Showing results: 91 - 105 of 277 items found.
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LabStandard -
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.Designed for horizontal and vertical applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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El-Mul Technologies
Systems utilizing multiple electron beams are an emerging semiconductor metrology technology that aims to increase throughput. El-Mul is a pioneer in developing detection solutions for such metrology systems and has designed and manufactured prototype detectors that can simultaneously detect 144 beams at 35MHz.
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LabStandard DUO -
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.2 axis design for rotary tilting applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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MRC ltd.
Displacement transducers are suitable for direct, accurate measurement of displacements in automatic control and metrology.
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Bruker microCT
Bruker's suite of technologies for semiconductor manufacturing address critical metrology and process needs across the broadest range of applications from R&D to process improvement. 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation products.
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Dragonfly -
Onto Innovation
Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
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LK Metrology Ltd.
LK Metrology offers the ultimate choice of CMM multi-sensor metrology softwares. The CAMIO software fits all solutions, especially those high-end industries, such as the aerospace industry, point cloud measurements and for offline solutions while the ARCOCAD software suits standard application, manual CMMs and portable measuring arms.
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Carl Zeiss AG
Measuring, evaluation and management software enables you to increase the performance of all your metrology operations.
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Ohm-Labs, Inc.
Ohm-Labs manufactures metrology grade shunts for precise measurement of current from <1 mA to 3000 A.
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Dimension AFP -
Bruker Optics
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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AOIP
DATACAL is a metrology software that is both powerful and easy to use tools for configuring and managing and automate calibration procedures.
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Solartron Metrology
Solartron Metrology offer three Software packages which offer the user different features at different prices.
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TDK RF Solutions Inc.
TDK Biconical Antennas - precision biconical antenna, metrology biconical antenna, high power biconical antenna.