- Optomistic Products
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Trident Fiber-Optic Probes
Our most popular and cost-efficient option for the test of multiple LEDs — testing three LEDs with a single Sensor. This method of testing LEDs scales up, so that testing 3, 30, 300 — or any number of LEDs — is far more cost-efficient than other methods. This is our most popular Fiber-optic Probe and can be combined with any of our Universal LightProbe Sensors.
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Logic Analyzer Probe
FS2520
The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.
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Oscilloscope, 350 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch interleaved, Fully Loaded DSO with 16 Dig Ch MSO
T3DSO2354HD-MS
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Computer Safe Automotive Logic Probe
TE6-0718
Hangzhou Tonny Electric & Tools Co., Ltd.
*For use on 6V, 12V and 24V DC systems*Tests high and low voltages on all vehicle circuits, including computerized engine and body controls*Dual color LED indicates red for power and green for ground
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Active FET Probe Kit 1.2 GHz, 10x, ±40 V
CT4121
The CT4121 is a compact FET probe with very high input resistance and low input capacitance. With a 1.2 GHz bandwidth, this probe is ideal for timing analysis or troubleshooting high speed logic circuits, for design verification of disk drives, as well as for wireless and data communication design.
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Cantilever Probe Cards
Venture
Nidec SV Probe’s VentureTM line of cantilever probe cards represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Other capabilities include: • 3K Points • Pad Pitches as Tight as 35µm • Up to 32 DUTsContact your Nidec SV Probe sales representative to determine which VentureTM product is right for your testing application.
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DDR5 Logic Analyzer
FS2602
The FS2602 is our the latest logic analyzer probe used to test DDR5 SO-DIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 SO-DIMMs running at ~4000MT/s.
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BitScope Micro Oscilloscope & Analyzer
BS05
20 MHz Bandwidth.40 MSps Logic Capture.2 Analog Scope Channels.2 Analog Comparator channels.6 Logic/Protocol Analyzer channels.8 & 12 bit native analog sample resolution.Decodes Serial, SPI, I2C, CAN and more.Windows, Linux, Mac OS X & Raspberry Pi.Built-in analog waveform & clock generators.User programmable, C/C++, Python, VM API.Tiny, light weight (14g) and water resistant.Standard oscilloscope probe adapters available.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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DIMM Interposer Probe
FS2361
The FS2361 is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154/64 Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 DIMMs.
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Oscilloscope, 100 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch DSO, Fully Loaded with 10.1" Color Display
T3DSO2104HD
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Logic Analyzer Probes
FS2354 & FS2355
The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Digital Oscilloscope
DS1000Z
The DS1000Z series of digital oscilloscopes use the Ultravision technology platform, which continues the characteristics of deep storage and high waveform capture rate, and has an excellent cost performance advantage. The innovative DS1000Z Plus series comes standard with a digital channel interface that can be upgraded to a full-featured MSO with the addition of an RPL1116 logic probe.
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Logic Analyzer Probe
FS2600A
The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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Microprocessor Development System
DS-85
* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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Active Probe, 1 GHz
N2795A
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
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Logic Probes
Logic probes are used to analyze the logic states (high/true: logic 1 or low/false: logic 0) of digital signals. To verify and debug today’s high-speed, low-voltage digital signals, you need logic probes that can accurately acquire signals from a wide variety of electronic designs, while protecting signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions below.
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Protocol Analyzer
BusFinder
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer：eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer：eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
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T3DSO2000HD Series Oscilloscopes
T3DSO2000HD Series
The Teledyne Test Tools T3DSO2000HD Oscilloscopes feature four channel bench models with analog bandwidth options of 100 MHz, 200 MHz and 350 MHz all with 12 bits of vertical resolution. The series offers both DSO and MSO configured models with the MSO units having a 16 channel logic probe as standard. Each model offers a maximum sample rate of up to 2 GSa/s sample rate (interleave mode), and a maximum memory depth of 200 Mpts in interleave mode.
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LPDDR3 178-ball BGA Interposer For Logic Analyzers
W3301A
The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates ...show more -
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Programmable Multifunction Generator
IST 5800/5850
IST Information Scan Technology, Inc.
The IST-5800 series programmable multifunction generator is an exceptionally versatile and economical instrument for applications in R&D, Manufacturing Test, Service Repair and Training. Featuring an adjustable triple output power supply and waveform generator, it has the ability to provide power and signal sources for a circuit while the universal logic probe, auto-ranging frequency counter, and digital voltmeter allows you to simultaneously analyze and measure circuit activity.
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Cantilever Probe Card
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Logic Probe
HH2601
Handy, quick and easy to use tool. For DTL, TTL and CMOS testing. High frquency response. Instant indication. Pulse memory function. Size: 180mm x 30mm x 20mm
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Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068B+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM*Active Probes*Logic, State, Protocol triggers
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JTAG Probe
MAJIC
MAJIC (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell.
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Active Probe, 2 GHz
N2796A
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
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Logic Analyzer
TLA7000
The modular TLA7000 Logic Analyzer Series provides the speed and flexibility you need to capture logic detail on today's fastest microprocessors and memory designs. Pinpoint the source of elusive errors and gain the visibility you want with large easy-to-read displays, fast data throughput, and time-correlated views of analog and digital signals through the same probe.
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Oscilloscope, 200 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch DSO, Fully Loaded with 10.1" Color Display
T3DSO2204HD
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Logic Analyzers
Verification and debug of today's high speed, low voltage digital signals requires probing solutions that can accurately acquire from a wide variety of electronic designs and protect signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions.
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LASAR Post Processor, Run Time And Diagnostic Test Solution
DtifEasy Series
DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
