Particle
fundamental objects of quanta.
See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection, Wave
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Process Particles Suspensions
Process Particles™ Suspensions are used as particle material standards. They represent real-world contaminant particles encountered in semiconductor device fabrication processing. Deposition of these particles on wafers and reticles enables characterization of the material-dependent response of a surface inspection system when accurate particle size or particle sphericity are of secondary importance. They consist of broad size distributions of irregularly shaped solid particles suspended in ultra-pure water (UPW). Each bottle contains a suspension volume of 100 mL.
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PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785168-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FP...show more -
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Fourier Transform Infrared Spectroscopy (FTIR)
Rocky Mountain Laboratories, Inc.
FTIR Analysis is used to analyze organic materials. Bulk and small particle materials can be analyzed. FTIR microscopy allows for the identification of particle as small as 10 µm. Determination of unknown materials is facilitated by spectral matching to a library of over 250,000 reference spectra.
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Microscopy Image Analysis Software
analySIS FIVE
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Sensor Solutions for IoT
Imec is a reference in the design of ultra-low power electronics, low-power algorithms to increase intelligence and data security, and in all aspects of data science. Our multi-sensor environmental monitoring platform features sensors for temperature, relative humidity, NO2, CO2, VOC (volatile organic compounds), particle matter, ambient light, sound, vibrations and presence detection. Our test platform is suitable for indoor and outdoor air quality monitoring and control, and can be used in smart buildings, smart cities and more.
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Camera Module Tester
Evolusys Technologies Sdn. Bhd.
• Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR• Near Field Sharpness Testing - CTF/MTF/SFR• Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc.• Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc.• Current Measurement - Active, standby
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Prep HPLC & SFC Columns - 5 µm Spherical Particle Size
RediSep Prep
When you need the highest purity compound, the first choice in laboratories worldwide is Teledyne LABS RediSep Prep columns. Durable RediSep Prep columns are specifically designed to provide quick, accurate results to fulfill your High-Performance Liquid Chromatography (HPLC) and Supercritical Fluid Chromatography (SFC) needs.
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SOI Bonding Systems
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection a...show more -
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HF/HNO3 Monitor
CS-153N
The CS-153N is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes. Etching processes use HF/HNO3 solution to etch silicon oxide and remove particles from the wafer surface. The CS-153N continually monitors each component of the HF/HNO3 solution (HF/HNO3/H2O), alerting the user each time the solution is replaced or replenished. This allows you to maintain the concentration of the HF/HNO3 solution within the tolerance range, while eliminating unnecessary solution replacement.
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Portable Particle Counters
Engineered for you, they provide real-time cleanroom particle counting in an easy-to-use, reliable instrument that's ready for measurement.
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Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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Particle Sensor
HPM Series
Honeywell Industrial Automation
The Honeywell HPM Series Particle Sensor is a laser-basedsensor which uses the light scattering method to detectand count particles in the concentration range of 0 g/m3to 1,000 g/m3 in a given environment. A laser light sourceilluminates a particle as it is pulled through the detectionchamber. As particles pass through the laser beam, the lightsource becomes obscured and is recorded on the photo orlight detector. The light is then analyzed and converted toan electrical signal providing particulate size and quantity tocalculate concentrations in real time. The Honeywell particlesensor provides information on the particle concentration forgiven particle concentration range.
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Sample Dispersion Systems
Since the introduction of the Small Volume Recirculator (SVR) in 1982, Microtrac has been supplying the particle analysis industry with sample dispersion delivery mechanisms. Thanks to countless hours of research and development, Microtrac continues to exceed the sample dispersion needs of customers. Slurry or dry powder material, Microtrac has a sample dispersion accessory for you.
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TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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Neutron Detectors
As a neutron has no charge, a neutron detector incorporates a neutron-to-ionisation particle converter.The incident neutrons are captured by the converter material which then produces (detectable) ionising particles by means of a nuclear reaction.Photonis gas-filled detectors are designed to detect thermal neutrons (En < 0.025 eV), so the capture cross-section of the detecting material must be as large as possible for this low energy. We therefore use 235U (580 barn at 20 °C) for our fission chambers, and 10B (3840 barn at 20 °C) for our boron-lined proportional counters.
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Control Modules
The Group3 distributed control system is used in many universities and research institutes around the world and in the latest prototypes from a number of manufacturers of medical and industrial particle accelerators.
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0.1 Micron Portable Particle Counter
3950
This revolutionary 0.1-0.3 micron 2-channel semiconductor particle counter comes in one of the lightest form-factors available today; clocking in at only 7.5lbs (3.4kg). It is designed for high-end contamination control environments, such as semiconductor manufacturing facilities and cleanrooms, and can be used for standalone operation or integrated into an existing monitoring system to accommodate a vast array of applications.
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2GHz programmable frequency dividerValon
3010a*
● 5MHz to 2GHz input● Accepts input signal <-30dBm● 50Ω RF outputs● Multiple 3.3V CMOS TTL compatible outputs● TTL division ratios down to 512 available● Rugged milled aluminum housing● RFI shielded construction● EMI/EMC enhanced circuitry● ESD protected● Suitable for frequency synthesis, clock division, clock distribution in electro-optics, molecular spectroscopy, particle physics, and general lab use.$279 plus shipping
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Research Flow Cytometry
Flow cytometry is a powerful technique used to quantitively measure individual cells and other particles in suspension, at the rate of thousands of cells per second. Most commonly used in the context of Immunology, we have also started to see the adaption of flow cytometry for environmental studies, extracellular vesicle analysis, and the ability to use upwards of 30+ different parameters for more comprehensive analysis. Agilent flow cytometers offer excellent capabilities, high quality data, and an easy to use platform to save researchers time when acquiring and analyzing data. experiments.
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Scanning Mobility Particle Sizer Spectrometers
TSI's Scanning Mobility Particle Sizer (SMPS™) spectrometers are high resolution sizers that have long been hailed as the researcher's choice for particle size characterization. Our SMPS™ systems are in use around the globe for hundreds of applications, providing the high-resolution data that researchers and other investigators depend upon.
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Particle Counter Emissions Tester
PARTICLE COUNTER | VP 135046
Maschinenbau Haldenwang GmbH & Co. KG.
With the PARTICLE COUNTER emission tester, you can really count every particle. Compact, rugged design, clearly readable display, rapid readiness for measurement and precise measurement results are the distinguishing features of the MAHA particle counter.
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Particle Image Velocimetry (PIV)
Particle Image Velocimetry (PIV) is a non-intrusive laser optical measurement technique for research and diagnostics into flow, turbulence, microfluidics, spray atomization, and combustion processes.
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Particle Counters
PaMas Partikelmess- und analysesysteme gmbH
an instrument that detects and counts physical particles; either ionising or non-ionising.
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Particle Analyzers
Teilch Particle Analyzers have proven significant advantages when compared to competitors’ solutions. Innovations in light source, flow control, analog and digital signal processing, components integration and software allow Teilch to provide a state of the art system for precision particle analysis.
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Particle Size Analyzers
Particle analyzers are used to determine the size and distribution of particles making up a material. Particle size analyzers are used in numerous fields for research and development, manufacturing and for quality control and product testing.
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EDEM for Academia
Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Raman Spectroscopy Analysis Laboratory
Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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Magnetic Particle Inspection
Is an inspection method used to identify defects on the surface of ferromagnetic materials by running a magnetic current through it.
