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Low & High Voltage Differential Probes
T3
Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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Test Targets & Charts
APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.
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Cyber Security Testing Services
Cyber security testing is often also referred to as pen testing or penetration testing. Such tests validate the cyber security defences of your applications, network infrastructure and even your team members. Our cyber security testers are highly trained and certified ethical hackers.
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Frequency Counters
Frequency Counters measure frequency, period, time interval, pulse width, duty cycle, frequency ratio, phase, and more. Frequency counter products include options that are compatible with Astronics/Racal VXI-2461C, which can be used for automated test aerospace and defense applications.
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PXIe-4480, 1.25 MS/s, 3.4 Hz AC/DC-Coupled, 6-Input PXI Sound and Vibration Module
784277-01
1.25 MS/s, 3.4 Hz AC/DC-Coupled, 6-Input PXI Sound and Vibration Module—The PXIe‑4480 is designed for high-bandwidth audio, acoustic, and vibration measurements. It provides six channels of dynamic signal acquisition, and you can use one of four gain settings to configure your input range. The PXIe‑4480 also includes software-configurable AC/DC coupling, charge measurement, voltage excitation, IEPE excitation, and TEDS support, making it ideal for measuring acoustic transducers, pressure sensors...show more -
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Tri-Temp Test Handler
SIA-118 Series
Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB conta...show more -
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PXIe-4154, 2-Channel, 8 V, 3 A PXI Programmable Power Supply
781155-01
2-Channel, 8 V, ±3 A PXI Programmable Power Supply—The PXIe‑4154 is a specialized programmable power supply for battery simulation. It is designed to simulate a lithium‑ion battery cell’s transient speed, output resistance, and 2‑quadrant operation (source/sink). Critical to many RF and wireless applications, the simulator’s fast transient response time allows it to rapidly respond to changes in load current with minimal voltage dip, which makes the PXIe‑4154 ideal for powering devices under tes...show more -
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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PXI-6238, 8 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sourcing DO, Bank-Isolated, PXI Hybrid, Multifunction I/O
779624-01
8 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sourcing DO, Bank-Isolated, PXI Multifunction I/O Module—The PXI‑6238 is a bank-isolated DAQ device designed for current I/O. It offers analog I/O, digital input, sourcing digital output, two 32‑bit counters, and digital triggering. The digital input and outputs are compatible with 24 V signals. It combines the safety and performance benefits of isolation with high-performance timing, amplification, and calibration technologies to offer accurate measurement...show more -
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ERP Testing
Signing up for an ERP package is a big decision for any enterprise since it is closely related to key business processes and has the potential to significantly enhance the customer service and experience. To ensure an optimized return on investment, it is critical to have a successful roll-out with the desired features and benefits. With a high failure rate for ERP implementations, it is very crucial to have a comprehensive QA strategy and expertise. TestingXperts offers you specialist QA and so...show more -
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Mass Burette Flow Detector
FX-1100 Series
The FX-1100 Series Mass Burette Flow Detector takes the position of the fluid surface inside the burette as the head pressure using the differential pressure detector attached at the bottom and directly measures the flow of fluid as a mass based on changes in this pressure. It does not require calculation correction of temperature and specific gravity, and has many advantages such as high accuracy and extremely less affected by air bubbles, which enable to measure fuel consumption in the tests such as chassis dynamometer and engine bench. The 3 models are available according to the measurement range and application.
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Digital Controller
SPARC Controller
SPARC Brake is a digital controller optimized for Inertia Brake Dynamometers. As a member of the SPARC family of universal controllers, SPARC Brake is using a modular design to enable more flexible configurations to fulfill any specific test environment.SPARC Brake uses sophisticated control algorithms and provides superior and intelligent control of brake actuators with highest control accuracy to cover the wide range of brake test applications. From simple static brake testing to high dynamic simulation procedures, it is able to meet the highest demands for today’s and tomorrow’s brake test requirements, for example GM-TIP.
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Bias Network, 45 MHz to 50 GHz
11612B
The Keysight 11612B broadband high power bias network can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying dc bias to the center conductor of the coax connector for your device while blocking the dc to the RF port.
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USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users wit...show more -
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Insulation Meter
HT7051
HT7051 has been developed to measure insulation resistance with test voltage programmable up to 5kVDC and measuring range up to 10TΩ which makes it very useful in any industrial application (tests on electric machines, power transformers, electric cables, electric boards, generic devices, etc.) within BT.
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Test Services
Our services cover all aspects of test, from test plan generation; to hardware and software development; to validation, correlation, ramp and production. Our experts have deep experience in digital, memory, mixed-signal and RF applications. We also specialize in secured applications that require personalization/root of trust during backend production.
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PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital mo...show more -
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user level...show more -
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USB-6366, 8 AI (16-Bit, 2 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device
782264-01
8 AI (16-Bit, 2 MS/s), 2 AO (3.33 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6366 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6366 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Programmable Multifunction Generator
IST 5800/5850
IST Information Scan Technology, Inc.
The IST-5800 series programmable multifunction generator is an exceptionally versatile and economical instrument for applications in R&D, Manufacturing Test, Service Repair and Training. Featuring an adjustable triple output power supply and waveform generator, it has the ability to provide power and signal sources for a circuit while the universal logic probe, auto-ranging frequency counter, and digital voltmeter allows you to simultaneously analyze and measure circuit activity.
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General Purpose Switches
SMX-5XXX (General Purpose)
The VTI SMX-5xxx Series of general purpose switches deliver exceptional performance and reliability by implementing extensive signal path shielding, isolation and built-in health monitoring. Embedded virtual schematic control simplifies setup and debugging, allowing all relays to be engaged independent of application software and device drivers.Ideally suited for a wide range of discrete signal switching, the SMX-5xxx Series provides uncompromised measurement integrity ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.
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PXI High Density MUX BRIC, 12-Chan, 40-Pole
40-570-213
This range of High-Density Multiplexer is part of our BRIC family. These MUX's are designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is also possible, without limitation). These multiplexers are ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. They are available in a variety of configurations that allow tes...show more -
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PXI High Density MUX BRIC, 4-Chan, 40-Pole
40-570-211
This range of High-Density Multiplexer is part of our BRIC family. These MUX's are designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is also possible, without limitation). These multiplexers are ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. They are available in a variety of configurations that allow tes...show more -
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Surface-Mount Noise Sources
Mercury’s family of surface-mount noise sources provides exceptional performance in a compact and easy to integrate package. These products are ideal for applications such built-in test and dithering circuits where the system requirements drive a need for compact, surface mount technology.
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Brake Testing Technology
Maschinenbau Haldenwang GmbH & Co. KG.
The brake test technology is mainly used to test the effectiveness of the braking system of motor vehicles. Depending on the application, roller brake testers or a deceleration measuring device are used. These are available in different versions depending on the type of vehicle and the structural situation.
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PCI Resistor Card 4-Channel 1 Ohm To 63.7 Ohm
50-293-011
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Automated DC Parametric Curve Tracer
MultiTrace
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 510 Ohm
40-294-014
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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SoftTest Design Testing Services
We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
