Interface Test Adapters
Interface Test Adapter; Interface Connector Adapter: Interface Device Also known as: ITA
See Also: Test Adapters, Interface Adapters, ITA
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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USB-8506 , LIN Interface Device
784664-01
1- or 2-Port, USB LIN Interface Device—The USB‑8506 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The USB‑8506 is powered over the USB bus and does not require external power. The USB‑8506 excels in applications requiring logging or manipulation of hundreds of LIN frames and signals, such as in-vehicle data logging, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move LIN frames and signals between the interface and the user program without CPU interrupts, minimize message latency, and free host processor time. The USB‑8506 is available with a three‑pin COMBICON synchronization connector for triggering and synchronizing the internal hardware timebase with other devices.
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PCI-8513, 1‑Port, Software‑Selectable/FD CAN Interface Device
780684-01
1‑Port, Software‑Selectable/FD CAN Interface Device—The PCI‑8513 is a controller area network (CAN) flexible data-rate (FD) interface for developing applications with the NI‑XNET driver. NI‑XNET software-selectable CAN interfaces offer the best flexibility for CAN development with onboard transceivers for high-speed/FD, low-speed/fault-tolerant, and single-wire CAN as well as any external transceiver. The PCI‑8513 excels in applications requiring real‑time, high‑speed manipulation of hundreds of CAN frames and signals such as hardware‑in‑the‑loop simulation, rapid control prototyping, automation control, and more. The NI‑XNET device‑driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts.
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USB-8486, USB, 1-Port, Fieldbus Interface Device
781160-02
The USB‑8486 is a FOUNDATION fieldbus device for developing applications with the NI‑FBUS driver, NI‑FBUS Configurator, and NI‑FBUS Monitor. FOUNDATION fieldbus is a popular industrial communication standard for process control applications. The NI‑FBUS Configurator features user-friendly multi-window interfaces to provide tools for the complete configuration, programming, and execution schedules of FOUNDATION fieldbus segments. The NI‑FBUS Monitor is a stand-alone application used to monitor, debug, and analyze fieldbus data packets.
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In-Line RF Test Platform
AR925
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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In-Line RF Test Station
AP770
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Mini Pneumatic, Contact, ITA, Push-in Fitting, for 4 mm OD Tubing
610132111
Primary mating contact 610131111.Please note: This contact cannot be used to fully populate any compatible VPC module. The larger head size prevents directly adjacent placement.
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PXI-8511, 1‑ or 2-Port, Low-Speed/Fault Tolerant PXI CAN Interface Module
780686-02
1‑ or 2-Port, Low-Speed/Fault Tolerant PXI CAN Interface Module—The PXI‑8511 is a fault-tolerant Controller Area Network (CAN) interface for developing applications with the NI‑XNET driver. The PXI‑8511 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals, such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimize message latency and freeing host processor time for processing complex models and applications.
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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Interface
RAR15XF-TB
On-board firmware, large data buffers, and a high-level API are integrated to provide total flexibility in monitoring and generating ARINC bus traffic. Simultaneous scheduled and burst mode (FIFO) messaging is supported on all ARINC 429 transmit channels. Each ARINC 429 receive channel provides simultaneous dedicated and buffered mode storage, along with label/SDI filtering.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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PCIe-8433, PCI Express, 2-Port, Isolated, RS485/RS422 Serial Interface Device
781745-01
The PCIe‑8433/2 is a high-performance industrial interface for high-speed, port‑to‑port isolated communication with RS485 and RS422 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. You can also select between 4‑ and 2‑wire transceiver modes for full‑ and half‑duplex communication. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Scalable Tester System for Functional Testing
UTP6010
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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1553 Avionics Interface 3U CPCI Card
QCP-1553 Series
The QCP-1553 module is a rugged, reliable, full featured, Compact PCI module designed to provide a stand-alone, MIL-STD-1553A/B interface for avionics applications. Up to four independent dual redundant MIL-STD-1553 databus streams are supported by the 3U QCP-1553 module. Additionally, the module offers full functional test, simulation, monitoring and databus analyzer functions for MILSTD-1553A/B applications. An onboard IRIG-B time code decoder and generator allows users to accurately synchronize single or multiple QCP-1553 modules to a common time source. The QCP-1553 module is available in dual or full function (RT simulation, monitoring, and bus controller) configurations.
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cRIO-PN-S, Slave, C Series PROFINET Slave Interface Module
782131-01
Slave, C Series PROFINET Slave Interface Module - The cRIO-PN-S connects NI programmable automation controllers (PACs) to PROFINET industrial networks as powerful slaves. The interface includes the NI‑PROFINET for CompactRIO driver for human machine interface (HMI) and supervisory control and data acquisition (SCADA) applications. You can perform PROFINET device automated test using these interfaces. The cRIO-PN-S is only compatible with CompactRIO systems.
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Power Adapters
ADP-PS-433
The ADP-PS-433 power adapter provides power and reset buttons as well as an easily accessible power connection to the WINSYSTEMS SBC35-427 single board computer. This power connector offers a highly reliable and secure connection to the external power supply allowing easy access to physically remove power from the front I/O panel.
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PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 36" cables
510150154
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to NI PXI-2529 with six 36" cables
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Interface
R15-EC
The R15-EC card provides the highest level of performance and density for MIL-STD-1553A/B in an ExpressCard form factor. The R15-EC card provides 1 or 2 channels integrated with powerful API software that provides instant access to all 1553 databus functionality and data. Standard features include real-time bus playback (with ability to edit out RTs), aperiodic message insertion, error injection/detection, conditional BC branching, 64-bit, 25 nanosecond message timetagging, and “Oneshot” BC operation. The Bus Monitor mode provides 100% bus monitoring of a fully loaded 1553 bus. IRIG-B Receiver (AM or DC/TTL) Generator (DC/TTL) optionally available.
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16 GHz Differential Probe with ProLink Interface
DH16-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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PXI-8431/2 , 2-Port, RS485/RS422 PXI Serial Interface Module
778984-01
2-Port, RS485/RS422 PXI Serial Interface Module - The PXI‑8431/2 is a high-performance interface for high-speed communication with RS485 and RS422 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. You can also select between 4‑ and 2‑wire transceiver modes for full- and half-duplex communication. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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2U Through 6U Customized RF Interface Unit
1257A-C
The Astronics 1257A-C is a sixth-generation RFIU tailored to your specifications. It comes with a new easy-to-use LXI Core 2011-compliant device and new enhanced features, including 2U through 6U configurations.
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Interface
EPMC-1553-8
Abaco Systems EPMC-1553-8 is the first PMC (PCI Mezzanine Card) module to offer 8 dual redundant MIL-STD-1553B Notice II channels. Available in commercial, ruggedized and conductively cooled versions with eight dual-redundant channels, the EPMC-1553 includes advanced API (Application Programming Interface) software that reduces application development time.
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PXI Functional Test System
U8989A
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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LIN Interface Device
LIN Interface Devices are bus interfaces for developing applications with the NI-XNET driver. The NI-XNET device-driven DMA engine couples the LIN bus to host memory to minimize message latency. You can import, edit, and use signals from LDF databases in integrated LIN databases. LIN Interface Devices work well for applications requiring real-time, high-speed manipulation of many LIN frames and signals, such as hardware-in-the-loop simulation, rapid control prototyping, bus monitoring, and automation control.
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NI-6583, 200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO
781320-01
200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO—The NI-6583 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 32 single-ended and 16 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6583 can sample digital waveforms at up to 200 MHz. It includes support for selectable single-ended voltages from 1.2 to 3.3 Volts with 10 bit resolution and common LVDS voltages.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-1
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
