In-circuit
See Also: Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
ICT: In-Circuit Testing
XILS In-Line Handling Solutions
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Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
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Product
High-Frequency Probe, 300 kHz to 3 GHz
85024A
ICT/FCT Probe
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Product
Stand-Alone Programmer and Hardware Debug Interface
Cyclone MAX
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Cyclone MAX is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale ColdFire V2/V3/V4, Power Architecture 5xx/8xx, Power Architecture 55xx/56xx (Nexus), and ARM (MAC7xxx) microcontrollers.
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Product
Aeroflex AIDE
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This programming environment for analog and digital in-circuit test and function test allows a high depth in the realization of inspection tasks. We have many years of extensive experience in dealing with AIDE.
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Product
USB Male A to Male Mini B Cable (length 12″)
SKU-043-07
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12″ inch Male-A to Male-B mini USB cable. Use this cable to connect In-Circuit Programmer/Loader to your host PC.
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Product
Active Differential Probe, 100 kHz to 7 GHz
U1818A
High Frequency Probe
The Keysight U1818A 100 kHz to 7 GHz active differential probe makes it easy to perform high frequency in-circuit measurements using network, spectrum and signal source analyzers. With flat frequency response, low noise floor, and direct power from instrument connection, the U1818A allows measurements to be made while taking full advantage of Keysight's RF analyzers dynamic range.
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Product
Testability analysis
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Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Product
In-Circuit Tester
IP-5000, IP-5300
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The IP-5000 series is a space-saving high-speed board inspection device with a compact design.
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Product
Switching Matrix
MUX
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The Analog Signal Switch Unit serves as a 6-bus interconnect for 128 pins each to the Analog Measurement Unit (AMU05) for the In-Circuit test.
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Product
In-Circuit Emulator
DS-51
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* Real-Time and Transparent In-Circuit Emulator * Supports Most of the 8051 Derivatives * Emulates 1.5V to 6V Microcontrollers * Maximum Frequency of 42MHz * 64K/512K of Internal Memory with Banking Support * 32K Trace Memory "on the Fly" * 64K Hardware and Conditional Breakpoints * MS-Windows and Keil ?Vision Debuggers * Source-Level Debugger for Assembler, PLM and C * On-Line Assembler and Disassembler * Performance Analyzer * Serially linked to IBM PC at 115 Kbaud
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Product
Test plug
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ENGMATEC produces industrial, highly wear-resistant contact plugs for in-circuit and functional tests. They have been specially developed for a very large number of test processes, as they often occur in a wide variety of industries in the production process.
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Product
RealProbe RF Probes
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Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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Product
In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Product
Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Product
PXI Waveform Digitizer
PXD731x/70xx
Waveform Digitizer
Digitize high-resolution waveforms with the fully isolated PXD Series digitizers. Minimize interference and measure "in-circuit" within circuits. Measurement errors are reduced by a high input impedance.
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Product
Deep And Sloped Pan Fixtures
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Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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Product
High Node Count In-Circuit Test Fixtures
HNC Test Fixture
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Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.
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Product
Test System Elowerk
eloZ1
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
ICT Test Probes
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C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Product
Modular Relay Board
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Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
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Product
ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
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The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Product
Power Architecture 5xx/8xx In-Circuit Debugger
ICDPPCZ
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P&E's ICDPPC for Windows is a powerful tool for debugging code. It uses the processor's background debug mode (BDM), via the ICD cable, to give the user access to all on-chip resources. The ICDPPCZ software works with Freescale's MPC5xx/8xx devices.
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Product
In-System Programming (ISP)
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Modern assemblies today usually require on-board or in-system programming. The in-system programming (ISP) on the in-circuit test adapter represents the ideal solution for optimizing processes in ongoing electronics production.
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Product
In-System Programmer for ARM
MPQ-ARM
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Supports Nuvoton M05x and NUC1xx device families Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Product
In-Circuit Debugger for RS08 Family of Microcontrollers
ICDRS08
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P&E's ICDRS08 is a powerful tool for debugging code. It uses the processor's background debug mode Module(BDM), via any of P&E's RS08 compatible interfaces (see product add-ons for more information), to give the user access to all on-chip resources.
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Product
Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
I3070 In-Circuit Test System Software
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Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
