- Pickering Interfaces Inc.
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LXI Microwave Matrix, 20GHz, Single 4x4, Terminated
60-751-144-B
The 60-751-144-B is a single4x4 20GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Double Monochromator
Gemini 180
The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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High Frequency Coaxial Analytical Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm differential, single-ended probe.
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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Optical Light Source
Shenzhen Sharingtek Communication Co., LTD
Is used to emit electromagnetic radiation in order to perform a specific task, whether detecting faults, breaks and microbends, characterizing link-loss or certifying LAN/WANs.
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Remote Radio Head Test, Reference Solution
The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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SignalShark® - Real-Time Outdoor Remote Analyzer
Real-Time Outdoor Remote Analyzer for the Detection, Analysis, Classification and Localization of RF Signals between 8 kHz and 8 GHz. Supports automatic direction finding and localization via AoA and TDOA. For fixed installation or semi-static use on demand. Solves complex measurement and analysis tasks reliably and quickly with outstanding RF performance. Windows 10-based open platform for third-party applications. The "SignalShark 3330 Outdoor Unit" series is characterized by a robust and weat...show more -
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Slide Screw Tuners
Slide screw tuners are particularly suited to establishing impedances for device characterization, or for any other application requiring a precisely repeatable mismatch condition. This is due to the precision with which a specific matching condition can be repeated if the tuner has calibrated position indicators.
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Sample Holder
In combination with the PES measuring system, sample holders from aixACCT Systems are now practically standard for the characterization of piezoelectric materials.
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Software
Srive-Level Capacitance Profiling (DLCP) Measurement
Materials Development Corporation
Drive-levelcapacitance profiling is an extremely useful technique to characterize amorphoussilicon or other semiconductor material with large concentrations of deep band gap states.
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Computery Control Torsion Tester
SG-L10
The machine is mainly used for torsion test of metal and nonmetal,also it is applicable to the torsion test of parts and members. Servo-motor and cycloid gear reducer are introduced to the loading system in this product, the system for measuring torque and distortion angle are composed of high accurate torsion sensor, photoelectric encoder and computer measuring force.It possesses automatically tracking test torque and distortion angle, maintaining maximum peak load and displaying loading speed....show more -
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Light Analysis
Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic...show more -
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Variable Angle Spectroscopic Ellipsometer
VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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PXIe-5654, 10 GHz or 20 GHz RF Signal Generator
783126-01
The PXIe‑5654 features an ideal combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe‑5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications.
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Power Operational Amplifiers
ST offers a portfolio of power op-amps characterized for high output current, low drop and high gain. This makes them suitable for a wide range of applications and, in particular, for driving inductive loads such as motors and lamps, as well as in automotive applications offering superior performances. Our op-amps are available in insertion and surface-mount packages to meet different environmental requirements.
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Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm diffenrential, single-ended probe.
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Combination Measurement Workstation
WS500
The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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Oil Testers
PeakTech Prüf- und Messtechnik GmbH
This device was developed for the quick and reliable testing of frying oils in the catering trade, commercial kitchens and also for private users. With the device settings it is possible to display the oil temperature of the deep fryer. By measuring the TPM value (Total Polar Materials) the content of polar substances can be determined, which is a reliable parameter to characterize the extent of aging of the frying oil / frying fat during frying.
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nductive Proximity Sensors
Millions of inductive proximity sensors are currently in use in virtually all industries. They detect metal objects without contact, and are characterized by a long service life and extreme ruggedness. With the latest ASIC technology, SICK's sensors offer the ultimate in precision and reliability. SICK can provide the right solution to meet your requirements every time – from cylindrical or rectangular standard sensors with single, double or triple operating distance, to special sensors for explosive zones and harsh environments. Our sensors are the intelligent, reliable route to implementing industry-specific and customized solutions to any task involving automation.
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Science-Grade MWIR InSb Camera
FLIR A6700 MWIR
Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6700 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements. In fact, the camera’s image output can be windowed to increase frame rates to 480 frames per second to accurately characterize even higher speed thermal events, helping ensure critical data doesn’t get missed during testing.
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Differential Scanning Calorimeters
MicroCal DSC Range
The "Gold Standard" for structural stability analysis of biotherapeutics, biological macromolecules and polymers in solution. Are microcalorimeters are powerful tools which enable characterization of the thermal stability of proteins and other biomolecules, primarily for biopharmaceutical development and manufacture. They are used for general stability studies, for biosimilarity and batch-to-batch comparability assessment, and for the optimization of purification and manufacturing conditions. MicroCal PEAQ-DSC systems are simple to use, requiring little assay development, and no labelling or immobilization.
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Controlled Impedance Analyzers
HYPERLABS Controlled Impedance Analyzers can be used with various probes and adapters to quickly and reliably characterize impedance on PCB test coupons. These Test Systems are designed to comply with IPC-2141A standards for PCB coupon testing, and can be customized to meet specific customer needs.
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High-Channel Density Precision SMU
PZ2100 Series
PZ2100 source measure unit (SMU) solution. Focus more on characterization and less on synchronization, with multiple SMU module options and up to 20 SMU channels within a 1U rack space. Speed time-to-market with less programming, simplified system integration, and application-specific measurement capabilities.
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Component Test and Analysis Laboratories
The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testin...show more -
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Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Ferroelectric Tester
Premier II
The Precision Premier II, is one of Radiant's most advanced test systems. The Premier II has the large envelope in terms of frequency response, voltage range, and accuracy of any ferroelectric tester in the world. Vision Software is provided with the Premier II Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choice from.
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PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument
786320-01
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
