acoustic distortion testing) and simulation (such as three-phase power simulation). In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24‑bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PX...show more -
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PCI Resistor Card 2-Channel 2 Ohm to 32.7k Ohm With SPDT
50-293-132
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Cable/Harness Tester
LX-650
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface;．·Up to 1000Vdc/700Vac Test Voltage．·256 Max. Test Points．·Auto Scan and Auto Pin Search．·The system provides advanced instant open-circuit, short-circuit, continuity test．·Intermittent Conductance Test．·Intermittent Open/Short Test．·Providing Double-End/Single-End Testing．·Large 320×240 LCD display．·Full Programming Sequence Test．·Versatile I/O Ports for application．·Statistics and Print Function
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 255 Ohm
50-294-013
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Programming Interface for CMC Test Sets
CMEngine
CMEngine is an open programming interface that enables you to integrate the CMC test sets into your own testing environment and control them within any type of application.
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JTAG Visualizer
JTAG Visualizer is an advanced graphical viewer and data management system for PCB schematics and layouts. Visualizer integrates seamlessly with the JTAG Technologies family of boundary-scan products, such as the ProVision application development platform, and accepts PCB data from a variety of CAD, CAM and EDA tools. In design Visualizer provides DfT (design for test) feedback to the user by enabling a graphical view of fault coverage on their design. In manufacture and test Visualizer can be used to highlight faulty nets (short circuits, opens, stuck-ats etc.) in both layout and schematics views.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 62.1Ω
40-253-111
The 40-253-111 is a programmable resistor module with 1 channel which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI Resistor Card 2-Channel 1.5 Ohm To 1.02k Ohm
50-293-021
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Test Gauges
The Ashcroft 1082 test gauge is a precise instrument acclaimed for dependability, safety and performance. Used for test and validation, its manufacture is continuously monitored to assure uncompromising standards and material integrity. An ideal choice for satisfying most applications and installation requirements needing highly-reliable precision instruments.
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recordi...show more -
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RJ-9, RJ-10, RJ-22 Test Connector
Test connector (4 pole) for contacting RJ-9, 10, and 22 interfaces. Applications in mini phones, headsets, etc.
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High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Network Testing Tools
Network IP traffic packet generators are used for network performance testing under maximum or partial throughput conditions. Network health can be analyzed by network traffic measurement in a testbed network, using an IP network traffic generator such as IP Traffic Test and Measure. The traffic generator sends packets, often with a unique packet identifier, making it possible to keep track of the packet delivery in the network.Network impairment simulation (emulation) is a technique for testing...show more -
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Plug-in Modules for High-Performance Testing
D Series
With the invention of the D Series line, Introspect Technology has revolutionized the way product engineers test high-speed digital applications. Our unique plug-in module design allows for high-performance testing on any load board and eliminates the need for cables. Despite the continuous transformation of the test industry in recent years, a growing number of legacy equipment remain in use.
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PXI 3A Power MUX BRIC, 15-Channel, 16-Pole
40-571-205
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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cRIO-PB-MS, Master/Slave, C Series PROFIBUS Interface Module
781352-01
Master/Slave, C Series PROFIBUS Interface Module - The cRIO-PB-MS connects NI programmable automation controllers (PACs) to PROFIBUS industrial networks as powerful masters or slaves. The interface includes the NI‑PROFIBUS for CompactRIO instrument driver for human machine … interface (HMI) and SCADA applications, as well as a graphical networking Configurator software. You can perform PROFIBUS device automated test using these interfaces. The cRIO-PB-MS is compatible with only CompactRIO systems.
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System for Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel
SierraNet M328Q
The SierraNet M328Q™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with two QSFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328Q includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Data Distribution Middleware
ADS2 Product Family
The high degree of flexibility of ADS2 is achieved through a clear and straight forward architecture design paired with a highly optimized implementation of its components.- A deterministic publish-subscribe data distribution and scheduling middleware- Adapters for a wide range of client applications and third party tools- HW adapters for a wide range of I/O interfaces- A set of native tools for data visualization and analysis, recording and replay- A comprehensive system health monitor- Human readable system configuration files (structured text)- Scriptable generation of system configuration files- Automatic test execution for high level requirement based test definitions
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High Speed Camera Systems
HotShot e1024
The HotShot e1024 is perfect for a multitude of high speed applications including: human / veterinary biomechanics analysis, research, design & test, production and manufacturing, to name a few.
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OSA - OEM Modules
Optoplex’s near-infrared optical spectrum analyzer module (NIR OSA) is a high performance optical spectral engine for Process Analytical Technology (PAT) and Fiber Optic Test Equipment (FOTE) applications. Based on proprietary technologies, Optoplex’s OSA module offers much higher spectral resolution capability than those available in the market, which is demanding in today’s increasing spectroscopy applications. Other features include: compact, light-weight, low power consumption and wide wavelength coverage. Optoplex’s compact OSA engines are suitable for a variety of handheld, portable, bench-top and inline OSA/spectrometer applications.
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PXI 3A Power MUX BRIC, 8-Channel, 6-Pole
40-571-401
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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Two-Way Optical Loss Test set
KI23403OLV-INGAAS-APC
A Dual Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on multimode fiber at 850 / 1330nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. A multimode APC connector on this model is required for reliable ORL test performance.
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Walk InDrive In Chamber
Shanghai Morningtest Environmental Chambers Co.,Ltd.
Walk in/Drive in chambers can make test for large components, finished products like automobile.According to different test requirement and application, walk in chamber could divide into 2 types: Welded walk-in chamber and Modular walk-in chamber.
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PCIe-6353 , PCI Express, 32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO Multifunction I/O Device
81049-01
PCI Express, 32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO Multifunction I/O Device - The PCIe‑6353 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality … leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent a...show more -
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PCI 6 Channel Precision Resistor Card
50-297-003
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
