EFT
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Electric Fatigue Testing Machine
EFT Series
Jinan Testing Equipment IE Corporation
EFT series electric fatigue testing machine is an ideal platform to test a variety of materials and components for the following high demanding tests: Quasi-static test; Reverse-stress mechanical low cycle fatigue loading tests (LCF); High temperature creep, stress-rupture, relaxation tests in load/strain control mode for medium-term or long term period. Mechanical fracture tests like crack growth & toughness tensile/compression test for ceramics in both room- or vacuum-, high- temperatures up to 1200 C conditions etc. Compression test on plate springs or clutch springs etc. It is also widely used to evaluate the mechanical properties of biologic materials, composites, orthopedic fixation devices, prostheses, spinal constructs, stents, dental implants, elastrometric materials, etc. It adopts electric actuator structure with all-elastic, backlash free, central ball-lead screw driving to achieve direct force transmission to the specimen, it is especially a perfect choice for R&D institutes, universities, nuclear power, automotive and aviation, & aerospace sectors from metals, composites, ceramics, springs and component parts.
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Steering Diodes
ProTek's low capacitance Steering Diode Arrays provide high-speed data line and I/O port protection from transients caused by Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), Tertiary Lightning and other induced voltages. Steering diodes divert the transient to the power-bus or ground and away from sensitive IC components.
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25G Febry-Perot Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s FP lasers are designed for operation up to 25G, and are targeted at 4G and 5G Fronthaul applications. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability and have the following benefits : *Etched Facet Technology enabling high performance and product uniformity*Industrial temperature operation from -40ºC to 95ºC, ideally suited for 4G and 5G fronthaul applications*Non-hermetic capability suited for low cost or datacenter applications*High back-reflection rejection, enabling low cost packaging without the need for isolators
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Accessory EFT/Burst generators IEC 61000-4-4
The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
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10G Distributed Feedback Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s Distributed Feedback (DFB) laser diodes are designed for direct modulation uncooled operation up to10Gb/s. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability with the following benefits: *Etched Facet Technology enabling high performance and product uniformity*Wide operating temperature range for wireless, PON and datacenter applications*No isolator required due to high back-reflection rejection
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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2.5G Distributed Feedback Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s Distributed Feedback (DFB) laser diodes are designed for direct modulation uncooled operation up to 2.5Gb/s. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability with the following benefits: *Etched Facet Technology enabling high performance and product uniformity*Wide operating temperature range for wireless, PON and datacenter applications*No isolator required due to high back-reflection rejection
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EFT/Burst Simulators
Suzhou 3ctest Electronic Co.,Ltd.
High-end test instrument of EFT/Burst for new energy, which fully comply with CE and CCC certification. With a built-in three-phase five-wire automatic coupling /decoupling network EFTN 69100T, it can meet the requirements of new energy test system and high power load test. It is featured with good reliability, stable performance and easy use.
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25G Distributed Feedback Lasers
Macom Technology Solutions Holdings Inc.
MACOM’s Distributed Feedback (DFB) laser diodes are designed for direct modulation uncooled operation up to 25Gb/s. These products utilize patented Etched Facet Technology (EFT) for exceptional reliability with the following benefits: *Etched Facet Technology enabling high performance and product uniformity*Wide operating temperature range for wireless, PON and datacenter applications*No isolator required due to high back-reflection rejection
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IEC61000-4-4 4.8KV Electrical Fast Transient Immunity Generator
EFT-404BX
Shenzhen Chuangxin Instruments Co., Ltd.
EFT-404BX Impulse Generator is fully met requirements of the standards IEC61000-4-4 and GB/T17616.4.
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EFT Immunity Measurement
EFT61000-4
EFT immunity tester EFT61000-4 is specially designed according to the characteristics and requirements of EFT measurement and it is an ideal disturbance source of EMS measurement. They have fine performance, such as high stability, high reliability, easy to use etc. It meets the standard requirements of IEC 61000-4-4, EN 61000-4-4, GB/T17215.301, GB/T17215.322 and GB/T17626.4. EFT61000-4 has LCD display in both English and Chinese.
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Immunity
EFT coupling
s used for direct-contact measurements of impulse immunity in IC pins, according to IEC 62215-3 and IEC 61000-4-4.
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Group Pulse Generator
STT-EFT-5K series
Beijing KeHuan Century EMC Technology Co,.LTD
STT-EFT-5K series group pulse generator is designed to determine a common and reproducible basis for evaluating the performance of electrical and electronic product power lines, signal lines or control lines when subjected to electrical fast transient pulse group interference. The performance of the generator meets the requirements of IEC 61000-4-4 and GB/T 17626.4 standards. Application areas: industrial control, home appliances, medical electronics, communication electronics, components, automation control, etc...
