Showing results: 61 - 75 of 277 items found.
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7980 -
Chroma ATE Inc.
Chroma 7980 Wafer Metrology System applies White Light Interference Measurement Technique to perform nondestructive and rapid surface profile measurement and analysis.
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ISRA Vision AG
Ensure zero-defect quality in all product deliveries and boost customer satisfaction: ISRA’s precision metrology systems measure all object and surface properties down to the nanometer level while ensuring the shortest cycle times.
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Mountains® -
Digital Surf
Analyze multiple types of surface data. Turn your surface data into accurate, visual surface analysis reports. See every feature with high quality real-time 3D imaging of surface topography. Characterize surfaces in accordance with the latest metrology standards.
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Benchmark 250 -
VIEW Micro-Metrology
The Benchmark 250 is a compact general-purpose metrology system with all the features and capabilities of the larger VIEW Micro-Metrology models. With travel of 300 x 150 x 150 mm, the Benchmark can accommodate a wide range of part sizes, and is rugged enough to be located in either a Q/A lab or an inspection station on the production floor.
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CODEX™ -
Genmark Automation
Genmark Automation’s CODEX™ Stocker is the industry’s first integrated stocker, sorter and metrology system that has the ability to store, track, and deliver, on demand, multiple substrate types along with their key attributes. Consolidating the functions of these traditionally nonrevenue-generating tools frees up fab floor space for production equipment, enabling a facility to maximize its productivity and yield.
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AXP 2.0 -
Akrometrix, llc
The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
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SpinCheck -
MicroSense, LLC
Measure and analyze spindle and motor performance with our SpinCheck spindle metrology system and non-contact capacitive displacement sensorsThe SpinCheck system includes a desktop PC, data acquisition and timing boards, comprehensive SpinCheck measurement and analysis software, and associated cables and accessories. SpinCheck measures and stores all data for analysis, display, printout or storage for future use.
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Heidenhain Corp.
HEIDENHAIN digital readouts have universal applications. In addition to standard tasks on milling, drilling and boring machines and lathes, they also can be used with machine tools, measuring and testing equipment, and special machines in fact, they can be used with any machine where axis slides are traversed manually.
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Gemini Series -
n&k Technology, Inc.
The n&k Gemini-TF, Gemini-TF-M and Gemini-FPD are specifically designed for measurements of patterned and unpatterned films on transparent or opaque substrates. These tools are used extensively for solar cell, flat panel and photomask applications. The tools belonging to the Gemini-TF Series are based on unpolarized Reflectance (R) and unpolarized Transmittance (T) measurements, with a 50μm spot size for both R and T. R and T are simultaneously measured to determine film thickness and n and k spectra from 190nm – 1000nm
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MTI Instruments
Front USB port enables easy storage of measurements and other data to flash drivesMTI Instruments’ Proprietary Capacitance Circuitry for Outstanding Accuracy and DependabilityNon-contact measurements76-300 mm diameter wafer rangeOptional wafer measurement ringsWafer stops for exact centeringEthernet interfaceFull remote control software (Windows compatible)Optional calibration wafers
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MCT225 HA -
Nikon Metrology, Inc.
This new 'absolute-accuracy' Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently with the highest accuracy. A proprietary liquid cooled microfocus transmission source, a finite element optimized support frame for maximum stiffness, and air-cooled cabinet provide long-term stability.
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Olympian Series -
n&k Technology, Inc.
DUV-Vis-IR (Wavelength Range: 190nm – 15,000nm) Scatterometers / Thin Film Metrology Systems: The n&k Olympian, n&k Olympian-450 and n&k Olympian-M are DUV-Vis-IR scatterometers/thin film metrology systems with micro-spot technology, covering the wavelength range from 190nm – 15,000nm. With the inclusion of the infra-red wavelength range, the Olympian Series extends the capabilities of n&k’s DUV-Vis-NIR scatterometer series – the OptiPrime-CD Series.
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OptiPrime Series -
n&k Technology, Inc.
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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LittleFoot Series -
n&k Technology, Inc.
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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PolyWorks -
InnovMetric Software Inc.
Defining the cutting edge of 3D metrology, the PolyWorks software suite maximizes productivity, quality, and profitability when integrating 3D measurement technologies into an industrial manufacturing process. From part and tool design and prototyping down to final inspection of assembled products, PolyWorks offers advanced solutions to cover the complete product development cycle. Interfacing directly with major brands and technologies of single-point and point cloud 3D measurement devices through plug-in extension modules, this universal platform also supports a wide array of native point cloud and polygonal model file formats.